| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A cold standby system with arrival time of server and correlated failures and repairs
|
Goel, L.R.
|
|
1995
|
35 |
4 |
p. 739-742
4 p.
|
article
|
| 2 |
A machine service model with a service station consisting of r unreliable units
|
Liu, Bin
|
|
1995
|
35 |
4 |
p. 683-690
8 p.
|
article
|
| 3 |
An additional space special service facility heterogeneous queue
|
Bansal, K.K.
|
|
1995
|
35 |
4 |
p. 725-730
6 p.
|
article
|
| 4 |
Analysis of a two unit redundant system with optimum interchangement time
|
Agnihotri, R.K.
|
|
1995
|
35 |
4 |
p. 749-750
2 p.
|
article
|
| 5 |
A safety licensable computing architecture
|
G.W.A.D.,
|
|
1995
|
35 |
4 |
p. 761-
1 p.
|
article
|
| 6 |
A study of optical noise measurement as a reliability estimation for laser diodes
|
Dai, Yisong
|
|
1995
|
35 |
4 |
p. 731-734
4 p.
|
article
|
| 7 |
Bayesian approach to prediction with outliers from the Burr type X model
|
Jaheen, Zeinhum F.
|
|
1995
|
35 |
4 |
p. 703-705
3 p.
|
article
|
| 8 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1995
|
35 |
4 |
p. 773-776
4 p.
|
article
|
| 9 |
Call for papers
|
|
|
1995
|
35 |
4 |
p. 763-772
10 p.
|
article
|
| 10 |
Determination of reliability density function when the failure rate is a random variable
|
Yadavalli, V.S.S.
|
|
1995
|
35 |
4 |
p. 699-701
3 p.
|
article
|
| 11 |
Environmental stress screening strategies for complex systems: A 3-level mixed distribution model
|
Pohl, Edward A.
|
|
1995
|
35 |
4 |
p. 637-656
20 p.
|
article
|
| 12 |
Function process and reliability analysis of a two-dependent-unit system
|
Shao-Ming, Wu
|
|
1995
|
35 |
4 |
p. 743-747
5 p.
|
article
|
| 13 |
Fundamentals of solid-state electronics and fundamentals of solid-state electronics (study guide)
|
G.W.A.D.,
|
|
1995
|
35 |
4 |
p. 759-760
2 p.
|
article
|
| 14 |
Modeling for stuck faults in cmos non-threshold logic (NTL) combinational circuits
|
Ismaeel, Asad A.
|
|
1995
|
35 |
4 |
p. 669-681
13 p.
|
article
|
| 15 |
Profit analysis of two-unit standby system with rest period for the operator and correlated failures and repairs
|
Tyagi, Vinay Kumar
|
|
1995
|
35 |
4 |
p. 753-757
5 p.
|
article
|
| 16 |
Quality assessment models for initial production process control based on stochastic differential equations
|
Kimura, Mitsuhiro
|
|
1995
|
35 |
4 |
p. 657-668
12 p.
|
article
|
| 17 |
Reliability issues for III-V heterojunction bipolar transistors
|
Roenker, K.P.
|
|
1995
|
35 |
4 |
p. 713-724
12 p.
|
article
|
| 18 |
Some reliability problems arising in GIvbGvb1 queueing system with-repairable service station
|
Tang, Yinghui
|
|
1995
|
35 |
4 |
p. 707-712
6 p.
|
article
|
| 19 |
Standby redundancy at system and component levels—a comparison
|
Senthil Kumar, C.
|
|
1995
|
35 |
4 |
p. 751-752
2 p.
|
article
|
| 20 |
System characteristic and cost analysis of a two unit standby system with spare units
|
Agrafiotis, G.K.
|
|
1995
|
35 |
4 |
p. 691-698
8 p.
|
article
|
| 21 |
Two reduced formulas for reliability evaluation of three-state device networks
|
Dong-Kui, Li
|
|
1995
|
35 |
4 |
p. 735-737
3 p.
|
article
|
Journal description