| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An investigation of the information contained in faulty signatures
|
Chan, John C.
|
|
1992
|
32 |
7 |
p. 935-940
6 p.
|
artikel
|
| 2 |
A queueing system with alternate batch service
|
Sharma, S.D.
|
|
1992
|
32 |
7 |
p. 917-922
6 p.
|
artikel
|
| 3 |
Assurance technologies, principles and practices
|
H.R.,
|
|
1992
|
32 |
7 |
p. 1045-
1 p.
|
artikel
|
| 4 |
Availability for a 2 3 : G subsystem and secondary subsystem subject to shut-off rules
|
Chen, Yow-Mow
|
|
1992
|
32 |
7 |
p. 925-930
6 p.
|
artikel
|
| 5 |
Estimation of environmental factors for the inverse Gaussian distribution
|
Wang, Hong-Zhou
|
|
1992
|
32 |
7 |
p. 931-934
4 p.
|
artikel
|
| 6 |
Failure time and rate constant of degradation: An argument for the inverse relationship
|
Klinger, David J.
|
|
1992
|
32 |
7 |
p. 987-994
8 p.
|
artikel
|
| 7 |
New method for assessing dielectrjc integrity of MOS oxides
|
Patrikar, R.M.
|
|
1992
|
32 |
7 |
p. 961-986
26 p.
|
artikel
|
| 8 |
Optimal ordering policies and optimal number of minimal repairs before replacement
|
Sheu, Shey-Huei
|
|
1992
|
32 |
7 |
p. 995-1002
8 p.
|
artikel
|
| 9 |
Optimum planned policies with minimal repair and random lead times
|
Sridharan, V.
|
|
1992
|
32 |
7 |
p. 905-909
5 p.
|
artikel
|
| 10 |
Publications, notices, calls for papers, etc.
|
|
|
1992
|
32 |
7 |
p. 1049-1050
2 p.
|
artikel
|
| 11 |
Reliability assessment of CCDs operating under ionizing radiation ambients: Failure — Simulation studies via electrical overstressing
|
Agbo, Samuel O.
|
|
1992
|
32 |
7 |
p. 1029-1042
14 p.
|
artikel
|
| 12 |
Reliability by design CAE techniques for electronic components and systems
|
G.W.A.D.,
|
|
1992
|
32 |
7 |
p. 1046-1048
3 p.
|
artikel
|
| 13 |
Revitalization of primary reliability knowledge
|
Dohnal, M.
|
|
1992
|
32 |
7 |
p. 1015-1028
14 p.
|
artikel
|
| 14 |
Society of reliability engineers bulletin
|
Reiche, Hans
|
|
1992
|
32 |
7 |
p. 1043-
1 p.
|
artikel
|
| 15 |
Sojourn times in Markov processes for power transmission dependability assessment with MatLab
|
Csenki, Attila
|
|
1992
|
32 |
7 |
p. 945-960
16 p.
|
artikel
|
| 16 |
Some observations on a software reliability model
|
Scott, Anthony
|
|
1992
|
32 |
7 |
p. 1003-1013
11 p.
|
artikel
|
| 17 |
Stacked CMOS circuits integrated in laser-recrystallized silicon films
|
Hilleringmann, U.
|
|
1992
|
32 |
7 |
p. 941-944
4 p.
|
artikel
|
| 18 |
Steady state and transient analysis of SFIIL
|
Kal, Santiram
|
|
1992
|
32 |
7 |
p. 911-915
5 p.
|
artikel
|
| 19 |
Stochastic analysis of a two-unit redundant system with two types of failure
|
Agnihotri, R.K.
|
|
1992
|
32 |
7 |
p. 901-904
4 p.
|
artikel
|
| 20 |
The Mukherjee-Islam failure model
|
Siddiqui, S.A.
|
|
1992
|
32 |
7 |
p. 923-924
2 p.
|
artikel
|
Tijdschrift beschrijving