| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A reliability analysis of a k-out-of-N:G redundant system with common-cause failures and critical human errors
|
Who Kee Chung,
|
|
1990
|
30 |
2 |
p. 237-241
5 p.
|
artikel
|
| 2 |
A three-unit standby redundant system with repair and preventive maintenance
|
Mokaddis, G.S.
|
|
1990
|
30 |
2 |
p. 313-325
13 p.
|
artikel
|
| 3 |
4835459 Automatic fault insertion system (AFIS)
|
Hamlin, JackW
|
|
1990
|
30 |
2 |
p. ii-
1 p.
|
artikel
|
| 4 |
Bibliography of literature on testability
|
Dhillon, B.S.
|
|
1990
|
30 |
2 |
p. 375-415
41 p.
|
artikel
|
| 5 |
Combining vertex decompositions with factoring in an all-terminal network reliability algorithm
|
Page, Lavon B.
|
|
1990
|
30 |
2 |
p. 249-263
15 p.
|
artikel
|
| 6 |
Common-cause failures and critical human errors in repairable and non-repairable systems
|
Who Kee Chung,
|
|
1990
|
30 |
2 |
p. 243-247
5 p.
|
artikel
|
| 7 |
4837502 Computer-aided, logic pulsing probe for locating faulty circuits on a printed circuit card
|
Ugenti, Michael
|
|
1990
|
30 |
2 |
p. ii-iii
nvt p.
|
artikel
|
| 8 |
4835464 Decoupling apparatus for use with integrated circuit tester
|
Slye, BradleyD
|
|
1990
|
30 |
2 |
p. ii-
1 p.
|
artikel
|
| 9 |
4832250 Electronic circuit board rework and repair system
|
Spigarelli, Donald
|
|
1990
|
30 |
2 |
p. i-
1 p.
|
artikel
|
| 10 |
Fault-tolerant synchronization using phase-locked clocks
|
Krishna, C.M.
|
|
1990
|
30 |
2 |
p. 275-287
13 p.
|
artikel
|
| 11 |
Functional burn-in for integrated circuits
|
Wurnik, Franz
|
|
1990
|
30 |
2 |
p. 265-274
10 p.
|
artikel
|
| 12 |
4835469 Integrated circuit clip for circuit analyzer
|
Jones, WayneR
|
|
1990
|
30 |
2 |
p. ii-
1 p.
|
artikel
|
| 13 |
4833676 Interleaved method and circuitry for testing for stuck open faults
|
Koo, Frances
|
|
1990
|
30 |
2 |
p. i-
1 p.
|
artikel
|
| 14 |
4833396 Lead frame short tester
|
Haberland, Ernest
|
|
1990
|
30 |
2 |
p. i-
1 p.
|
artikel
|
| 15 |
Modular fault tolerant VLSI parallel processor architectures with dynamic redundancy
|
Rayapati, Venkatapathi Naidu
|
|
1990
|
30 |
2 |
p. 213-236
24 p.
|
artikel
|
| 16 |
4837552 Non-volatile fault display with magnetic reset switch for adaptive braking system
|
Vandemotter, PatrickJ
|
|
1990
|
30 |
2 |
p. iii-
1 p.
|
artikel
|
| 17 |
4837764 Programmable apparatus and method for testing computer peripherals
|
Russello, VincentJ
|
|
1990
|
30 |
2 |
p. iii-
1 p.
|
artikel
|
| 18 |
Publications, notices, calls for papers, etc.
|
|
|
1990
|
30 |
2 |
p. 205-209
5 p.
|
artikel
|
| 19 |
Society of reliability engineers bulletin
|
|
|
1990
|
30 |
2 |
p. 211-
1 p.
|
artikel
|
| 20 |
Soldering in electronics
|
G.W.A.D.,
|
|
1990
|
30 |
2 |
p. 417-418
2 p.
|
artikel
|
| 21 |
System reliability
|
G.W.A.D.,
|
|
1990
|
30 |
2 |
p. 418-419
2 p.
|
artikel
|
| 22 |
4837765 Test control circuit for integrated circuit
|
Suzuki, Takamas
|
|
1990
|
30 |
2 |
p. iii-iv
nvt p.
|
artikel
|
| 23 |
Threshold systems and their reliability
|
Rushdi, Ali M.
|
|
1990
|
30 |
2 |
p. 299-312
14 p.
|
artikel
|
| 24 |
Two models for two unit warm standby redundant system with two different kinds of repair and tolerable time
|
Mokaddis, G.S.
|
|
1990
|
30 |
2 |
p. 327-374
48 p.
|
artikel
|
| 25 |
Two unit repairable redundant standby system
|
Singh, R.P.
|
|
1990
|
30 |
2 |
p. 289-298
10 p.
|
artikel
|
Tijdschrift beschrijving