nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A modification of Bayesian approach in nuclear plant data analysis
|
Wang, Qun |
|
1991 |
31 |
6 |
p. 1137-1141 5 p. |
artikel |
2 |
An elementary guide to reliability. 4th edition
|
Manfield, Henry G. |
|
1991 |
31 |
6 |
p. 1285-1286 2 p. |
artikel |
3 |
Annealing effects on transition temperature of r.f. sputtered Bi-Sr-Ca-Cu-O thin films
|
Misra, Vinita |
|
1991 |
31 |
6 |
p. 1279-1281 3 p. |
artikel |
4 |
4965515 Apparatus and method of testing a semiconductor wafer
|
Karasawa, Watar |
|
1991 |
31 |
6 |
p. 1295- 1 p. |
artikel |
5 |
Bayesian estimation under exponential failure distribution
|
Jaisingh, Lloyd R. |
|
1991 |
31 |
6 |
p. 1229-1235 7 p. |
artikel |
6 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1991 |
31 |
6 |
p. 1287-1290 4 p. |
artikel |
7 |
4967147 Circuit tester having mechanical fingers and pogo probes for causing electrical contact with test fixture assemblies
|
Woods, Ernest |
|
1991 |
31 |
6 |
p. 1296- 1 p. |
artikel |
8 |
Comparison of two stochastic models for two-unit series system with cold standbys
|
Moafi, S.E. |
|
1991 |
31 |
6 |
p. 1105-1111 7 p. |
artikel |
9 |
Corrected bounds for reliability when strength and stress distributions are known
|
Sharma, K.K. |
|
1991 |
31 |
6 |
p. 1077-1079 3 p. |
artikel |
10 |
Cost-benefit analysis of single-server n-unit imperfect switch system with adjustable repair
|
Gopalan, M.N. |
|
1991 |
31 |
6 |
p. 1085-1087 3 p. |
artikel |
11 |
Cpk applications—Uses and abuses
|
Anjard Sr, R.P. |
|
1991 |
31 |
6 |
p. 1123-1125 3 p. |
artikel |
12 |
Effect of time-dependent development process on the limit of proximity exposure compensation in electron beam lithography
|
Deshmukh, P.R. |
|
1991 |
31 |
6 |
p. 1091-1096 6 p. |
artikel |
13 |
4967142 Electronic module comprising a first substrate element with a functional part, and a second substrate element for testing an interconnection function, socket, substrate element and electronic apparatus therefor
|
Sauerwald, WilhelmA |
|
1991 |
31 |
6 |
p. 1296- 1 p. |
artikel |
14 |
4967262 Gull-wing zig-zag inline lead package having end-of-package anchoring pins
|
Farnsworth, WarrenM |
|
1991 |
31 |
6 |
p. 1296-1297 2 p. |
artikel |
15 |
Improved bounds for the reliability of a system
|
Sharma, K.K. |
|
1991 |
31 |
6 |
p. 1069-1071 3 p. |
artikel |
16 |
Incandescent sign lamps and a very rough bath-tub curve
|
Rawicz, Andrew H. |
|
1991 |
31 |
6 |
p. 1143-1151 9 p. |
artikel |
17 |
4965660 Integrated circuit package having heat sink bonded with resinous adhesive
|
Ogihara, Satoru |
|
1991 |
31 |
6 |
p. 1295- 1 p. |
artikel |
18 |
Mean integrated square error of a recursive estimator of a distribution function
|
Hosni, A.K. |
|
1991 |
31 |
6 |
p. 1193-1202 10 p. |
artikel |
19 |
Mechanical stability of PECVD silicon nitride protective films over bondwires, bonds and bondpads during thermal stress
|
Ulrich, R.K. |
|
1991 |
31 |
6 |
p. 1237-1249 13 p. |
artikel |
20 |
4972413 Method and apparatus for high speed integrated circuit testing
|
Littlebury, HughW |
|
1991 |
31 |
6 |
p. 1297-1298 2 p. |
artikel |
21 |
4967725 Method and apparatus for manufacturing semiconductor wafers and cutting wire apparatus for use therein
|
Hinzen, Huber |
|
1991 |
31 |
6 |
p. 1297- 1 p. |
artikel |
22 |
4970780 Method for the assemblage of a semiconductor device
|
Suda, Takumi |
|
1991 |
31 |
6 |
p. 1297- 1 p. |
artikel |
23 |
Microelectronics' and reliability's new tool: UNIX today
|
Anjard Sr, Ronald P. |
|
1991 |
31 |
6 |
p. 1127-1131 5 p. |
artikel |
24 |
Neural realization of TMR with coverage
|
Suliman, Mamoun |
|
1991 |
31 |
6 |
p. 1269-1278 10 p. |
artikel |
25 |
On estimation procedures of variance subsequent to preliminary test of significance
|
Sisodia, B.V.S. |
|
1991 |
31 |
6 |
p. 1101-1104 4 p. |
artikel |
26 |
Output probability from a general combinational network
|
Jo, Byung-Ho |
|
1991 |
31 |
6 |
p. 1153-1162 10 p. |
artikel |
27 |
Paradigms of quality for microelectronics and SMT
|
Anjard Sr, Ronald P. |
|
1991 |
31 |
6 |
p. 1119-1122 4 p. |
artikel |
28 |
4965865 Probe card for integrated circuit chip
|
Trenary, DaleT |
|
1991 |
31 |
6 |
p. 1295-1296 2 p. |
artikel |
29 |
Publications, notices, calls for papers, etc.
|
|
|
1991 |
31 |
6 |
p. 1291- 1 p. |
artikel |
30 |
4970724 Redundancy and testing techniques for IC wafers
|
Yung, MichaelW |
|
1991 |
31 |
6 |
p. 1297- 1 p. |
artikel |
31 |
Redundancy optimization problems for systems with dependent failure rates
|
Bhattacharya, A. |
|
1991 |
31 |
6 |
p. 1097-1099 3 p. |
artikel |
32 |
Reliability analysis and design of a fault-tolerant random access memory system
|
Kontoleon, J.M. |
|
1991 |
31 |
6 |
p. 1063-1067 5 p. |
artikel |
33 |
Reliability evaluation of a human operator under various levels of stress
|
Who Kee Chung, |
|
1991 |
31 |
6 |
p. 1251-1255 5 p. |
artikel |
34 |
Reliability of local area networks with bus and ring topologies
|
Trstenský, Dušan |
|
1991 |
31 |
6 |
p. 1089-1090 2 p. |
artikel |
35 |
4965657 Resin encapsulated semiconductor device
|
Ogata, Masatsugu |
|
1991 |
31 |
6 |
p. 1295- 1 p. |
artikel |
36 |
Robustness of sequential gamma life-testing procedures in respect of expected failure times
|
Sharma, K.K. |
|
1991 |
31 |
6 |
p. 1073-1076 4 p. |
artikel |
37 |
Rules and criteria for when to stop testing a piece of software
|
Petrova, E. |
|
1991 |
31 |
6 |
p. 1211-1227 17 p. |
artikel |
38 |
Safety-modelling on neural networks
|
Suliman, Mamoun |
|
1991 |
31 |
6 |
p. 1257-1267 11 p. |
artikel |
39 |
Society of reliability engineers bulletin
|
Reiche, Hans |
|
1991 |
31 |
6 |
p. 1283- 1 p. |
artikel |
40 |
Some aspects of IC reliability estimation through accelerated life tests
|
Boychinova, N. |
|
1991 |
31 |
6 |
p. 1133-1135 3 p. |
artikel |
41 |
Stochastic analysis of a computer system model with intelligent terminals and two types of failure
|
Goel, L.R. |
|
1991 |
31 |
6 |
p. 1113-1117 5 p. |
artikel |
42 |
Stochastic analysis of a two unit warm standby system with two switching devices
|
Labib, S.W. |
|
1991 |
31 |
6 |
p. 1163-1173 11 p. |
artikel |
43 |
Stochastic analysis of machine interference for a production system with two non-identical machines
|
Gopalan, M.N. |
|
1991 |
31 |
6 |
p. 1081-1084 4 p. |
artikel |
44 |
Testing that a distribution is new better than used of age to
|
Green, Jack R. |
|
1991 |
31 |
6 |
p. 1175-1179 5 p. |
artikel |
45 |
The Burr Type II distribution: Properties, order statistics
|
Ragab, Aisha |
|
1991 |
31 |
6 |
p. 1181-1191 11 p. |
artikel |
46 |
The truncated queue M/M/2/k with both balking and an additional server for longer queues
|
Al-Seedy, R.O. |
|
1991 |
31 |
6 |
p. 1203-1209 7 p. |
artikel |
47 |
Title section, volume contents and author index, volume 31, 1991
|
|
|
1991 |
31 |
6 |
p. i-xii nvt p. |
artikel |