| no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
| 1 |
A modification of Bayesian approach in nuclear plant data analysis
|
Wang, Qun
|
|
1991
|
31 |
6 |
p. 1137-1141
5 p.
|
article
|
| 2 |
An elementary guide to reliability. 4th edition
|
Manfield, Henry G.
|
|
1991
|
31 |
6 |
p. 1285-1286
2 p.
|
article
|
| 3 |
Annealing effects on transition temperature of r.f. sputtered Bi-Sr-Ca-Cu-O thin films
|
Misra, Vinita
|
|
1991
|
31 |
6 |
p. 1279-1281
3 p.
|
article
|
| 4 |
4965515 Apparatus and method of testing a semiconductor wafer
|
Karasawa, Watar
|
|
1991
|
31 |
6 |
p. 1295-
1 p.
|
article
|
| 5 |
Bayesian estimation under exponential failure distribution
|
Jaisingh, Lloyd R.
|
|
1991
|
31 |
6 |
p. 1229-1235
7 p.
|
article
|
| 6 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1991
|
31 |
6 |
p. 1287-1290
4 p.
|
article
|
| 7 |
4967147 Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
|
Woods, Ernest
|
|
1991
|
31 |
6 |
p. 1296-
1 p.
|
article
|
| 8 |
Comparison of two stochastic models for two-unit series system with cold standbys
|
Moafi, S.E.
|
|
1991
|
31 |
6 |
p. 1105-1111
7 p.
|
article
|
| 9 |
Corrected bounds for reliability when strength and stress distributions are known
|
Sharma, K.K.
|
|
1991
|
31 |
6 |
p. 1077-1079
3 p.
|
article
|
| 10 |
Cost-benefit analysis of single-server n-unit imperfect switch system with adjustable repair
|
Gopalan, M.N.
|
|
1991
|
31 |
6 |
p. 1085-1087
3 p.
|
article
|
| 11 |
Cpk applications—Uses and abuses
|
Anjard Sr, R.P.
|
|
1991
|
31 |
6 |
p. 1123-1125
3 p.
|
article
|
| 12 |
Effect of time-dependent development process on the limit of proximity exposure compensation in electron beam lithography
|
Deshmukh, P.R.
|
|
1991
|
31 |
6 |
p. 1091-1096
6 p.
|
article
|
| 13 |
4967142 Electronic module comprising a first substrate element with a functional part, and a second substrate element for testing an interconnection function, socket, substrate element and electronic apparatus therefor
|
Sauerwald, WilhelmA
|
|
1991
|
31 |
6 |
p. 1296-
1 p.
|
article
|
| 14 |
4967262 Gull-wing zig-zag inline lead package having end-of-package anchoring pins
|
Farnsworth, WarrenM
|
|
1991
|
31 |
6 |
p. 1296-1297
2 p.
|
article
|
| 15 |
Improved bounds for the reliability of a system
|
Sharma, K.K.
|
|
1991
|
31 |
6 |
p. 1069-1071
3 p.
|
article
|
| 16 |
Incandescent sign lamps and a very rough bath-tub curve
|
Rawicz, Andrew H.
|
|
1991
|
31 |
6 |
p. 1143-1151
9 p.
|
article
|
| 17 |
4965660 Integrated circuit package having heat sink bonded with resinous adhesive
|
Ogihara, Satoru
|
|
1991
|
31 |
6 |
p. 1295-
1 p.
|
article
|
| 18 |
Mean integrated square error of a recursive estimator of a distribution function
|
Hosni, A.K.
|
|
1991
|
31 |
6 |
p. 1193-1202
10 p.
|
article
|
| 19 |
Mechanical stability of PECVD silicon nitride protective films over bondwires, bonds and bondpads during thermal stress
|
Ulrich, R.K.
|
|
1991
|
31 |
6 |
p. 1237-1249
13 p.
|
article
|
| 20 |
4972413 Method and apparatus for high speed integrated circuit testing
|
Littlebury, HughW
|
|
1991
|
31 |
6 |
p. 1297-1298
2 p.
|
article
|
| 21 |
4967725 Method and apparatus for manufacturing semiconductor wafers and cutting wire apparatus for use therein
|
Hinzen, Huber
|
|
1991
|
31 |
6 |
p. 1297-
1 p.
|
article
|
| 22 |
4970780 Method for the assemblage of a semiconductor device
|
Suda, Takumi
|
|
1991
|
31 |
6 |
p. 1297-
1 p.
|
article
|
| 23 |
Microelectronics' and reliability's new tool: UNIX today
|
Anjard Sr, Ronald P.
|
|
1991
|
31 |
6 |
p. 1127-1131
5 p.
|
article
|
| 24 |
Neural realization of TMR with coverage
|
Suliman, Mamoun
|
|
1991
|
31 |
6 |
p. 1269-1278
10 p.
|
article
|
| 25 |
On estimation procedures of variance subsequent to preliminary test of significance
|
Sisodia, B.V.S.
|
|
1991
|
31 |
6 |
p. 1101-1104
4 p.
|
article
|
| 26 |
Output probability from a general combinational network
|
Jo, Byung-Ho
|
|
1991
|
31 |
6 |
p. 1153-1162
10 p.
|
article
|
| 27 |
Paradigms of quality for microelectronics and SMT
|
Anjard Sr, Ronald P.
|
|
1991
|
31 |
6 |
p. 1119-1122
4 p.
|
article
|
| 28 |
4965865 Probe card for integrated circuit chip
|
Trenary, DaleT
|
|
1991
|
31 |
6 |
p. 1295-1296
2 p.
|
article
|
| 29 |
Publications, notices, calls for papers, etc.
|
|
|
1991
|
31 |
6 |
p. 1291-
1 p.
|
article
|
| 30 |
4970724 Redundancy and testing techniques for IC wafers
|
Yung, MichaelW
|
|
1991
|
31 |
6 |
p. 1297-
1 p.
|
article
|
| 31 |
Redundancy optimization problems for systems with dependent failure rates
|
Bhattacharya, A.
|
|
1991
|
31 |
6 |
p. 1097-1099
3 p.
|
article
|
| 32 |
Reliability analysis and design of a fault-tolerant random access memory system
|
Kontoleon, J.M.
|
|
1991
|
31 |
6 |
p. 1063-1067
5 p.
|
article
|
| 33 |
Reliability evaluation of a human operator under various levels of stress
|
Who Kee Chung,
|
|
1991
|
31 |
6 |
p. 1251-1255
5 p.
|
article
|
| 34 |
Reliability of local area networks with bus and ring topologies
|
Trstenský, Dušan
|
|
1991
|
31 |
6 |
p. 1089-1090
2 p.
|
article
|
| 35 |
4965657 Resin encapsulated semiconductor device
|
Ogata, Masatsugu
|
|
1991
|
31 |
6 |
p. 1295-
1 p.
|
article
|
| 36 |
Robustness of sequential gamma life-testing procedures in respect of expected failure times
|
Sharma, K.K.
|
|
1991
|
31 |
6 |
p. 1073-1076
4 p.
|
article
|
| 37 |
Rules and criteria for when to stop testing a piece of software
|
Petrova, E.
|
|
1991
|
31 |
6 |
p. 1211-1227
17 p.
|
article
|
| 38 |
Safety-modelling on neural networks
|
Suliman, Mamoun
|
|
1991
|
31 |
6 |
p. 1257-1267
11 p.
|
article
|
| 39 |
Society of reliability engineers bulletin
|
Reiche, Hans
|
|
1991
|
31 |
6 |
p. 1283-
1 p.
|
article
|
| 40 |
Some aspects of IC reliability estimation through accelerated life tests
|
Boychinova, N.
|
|
1991
|
31 |
6 |
p. 1133-1135
3 p.
|
article
|
| 41 |
Stochastic analysis of a computer system model with intelligent terminals and two types of failure
|
Goel, L.R.
|
|
1991
|
31 |
6 |
p. 1113-1117
5 p.
|
article
|
| 42 |
Stochastic analysis of a two unit warm standby system with two switching devices
|
Labib, S.W.
|
|
1991
|
31 |
6 |
p. 1163-1173
11 p.
|
article
|
| 43 |
Stochastic analysis of machine interference for a production system with two non-identical machines
|
Gopalan, M.N.
|
|
1991
|
31 |
6 |
p. 1081-1084
4 p.
|
article
|
| 44 |
Testing that a distribution is new better than used of age to
|
Green, Jack R.
|
|
1991
|
31 |
6 |
p. 1175-1179
5 p.
|
article
|
| 45 |
The Burr Type II distribution: Properties, order statistics
|
Ragab, Aisha
|
|
1991
|
31 |
6 |
p. 1181-1191
11 p.
|
article
|
| 46 |
The truncated queue M/M/2/k with both balking and an additional server for longer queues
|
Al-Seedy, R.O.
|
|
1991
|
31 |
6 |
p. 1203-1209
7 p.
|
article
|
| 47 |
Title section, volume contents and author index, volume 31, 1991
|
|
|
1991
|
31 |
6 |
p. i-xii
nvt p.
|
article
|
Journal description