no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
Aging renewal process characterizations of exponential distributions
|
Bhattacharjee, M.C. |
|
1993 |
33 |
14 |
p. 2143-2147 5 p. |
article |
2 |
A two unit series system with correlated failures and repairs
|
Goel, L.R. |
|
1993 |
33 |
14 |
p. 2165-2169 5 p. |
article |
3 |
Availability analysis of a two dissimilar-unit deteriorating standby system with inspection
|
Mokaddis, G.S. |
|
1993 |
33 |
14 |
p. 2119-2141 23 p. |
article |
4 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1993 |
33 |
14 |
p. 2171-2174 4 p. |
article |
5 |
Hot-carrier effects in polysilicon emitter vertical PNP and NPN transistors
|
Sparks, D.R. |
|
1993 |
33 |
14 |
p. 2087-2092 6 p. |
article |
6 |
Influence of the testing environment in bipolar transistors radiation resistance results: A benchmark exercise
|
Decréton, M. |
|
1993 |
33 |
14 |
p. 2107-2117 11 p. |
article |
7 |
Modeling metastable states in ASIC
|
Wild, Andreas |
|
1993 |
33 |
14 |
p. 2079-2086 8 p. |
article |
8 |
On stability of stochastic multiobjective programming problems with random coefficients in the objective functions
|
El-Banna, Abou-Zaid H. |
|
1993 |
33 |
14 |
p. 2149-2151 3 p. |
article |
9 |
Publications, notices, calls for papers, etc.
|
|
|
1993 |
33 |
14 |
p. 2175-2177 3 p. |
article |
10 |
Reliability evaluation of flow networks considering multistate modelling of network elements
|
Patra, S. |
|
1993 |
33 |
14 |
p. 2161-2164 4 p. |
article |
11 |
The yield models and defect density monitors for integrated circuit diagnosis
|
Nahar, R.K. |
|
1993 |
33 |
14 |
p. 2153-2159 7 p. |
article |
12 |
Unreliable queuing with repeated orders
|
Aissani, A. |
|
1993 |
33 |
14 |
p. 2093-2106 14 p. |
article |