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                             87 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 4947375 Addressing of redundant columns and rows of an integrated circuit memory Gaultier, JeanMarie
 1991
 31 2-3 p. x-xi
nvt p.
 artikel
2 A method for evaluation of number class intervals of histogram Brkić, D.M.
 1991
 31 2-3 p. 245-248
4 p.
 artikel
3 An algorithm to solve integer programming problems: An efficient tool for reliability design Misra, Krishna B.
 1991
 31 2-3 p. 285-294
10 p.
 artikel
4 Analysis of a complex system composed of two sub-systems with their standbys Gupta, Rakesh
 1991
 31 2-3 p. 453-463
11 p.
 artikel
5 Analysis of d.c. and a.c. anomalous latch-up effects in commercial CMOS integrated circuits Zanoni, Enrico
 1991
 31 2-3 p. 249-254
6 p.
 artikel
6 An efficient approach for multiple criteria redundancy optimization problems Misra, Krishna B.
 1991
 31 2-3 p. 303-321
19 p.
 artikel
7 4907931 Apparatus for handling semiconductor wafers Mallory, ChesterL
 1991
 31 2-3 p. i-
1 p.
 artikel
8 4931726 Apparatus for testing semiconductor device Kasukabe, Susumu
 1991
 31 2-3 p. vii-
1 p.
 artikel
9 4900948 Apparatus providing signals for burn-in of integrated circuits Hamilton, Harold
 1991
 31 2-3 p. i-
1 p.
 artikel
10 Application of an efficient search technique for optimal design of a computer communication network Sharma, Usha
 1991
 31 2-3 p. 337-341
5 p.
 artikel
11 Applications of a search algorithm to reliability design problems Misra, Krishna B.
 1991
 31 2-3 p. 295-301
7 p.
 artikel
12 A practical method of binomial reliability assessment Wang, Hong-Zhou
 1991
 31 2-3 p. 255-256
2 p.
 artikel
13 A stuck fault model for dynamic CMOS combinational circuits Ismaeel, Asad A.
 1991
 31 2-3 p. 407-427
21 p.
 artikel
14 4947545 Automated burn-in system Gussman, Robert
 1991
 31 2-3 p. xi-
1 p.
 artikel
15 Availability and frequency of failures of a system in the presence of chance common-cause shock failures Madhusudana Verma, S.
 1991
 31 2-3 p. 265-269
5 p.
 artikel
16 Bibliography on electrical conduction in thick film resistors Dziedzic, Andrzej
 1991
 31 2-3 p. 549-558
10 p.
 artikel
17 4949341 Built-in self test method for application specific integrated circuit libraries Lopez, David
 1991
 31 2-3 p. xi-
1 p.
 artikel
18 4926117 Burn-in board having discrete test capability Nevill, LelandR
 1991
 31 2-3 p. vi-
1 p.
 artikel
19 CHE failure in a two-unit standby system with slow switch, repair and post repair Goel, L.R.
 1991
 31 2-3 p. 219-222
4 p.
 artikel
20 Cost analysis of a one-unit repairable system subject to on-line preventive maintenance and/or repair Gopalan, M.N.
 1991
 31 2-3 p. 223-228
6 p.
 artikel
21 4929889 Data path chip test architecture Seiler, LarryD
 1991
 31 2-3 p. vii-
1 p.
 artikel
22 Design of reconfigurable fault-tolerant VLSI/WSI processor array structures Noore, A.
 1991
 31 2-3 p. 481-489
9 p.
 artikel
23 4932028 Error log system for self-testing in very large scale integrated circuit (VLSI) units Katircioglu, Haluk
 1991
 31 2-3 p. viii-
1 p.
 artikel
24 Excess noise as an indicator of digital integrated circuit reliability Jones, B.K.
 1991
 31 2-3 p. 351-361
11 p.
 artikel
25 4937655 Film segment having integrated circuit chip bonded thereto and fixture therefor Miyazaki, Tatsuya
 1991
 31 2-3 p. ix-
1 p.
 artikel
26 4920785 Hermeticity testing method and system Etess, Edward
 1991
 31 2-3 p. v-
1 p.
 artikel
27 4918377 Integrated circuit reliability testing Buehler, MartinG
 1991
 31 2-3 p. iv-
1 p.
 artikel
28 4918379 Integrated monolithic circuit having a test bus Jongepier, Abraham
 1991
 31 2-3 p. iv-
1 p.
 artikel
29 4937659 Interconnection system for integrated circuit chips Chall, Louis
 1991
 31 2-3 p. ix-x
nvt p.
 artikel
30 4918335 Interconnection system for integrated circuit chips Chall, LouisE
 1991
 31 2-3 p. iii-iv
nvt p.
 artikel
31 4920445 Junction-breakdown protection semiconductor device Jun, DongSoo
 1991
 31 2-3 p. v-
1 p.
 artikel
32 4949157 Large scale integrated circuit Minami, Eiichi
 1991
 31 2-3 p. xi-
1 p.
 artikel
33 4937475 Laser programmable integrated circuit Matthew Rhodes, F
 1991
 31 2-3 p. ix-
1 p.
 artikel
34 Local area network implementation of petri net reachability analysis Anneberg, L.
 1991
 31 2-3 p. 491-499
9 p.
 artikel
35 4930439 Mask-repairing device Sato, Mitsuyoshi
 1991
 31 2-3 p. vii-
1 p.
 artikel
36 4927505 Metallization scheme providing adhesion and barrier properties Sharma, RavinderK
 1991
 31 2-3 p. vi-
1 p.
 artikel
37 4937826 Method and apparatus for sensing defects in integrated circuit elements Gheewala, TusharR
 1991
 31 2-3 p. x-
1 p.
 artikel
38 4947105 Method and circuit for testing integrated circuit modules Unger, Bernhard
 1991
 31 2-3 p. x-
1 p.
 artikel
39 4937203 Method and configuration for testing electronic circuits and integrated circuit chips using a removable overlay layer Eichelberger, CharlesW
 1991
 31 2-3 p. ix-
1 p.
 artikel
40 4918385 Method and process for testing the reliability of integrated circuit (IC) chipsand novel IC circuitry for accomplishing same Shreeve, RobertW
 1991
 31 2-3 p. iv-v
nvt p.
 artikel
41 4917466 Method for electrically connecting IC chips, a resinous bump-forming composition used therein and a liquid-crystal display unit electrically connected thereby Nakamura, Akio
 1991
 31 2-3 p. iii-
1 p.
 artikel
42 4933860 Method for fabricating a radio frequency integrated circuit and product formed thereby Liu, LouisC
 1991
 31 2-3 p. viii-
1 p.
 artikel
43 4935378 Method for manufacturing a semiconductor device having more than two conductive layers Mori, Seiichi
 1991
 31 2-3 p. viii-
1 p.
 artikel
44 4933042 Method for packaging integrated circuit chips employing a polymer film overlay layer Eichelberger, CharlesW
 1991
 31 2-3 p. viii-
1 p.
 artikel
45 4924589 Method of making and testing an integrated circuit Leedy, GlennJ
 1991
 31 2-3 p. vi-
1 p.
 artikel
46 4952272 Method of manufacturing probing head for testing equipment of semiconductor large scale integrated circuits Okino, Hironobu
 1991
 31 2-3 p. xiii-
1 p.
 artikel
47 4912052 Method of testing semiconductor elements Miyoshi, Motosuke
 1991
 31 2-3 p. ii-
1 p.
 artikel
48 4930101 Microprocessor controlled meter package for a printer Wong, YuenW
 1991
 31 2-3 p. vii-
1 p.
 artikel
49 Monte Carlo simulation for improving electromigration lifetime by balancing temperature and structural gradients Gui, X.
 1991
 31 2-3 p. 389-400
12 p.
 artikel
50 Multicriteria optimization for combined reliability and redundancy allocation in systems employing mixed redundancies Misra, Krishna B.
 1991
 31 2-3 p. 323-335
13 p.
 artikel
51 4912399 Multiple lead probe for integrated circuits in wafer form Greub, HansJ
 1991
 31 2-3 p. ii-iii
nvt p.
 artikel
52 New definitions of basic R&M terms Badenius, Duncan
 1991
 31 2-3 p. 525-535
11 p.
 artikel
53 On multivariate generalized logistic distribution Ragab, Aisha
 1991
 31 2-3 p. 511-519
9 p.
 artikel
54 On the effect of power-line disturbances on microcomputer performance Roda, Valentin Obac
 1991
 31 2-3 p. 229-235
7 p.
 artikel
55 4952057 Optical fiber backscatter signature generator (OFBSG) Kamikawa, Neil
 1991
 31 2-3 p. xii-xiii
nvt p.
 artikel
56 Optimal replacement of a system with imperfect repair Makiš, Viliam
 1991
 31 2-3 p. 381-388
8 p.
 artikel
57 Optimization of test parallelism with limited hardware overhead Feng, Sheng
 1991
 31 2-3 p. 271-276
6 p.
 artikel
58 Optimizing the thermalsonic bonding process for thick film hybrid IC by the Taguchi Method Yann-Chyn, Jeng
 1991
 31 2-3 p. 501-510
10 p.
 artikel
59 Physicochemical investigations and nonstandard electrical measurements of inks and thick films—Bibliography Dziedzic, Andrzej
 1991
 31 2-3 p. 537-548
12 p.
 artikel
60 Pre-emptive repeat priority repairs and failure of non-failed component during system failure of a complex system Singh, I.P.
 1991
 31 2-3 p. 261-264
4 p.
 artikel
61 4945302 Process and a circuit board for performing tests during burn-in of integrated semi-conductor circuits Janum, ViggoK
 1991
 31 2-3 p. x-
1 p.
 artikel
62 4950498 Process for repairing pattern film Kaito, Takashi
 1991
 31 2-3 p. xi-xii
nvt p.
 artikel
63 4914814 Process of fabricating a circuit package Behun, JohnR
 1991
 31 2-3 p. iii-
1 p.
 artikel
64 Regression models for estimating survival of patients with non-Hodgkin's Lymphoma Alidrisi, Mustafa
 1991
 31 2-3 p. 473-480
8 p.
 artikel
65 Reliability analysis of a human operator under several levels of stress Who Kee Chung,
 1991
 31 2-3 p. 367-370
4 p.
 artikel
66 Reliability analysis of a non-identical unit parallel system with common-cause failures Dhillon, B.S.
 1991
 31 2-3 p. 429-441
13 p.
 artikel
67 Reliability analysis of a series repairable system with multiple failures Chung, Who Kee
 1991
 31 2-3 p. 371-373
3 p.
 artikel
68 Reliability analysis of a series system with repair Who Kee Chung,
 1991
 31 2-3 p. 363-365
3 p.
 artikel
69 Reliability analysis of a system with a human operator and subject to two failure modes Kumar, Ashok
 1991
 31 2-3 p. 277-283
7 p.
 artikel
70 Reliability assessment of computer systems design Bastos Martini, M.R.
 1991
 31 2-3 p. 237-244
8 p.
 artikel
71 Reliability measures for fail safe computer-based systems Zhou, Zhibang
 1991
 31 2-3 p. 401-406
6 p.
 artikel
72 Reliability model of cold standby systems with built-in-test Shao, Jiajun
 1991
 31 2-3 p. 443-451
9 p.
 artikel
73 Repair body cost minimization with unreliable Markovian restoration Martynenko, Oleg
 1991
 31 2-3 p. 343-349
7 p.
 artikel
74 4951122 Resin-encapsulated semiconductor device Tsubosaki, Kunihiro
 1991
 31 2-3 p. xii-
1 p.
 artikel
75 Revised test that a distribution is new better than used Green, Jack R.
 1991
 31 2-3 p. 521-524
4 p.
 artikel
76 4908226 Selective area nucleation and growth method for metal chemical vapor deposition using focused ion beams Kubena, Randall
 1991
 31 2-3 p. i-ii
nvt p.
 artikel
77 4908690 Semiconductor integrated circuit device with high reliability wiring layers Hata, Masayuk
 1991
 31 2-3 p. ii-
1 p.
 artikel
78 4910735 Semiconductor integrated circuit with self-testing Yamashita, Koichi
 1991
 31 2-3 p. ii-
1 p.
 artikel
79 4951253 Semiconductor memory system Sahara, Hirosh
 1991
 31 2-3 p. xii-
1 p.
 artikel
80 Stochastic analysis of a two-unit deteriorating standby system with two switching devices Goel, L.R.
 1991
 31 2-3 p. 213-218
6 p.
 artikel
81 4929081 System for detecting defects in a regularly arranged pattern such as an integrated circuit or the like Yamamoto, Yoko
 1991
 31 2-3 p. vi-vii
nvt p.
 artikel
82 4922134 Testable redundancy decoder of an integrated semiconductor memory Hoffmann, Kurt
 1991
 31 2-3 p. v-vi
nvt p.
 artikel
83 4918691 Testing of integrated circuit modules Chall, Louis
 1991
 31 2-3 p. v-
1 p.
 artikel
84 4950980 Test socket for electronic device packages Pfaff, WayneK
 1991
 31 2-3 p. xii-
1 p.
 artikel
85 The Sherif-Dear simple (SDS) Theorem in number theory Sherif, Yosef S.
 1991
 31 2-3 p. 465-471
7 p.
 artikel
86 Three-server bulk service queue with service interruptions and exponential repairs Singh, I.P.
 1991
 31 2-3 p. 257-259
3 p.
 artikel
87 TMR neural simulation Goben, C.A.
 1991
 31 2-3 p. 375-380
6 p.
 artikel
                             87 gevonden resultaten
 
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