no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A comparison between microwave reflectance, thermal wave modulated reflectance and defect etching for detecting transition metals in silicon
|
|
|
1993 |
33 |
9 |
p. 1434- 1 p. |
article |
2 |
A configurable integrated test methodology for monolithic microwave integrated circuit production
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
3 |
A decomposition method for optimization of large-system reliability
|
|
|
1993 |
33 |
9 |
p. 1423- 1 p. |
article |
4 |
A directed-graph classifier of semiconductor wafer-test patterns
|
|
|
1993 |
33 |
9 |
p. 1420- 1 p. |
article |
5 |
A method for ion etching depth control
|
|
|
1993 |
33 |
9 |
p. 1438- 1 p. |
article |
6 |
A Monte Carlo simulation algorithm for finding MTBF
|
|
|
1993 |
33 |
9 |
p. 1423- 1 p. |
article |
7 |
Analysis of a fault-tolerance scheme for processor ensembles
|
|
|
1993 |
33 |
9 |
p. 1425-1426 2 p. |
article |
8 |
An automated electrical defect identification and location method for CMOS processes using a specially designed test chip
|
|
|
1993 |
33 |
9 |
p. 1421-1422 2 p. |
article |
9 |
An automated oracle for software testing
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
10 |
An evaluation of CAD-aided programming systems for coordinate measuring machines
|
|
|
1993 |
33 |
9 |
p. 1428- 1 p. |
article |
11 |
A new technique in a cutset evaluation
|
Elias, S.S. |
|
1993 |
33 |
9 |
p. 1351-1355 5 p. |
article |
12 |
An exponential SRGM with a bound on the number of failures
|
Kapur, P.K. |
|
1993 |
33 |
9 |
p. 1245-1249 5 p. |
article |
13 |
An information model for a CAM data base to support flexible manufacture of printed circuit boards
|
|
|
1993 |
33 |
9 |
p. 1421- 1 p. |
article |
14 |
An innovative bonding technique for optical chips using solder bumps that eliminate chip positioning adjustments
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
15 |
An O(kn) algorithm for a circular consecutive-k-out-of-n:F system
|
|
|
1993 |
33 |
9 |
p. 1426- 1 p. |
article |
16 |
A note on reliability allocation under a preventive maintenance schedule
|
Wong, Jsun Y. |
|
1993 |
33 |
9 |
p. 1411-1414 4 p. |
article |
17 |
A novel technique for in-line monitoring of micro-contamination and process induced damage
|
|
|
1993 |
33 |
9 |
p. 1429- 1 p. |
article |
18 |
A novel technique for the simultaneous measurement of ambipolar carrier lifetime and diffusion coefficient in silicon
|
|
|
1993 |
33 |
9 |
p. 1433- 1 p. |
article |
19 |
A simple method for generating K-trees of a network
|
Rath, Debaraj |
|
1993 |
33 |
9 |
p. 1241-1244 4 p. |
article |
20 |
A stochastic algorithm for high speed capacitance extraction in integrated circuits
|
|
|
1993 |
33 |
9 |
p. 1420-1421 2 p. |
article |
21 |
A unified mobility model for device simulation—II. Temperature dependence of carrier mobility and life-time
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
22 |
Back-surface washing system enhances circuit board reliability
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
23 |
BaPbO3-based thick film resistor
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
24 |
Bayes attribute acceptance-sampling plan
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
25 |
Bayes binomial sampling by attributes with a general-beta prior distribution
|
|
|
1993 |
33 |
9 |
p. 1426- 1 p. |
article |
26 |
Bayesian estimation under Poisson testing using the LINEX loss function
|
Jaisingh, Lloyd R. |
|
1993 |
33 |
9 |
p. 1259-1265 7 p. |
article |
27 |
Bonding state in GaAs/Si interface
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
28 |
CAFE—the MIT computer-aided fabrication environment
|
|
|
1993 |
33 |
9 |
p. 1429- 1 p. |
article |
29 |
Characteristics of the resist development process in electron beam lithography
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
30 |
Common-cause failure analysis of a parallel system with warm standby
|
Dhillon, B.S. |
|
1993 |
33 |
9 |
p. 1321-1342 22 p. |
article |
31 |
Comparison of bipolar NPN polysilicon emitter interface formation at three different manufacturing sites
|
|
|
1993 |
33 |
9 |
p. 1434- 1 p. |
article |
32 |
Concurrent engineering for consumer, industrial products, and Government systems
|
|
|
1993 |
33 |
9 |
p. 1419- 1 p. |
article |
33 |
Contact resistivity of shallow junctions formed by implantation through Pt or PtSi
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
34 |
Continual progress marks electronic componentinstallation techniques
|
|
|
1993 |
33 |
9 |
p. 1422- 1 p. |
article |
35 |
Cost analysis of a man-machine system operating under changing operator conditions
|
Singh, S.K. |
|
1993 |
33 |
9 |
p. 1267-1274 8 p. |
article |
36 |
Cost analysis of the M/M/R machine-repair problem with mixed standby spares
|
Wang, Kuo-Hsiung |
|
1993 |
33 |
9 |
p. 1293-1301 9 p. |
article |
37 |
Cost saving opportunities with multichip modules
|
|
|
1993 |
33 |
9 |
p. 1427- 1 p. |
article |
38 |
Defect clustering viewed through generalized Poisson distribution
|
|
|
1993 |
33 |
9 |
p. 1426- 1 p. |
article |
39 |
Defect localization induced by hot carrier injection in short-channel MOSFETs: Concept, modeling and characterization
|
Cristoloveanu, Sorin |
|
1993 |
33 |
9 |
p. 1365-1385 21 p. |
article |
40 |
Diffusion equation for GIx/G/r machine interference problem with spare machines
|
Jain, M. |
|
1993 |
33 |
9 |
p. 1415-1418 4 p. |
article |
41 |
Effective buffer insertion of clock tree for high-speed VLSI circuits
|
|
|
1993 |
33 |
9 |
p. 1431-1432 2 p. |
article |
42 |
Effect of gold on the reliability of fine pitch surface mount solder joints
|
|
|
1993 |
33 |
9 |
p. 1422- 1 p. |
article |
43 |
Electrical characterization of hole transport in heavily-doped shallow implanted emitters
|
|
|
1993 |
33 |
9 |
p. 1436- 1 p. |
article |
44 |
Emerging trends in e-beam diagnostics
|
|
|
1993 |
33 |
9 |
p. 1427- 1 p. |
article |
45 |
Empirical formulas and global reliability evaluation of reliability graphs
|
Aziz, M.A. |
|
1993 |
33 |
9 |
p. 1233-1236 4 p. |
article |
46 |
ESD-degradation mechanisms of GaAs microwave devices and device protection
|
Bock, K. |
|
1993 |
33 |
9 |
p. 1397-1410 14 p. |
article |
47 |
Extended tables for the moments of gamma-distribution order statistics
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
48 |
Extraordinary technologies enhance usefulness of standard cells, ASICs
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
49 |
Fixed-time life tests based on fuzzy life characteristics
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
50 |
Flow graph development method
|
Qamber, Isa S. |
|
1993 |
33 |
9 |
p. 1387-1395 9 p. |
article |
51 |
GaAs/AlGaAs (SQW GRIN-SCH) LEDs monolithically integrated with Si-MOS drivers
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
52 |
Graphical representation of two mixed-Weibull distributions
|
|
|
1993 |
33 |
9 |
p. 1422- 1 p. |
article |
53 |
Growth by molecular beam epitaxy (MBE) and structural characterization of GaAs and AlGaAs on silicon
|
|
|
1993 |
33 |
9 |
p. 1433-1434 2 p. |
article |
54 |
Growth of thin thermal silicon dioxide films with low defect density
|
|
|
1993 |
33 |
9 |
p. 1433- 1 p. |
article |
55 |
Highly flat GexSi1−x/Si heterointerfaces grown by molecular beam epitaxy in two-dimensional growth mode
|
|
|
1993 |
33 |
9 |
p. 1434-1435 2 p. |
article |
56 |
Hints and kinks
|
|
|
1993 |
33 |
9 |
p. 1419-1420 2 p. |
article |
57 |
IC manufacturing diagnosis based on statistical analysis techniques
|
|
|
1993 |
33 |
9 |
p. 1428-1429 2 p. |
article |
58 |
Impact of low-temperature transient-enhanced diffusion of dopants in silicon
|
|
|
1993 |
33 |
9 |
p. 1434- 1 p. |
article |
59 |
Laser interconnection techniques for defect avoidance in large-area restructurable silicon systems
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
60 |
Long-channel silicon-on-insulator MOSFET theory
|
|
|
1993 |
33 |
9 |
p. 1432- 1 p. |
article |
61 |
Lower confidence bound on the percentage improvement in comparing two failure rates
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
62 |
Low temperature CMOS—a brief review
|
|
|
1993 |
33 |
9 |
p. 1433- 1 p. |
article |
63 |
Makers tackle challenge of improving automatic assembly technology
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
64 |
Maximum likelihood estimates, from censored data, for mixed-Weibull distributions
|
|
|
1993 |
33 |
9 |
p. 1423- 1 p. |
article |
65 |
Maximum likelihood estimation of Burr XII distribution parameters under Type II censoring
|
Wingo, Dallas R. |
|
1993 |
33 |
9 |
p. 1251-1257 7 p. |
article |
66 |
Measurements of interface state density in partially- and fully-depleted silicon-on-insulator MOSFETs by a high-low-frequency transconductance method
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
67 |
Measuring software reliability
|
|
|
1993 |
33 |
9 |
p. 1427- 1 p. |
article |
68 |
Measuring the opaque substrate temperature by infrared laser beams
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
69 |
Method for semiconductor process optimization using functional representations of spatial variations and selectivity
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
70 |
Microwave IC control components for phased-array antennas
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
71 |
MIL reliability: a new approach
|
|
|
1993 |
33 |
9 |
p. 1419- 1 p. |
article |
72 |
Minimizing damage and contamination in RIE processes by extracted-plasma-parameter analysis
|
|
|
1993 |
33 |
9 |
p. 1438- 1 p. |
article |
73 |
Modelling of a high throughput hot-wall reactor for selective epitaxial growth of silicon
|
|
|
1993 |
33 |
9 |
p. 1434- 1 p. |
article |
74 |
Modelling of deep silicon etching in multicomponent plasma
|
|
|
1993 |
33 |
9 |
p. 1434- 1 p. |
article |
75 |
Molecular beam epitaxy—aspects and applications
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
76 |
Multiple function trends sweep into hybrid IC field
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
77 |
Novel effects of heating rate on the activation/recrystallization of boron-implanted Si substrates
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
78 |
Novel near-field probe for on-wafer integrated circuit measurements
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
79 |
N2 reflow soldering assists environmental protection
|
|
|
1993 |
33 |
9 |
p. 1422- 1 p. |
article |
80 |
On Onaga's upper bound on the mean values of probabilistic maximum flows
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
81 |
Optimization models for selection of programmes, considering cost and reliability
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
82 |
Optimization of high performance BiCMOS buffer circuit for chip area, delay and power dissipation
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
83 |
Optimization of restoration cost for complex technical systems at centralized structure of repair
|
Martynenko, O.N. |
|
1993 |
33 |
9 |
p. 1227-1232 6 p. |
article |
84 |
Order statistics based modeling of gracefully degrading computing systems
|
Chaganty, N.R. |
|
1993 |
33 |
9 |
p. 1281-1291 11 p. |
article |
85 |
Parallel algorithms for terminal-pair reliability
|
|
|
1993 |
33 |
9 |
p. 1423-1424 2 p. |
article |
86 |
PCB continuous line system proceeds from manufacture to inspection
|
|
|
1993 |
33 |
9 |
p. 1422- 1 p. |
article |
87 |
Prediction of electromigration failure in W/Al-Cu multilayered metallizations by 1/f noise measurements
|
|
|
1993 |
33 |
9 |
p. 1421- 1 p. |
article |
88 |
Pre-tinning and flux considerations on the reliability of solder surfaces
|
|
|
1993 |
33 |
9 |
p. 1430- 1 p. |
article |
89 |
Preventive replacement in systems with dependent components
|
|
|
1993 |
33 |
9 |
p. 1421- 1 p. |
article |
90 |
Process-based cost modelling
|
|
|
1993 |
33 |
9 |
p. 1428- 1 p. |
article |
91 |
Production and inspection—flexible and integrated
|
|
|
1993 |
33 |
9 |
p. 1429- 1 p. |
article |
92 |
Promising alternative approach for high-power GaAs/Si MESFETs fabrication
|
|
|
1993 |
33 |
9 |
p. 1432- 1 p. |
article |
93 |
Pulsed particle beam treatment of implanted silicon
|
|
|
1993 |
33 |
9 |
p. 1438- 1 p. |
article |
94 |
Quality certification in the single European market
|
|
|
1993 |
33 |
9 |
p. 1427-1428 2 p. |
article |
95 |
Quality increases competitiveness
|
|
|
1993 |
33 |
9 |
p. 1428- 1 p. |
article |
96 |
Quality of hybrid circuits after soldering with “no residue” flux
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
97 |
Quality of service and supervision in the French network
|
|
|
1993 |
33 |
9 |
p. 1419- 1 p. |
article |
98 |
Rapid thermal processing uniformity using multivariable control of a circularly symmetric three zone lamp
|
|
|
1993 |
33 |
9 |
p. 1429-1430 2 p. |
article |
99 |
Reactive ion etching technology in thin-film-transistor processing
|
|
|
1993 |
33 |
9 |
p. 1436- 1 p. |
article |
100 |
Reliability analyses for a tree-structured hierarchic control system
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
101 |
Reliability analysis of a multicomponent system in a multistate Markovian environment
|
Deng, Yonglu |
|
1993 |
33 |
9 |
p. 1237-1239 3 p. |
article |
102 |
Reliability and availability analysis of a system with warm standby and common cause failures
|
Dhillon, B.S. |
|
1993 |
33 |
9 |
p. 1343-1349 7 p. |
article |
103 |
Reliability comparison of token-ring network schemes
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
104 |
Reliability of commercial relays during life tests at low electrical contact load
|
|
|
1993 |
33 |
9 |
p. 1420- 1 p. |
article |
105 |
Reliability of fully and partially replicated systems
|
|
|
1993 |
33 |
9 |
p. 1422-1423 2 p. |
article |
106 |
Reliability optimization of communication networks using simulated annealing
|
Atiqullah, Mir M. |
|
1993 |
33 |
9 |
p. 1303-1319 17 p. |
article |
107 |
Repair of circuits by laser seeding and constriction induced plating
|
|
|
1993 |
33 |
9 |
p. 1436- 1 p. |
article |
108 |
Robust character of exponential SPRT
|
Sharma, K.K. |
|
1993 |
33 |
9 |
p. 1223-1225 3 p. |
article |
109 |
Safety-related systems. Competence, liability and practice
|
|
|
1993 |
33 |
9 |
p. 1420- 1 p. |
article |
110 |
Silicon wafer cleaning with CF4/H2 plasma and its effect on the properties of dry thermally grown oxide
|
|
|
1993 |
33 |
9 |
p. 1432- 1 p. |
article |
111 |
Soldering equipment works in freon-free environment
|
|
|
1993 |
33 |
9 |
p. 1431- 1 p. |
article |
112 |
SPRAM technology cultivates characteristics useful in many fields
|
|
|
1993 |
33 |
9 |
p. 1432- 1 p. |
article |
113 |
Stochastic analysis of a system operating in a multiple environment
|
Agnihotri, R.K. |
|
1993 |
33 |
9 |
p. 1219-1222 4 p. |
article |
114 |
Systolic VLSI arrays for the metric approach to pattern recognition
|
|
|
1993 |
33 |
9 |
p. 1432- 1 p. |
article |
115 |
Temperature dependence of reactive ion beam etching of GaAs with CH4/H2
|
|
|
1993 |
33 |
9 |
p. 1437- 1 p. |
article |
116 |
The changing face of surface mount technology
|
|
|
1993 |
33 |
9 |
p. 1427- 1 p. |
article |
117 |
The effect of applied frequencies and multiple firing on the resistance of thick film resistors
|
|
|
1993 |
33 |
9 |
p. 1435- 1 p. |
article |
118 |
The effect of the number of defect mechanisms on fault clustering and its detection using yield model parameters
|
|
|
1993 |
33 |
9 |
p. 1427- 1 p. |
article |
119 |
The European quality award
|
|
|
1993 |
33 |
9 |
p. 1428- 1 p. |
article |
120 |
The reliability model on a two stage CIMS production line
|
Min, Tan |
|
1993 |
33 |
9 |
p. 1275-1280 6 p. |
article |
121 |
Thermal stability of polysilicon resistors
|
|
|
1993 |
33 |
9 |
p. 1435-1436 2 p. |
article |
122 |
The SURE approach to reliability analysis
|
|
|
1993 |
33 |
9 |
p. 1426- 1 p. |
article |
123 |
Thin-film transistor/liquid crystal display technology—an introduction
|
|
|
1993 |
33 |
9 |
p. 1436- 1 p. |
article |
124 |
Throughput availability in Markov systems
|
|
|
1993 |
33 |
9 |
p. 1424- 1 p. |
article |
125 |
Uncertainty importance of system components by fuzzy and interval probability
|
Utkin, Lev V. |
|
1993 |
33 |
9 |
p. 1357-1364 8 p. |
article |
126 |
Usefulness of MTTF of s-independent case in other cases
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
127 |
Using reliability analysis software
|
|
|
1993 |
33 |
9 |
p. 1425- 1 p. |
article |
128 |
Versatile COF, COB HIC technology attracts industry attention
|
|
|
1993 |
33 |
9 |
p. 1420- 1 p. |
article |
129 |
Wear and contamination of electroplated gold films in line contact
|
|
|
1993 |
33 |
9 |
p. 1421- 1 p. |
article |
130 |
World semiconductor market recovers gradually
|
|
|
1993 |
33 |
9 |
p. 1428- 1 p. |
article |