nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A comparison between reliability analyses based primarily on disjointness or statistical independence: The case of the generalized indra network
|
Rushdi, Ali M. |
|
1993 |
33 |
7 |
p. 965-978 14 p. |
artikel |
2 |
A note on solving a system reliability problem
|
Wong, Jsun Y. |
|
1993 |
33 |
7 |
p. 1045-1051 7 p. |
artikel |
3 |
A table for the lower boundary of the region of useful redundancy for k-out-of-n systems
|
Rushdi, Ali M. |
|
1993 |
33 |
7 |
p. 979-992 14 p. |
artikel |
4 |
A versatile failure time distribution
|
Mukherjee, S.P. |
|
1993 |
33 |
7 |
p. 1053-1056 4 p. |
artikel |
5 |
B-test of goodness of fit of an empirical distribution to a supposedly theoretical one
|
Brkić, D.M. |
|
1993 |
33 |
7 |
p. 957-964 8 p. |
artikel |
6 |
Enumeration of minimal cutsets from matrix representation of directed/undirected networks
|
Ghosh, S.K. |
|
1993 |
33 |
7 |
p. 947-949 3 p. |
artikel |
7 |
G/G y /m queueing system with discouragement via diffusion approximation
|
Garg, K.M. |
|
1993 |
33 |
7 |
p. 1057-1059 3 p. |
artikel |
8 |
Microelectronics manufacturing diagnostics handbook
|
G.W.A.D., |
|
1993 |
33 |
7 |
p. 1066-1067 2 p. |
artikel |
9 |
New application of laser beam to failure analysis of LSI with multi-metal layers
|
Sanada, Masaru |
|
1993 |
33 |
7 |
p. 993-1009 17 p. |
artikel |
10 |
Note on integrity versus reliability
|
Badenius, Duncan |
|
1993 |
33 |
7 |
p. 1041-1044 4 p. |
artikel |
11 |
Performance-related reliability measures for a repairable two-unit gracefully degrading system
|
Agarwal, Manju |
|
1993 |
33 |
7 |
p. 921-927 7 p. |
artikel |
12 |
Quality through engineering design
|
G.W.A.D., |
|
1993 |
33 |
7 |
p. 1065-1066 2 p. |
artikel |
13 |
Reliability analysis of a three-state multi-component warm standby redundant complex system with waiting for repair
|
Gupta, P.P. |
|
1993 |
33 |
7 |
p. 1061-1063 3 p. |
artikel |
14 |
Reliability of a cascade system with normal stress and exponential strength
|
Uma Maheswari, T.S. |
|
1993 |
33 |
7 |
p. 929-936 8 p. |
artikel |
15 |
Reversible dielectric breakdown of thin gate oxides in MOS devices
|
Suñé, J. |
|
1993 |
33 |
7 |
p. 1031-1039 9 p. |
artikel |
16 |
The analysis of the states of buffer in a CIMS production line
|
Min, Tan |
|
1993 |
33 |
7 |
p. 937-940 4 p. |
artikel |
17 |
The paradox of monotony of systems by fuzzy probability
|
Utkin, Lev V. |
|
1993 |
33 |
7 |
p. 951-955 5 p. |
artikel |
18 |
The reliability of laser diodes and laser transmitter modules
|
Sim, S.P. |
|
1993 |
33 |
7 |
p. 1011-1030 20 p. |
artikel |
19 |
The truncated service time Erlangian overflow queues with balking
|
Abou-El-Ata, M.O. |
|
1993 |
33 |
7 |
p. 941-945 5 p. |
artikel |