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                             73 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A case history—the Telstar satellite programme 1964
 3 3 p. 197-
1 p.
 artikel
2 A certain problem related to reliability of electronic apparatus 1964
 3 3 p. 198-
1 p.
 artikel
3 A device for the stabilization of pressures in the region of 1 torr 1964
 3 3 p. 202-
1 p.
 artikel
4 Aluminium wire bonding of silicon transistors 1964
 3 3 p. 199-
1 p.
 artikel
5 A method for the statistical evaluation of small subsystem performance 1964
 3 3 p. 195-
1 p.
 artikel
6 Anomalous residual currents in the ultra-high vacuum use of Bayard-Alpert Ionization gauges 1964
 3 3 p. 203-
1 p.
 artikel
7 A paramagnetic species in irradiated (NH4)2HPO4 1964
 3 3 p. 200-
1 p.
 artikel
8 A 10−8 rate of failure in a germanium transistor type of computer 1964
 3 3 p. 197-
1 p.
 artikel
9 A static capacitor method for the measurement of the surface potential of gases on evaporated metal films 1964
 3 3 p. 201-
1 p.
 artikel
10 A study of transistor reliability by physical analysis 1964
 3 3 p. 197-
1 p.
 artikel
11 A suggested photographic method for the direct fabrication of microelectronic circuits 1964
 3 3 p. 199-
1 p.
 artikel
12 Behaviour of film conductance during vacuum deposition 1964
 3 3 p. 203-
1 p.
 artikel
13 Can additional electron scattering decrease resistance? 1964
 3 3 p. 205-
1 p.
 artikel
14 Characteristics of the diamond cut-off wheel for germanium 1964
 3 3 p. 199-
1 p.
 artikel
15 Charge transfer controlled surface interactions between oxygen and CdSe films 1964
 3 3 p. 204-
1 p.
 artikel
16 Crystal field effects in the adsorption and desorption of oxygen at a nickel oxide surface 1964
 3 3 p. 204-205
2 p.
 artikel
17 Curing of radiation damage in quartz oscillator crystals 1964
 3 3 p. 205-
1 p.
 artikel
18 Defects in vapour-grown silicon Batsford, K.O.
 1964
 3 3 p. 159-160
2 p.
 artikel
19 Electrical resistance-strain characteristics of thin evaporated metal films 1964
 3 3 p. 205-
1 p.
 artikel
20 Electrodeposited Ni-Fe thin films 1964
 3 3 p. 201-
1 p.
 artikel
21 Electron beam etching in microminiaturization Nixon, W.C.
 1964
 3 3 p. 153-154
2 p.
 artikel
22 Eletronica dei microsistemi 1964
 3 3 p. 199-
1 p.
 artikel
23 Fault analysis and study of reliability by physical methods 1964
 3 3 p. 195-196
2 p.
 artikel
24 Field effect transistor utilizing lateral diffusion Price, T.E.
 1964
 3 3 p. 193-194
2 p.
 artikel
25 Gas desorption of some rubber-type materials 1964
 3 3 p. 203-
1 p.
 artikel
26 Guarantee of reliability in electronic components 1964
 3 3 p. 196-
1 p.
 artikel
27 High frequency surface varactors 1964
 3 3 p. 200-
1 p.
 artikel
28 High temperature vacuum furnace with metallic sheet resistance elements 1964
 3 3 p. 203-
1 p.
 artikel
29 Improvements increase ceramic capacitor reliability 1964
 3 3 p. 196-
1 p.
 artikel
30 Impurity activated infra-red absorption in valency crystals 1964
 3 3 p. 205-
1 p.
 artikel
31 Industrial production and quality 1964
 3 3 p. 196-
1 p.
 artikel
32 Influence of the deposition conditions on growth and structure of evaporated films 1964
 3 3 p. 202-
1 p.
 artikel
33 Interaction between oxygen and aluminium in germanium 1964
 3 3 p. 200-
1 p.
 artikel
34 Latest design techniques in microcircuits 1964
 3 3 p. 199-
1 p.
 artikel
35 Magnetization reversal in thin films 82 per cent Ni, 18 per cent Fe 1964
 3 3 p. 201-
1 p.
 artikel
36 Maintenance of electronic apparatus and reliability 1964
 3 3 p. 198-
1 p.
 artikel
37 Measurement of magnetic thin film rotational properties and uniformity 1964
 3 3 p. 203-
1 p.
 artikel
38 Metallic thin films and their properties 1964
 3 3 p. 201-
1 p.
 artikel
39 Military equipments, reliability and subminiature assemblies, applications of some test results 1964
 3 3 p. 198-
1 p.
 artikel
40 New approach to thin films 1964
 3 3 p. 200-
1 p.
 artikel
41 Notes on the use of integrated circuits in PCM telemetry equipments 1964
 3 3 p. 199-
1 p.
 artikel
42 Operational reliability of military apparatus 1964
 3 3 p. 198-
1 p.
 artikel
43 Papers to be published in future issues 1964
 3 3 p. 207-
1 p.
 artikel
44 Piezoresistance in degenerate n-type germanium 1964
 3 3 p. 199-
1 p.
 artikel
45 PORP—Parts oriented reliability-programme and problems 1964
 3 3 p. 195-
1 p.
 artikel
46 Preparation and evaluation of epitaxial silicon films prepared by vacuum evaporation 1964
 3 3 p. 200-
1 p.
 artikel
47 Preparation of epitaxial layers of silicon I. Direct and indirect processes Nielsen, S.
 1964
 3 3 p. 165-166
2 p.
 artikel
48 Preparation of epitaxial layers of silicon II. Effect of impurities Nielsen, S.
 1964
 3 3 p. 171-172
2 p.
 artikel
49 Production techniques for integrated electronics 1964
 3 3 p. 199-
1 p.
 artikel
50 Redundancy techniques for use in an air traffic control computer Creasey, D.J.
 1964
 3 3 p. 175-192
18 p.
 artikel
51 Reflectivity of heavily doped p and n-type silicon at the 3·4 eV and 4·5 eV peak 1964
 3 3 p. 200-
1 p.
 artikel
52 Reliability and the component manufacturer's point of view 1964
 3 3 p. 197-
1 p.
 artikel
53 Reliability data reduction and failure correction system 1964
 3 3 p. 195-
1 p.
 artikel
54 Reliability of electronic equipment—trials of classification according to the needs of users 1964
 3 3 p. 198-
1 p.
 artikel
55 Reliability of printed wiring cordwood modules 1964
 3 3 p. 197-
1 p.
 artikel
56 Research on the reliability of carbon resistors 1964
 3 3 p. 197-
1 p.
 artikel
57 Significance of large life testing programmes 1964
 3 3 p. 197-198
2 p.
 artikel
58 Statistical aspects of electronic tube reliability 1964
 3 3 p. 196-
1 p.
 artikel
59 Structure and electrical properties of evaporated and sputtered titanium films 1964
 3 3 p. 202-
1 p.
 artikel
60 Surface contamination in kinetic pumping systems 1964
 3 3 p. 203-
1 p.
 artikel
61 Technology at the service of electronic tube reliability 1964
 3 3 p. 196-
1 p.
 artikel
62 Tests under realistic working conditions and reliability 1964
 3 3 p. 195-
1 p.
 artikel
63 The determination of partial pressures with a simple omegatron 1964
 3 3 p. 204-
1 p.
 artikel
64 The effect of dislocations on diffusion in germanium 1964
 3 3 p. 200-
1 p.
 artikel
65 The in-line cryotron 1964
 3 3 p. 202-
1 p.
 artikel
66 The meaning of quantified maintainability 1964
 3 3 p. 198-
1 p.
 artikel
67 The observation by electron diffraction of a “superlattice” in annealed nickel single crystal films 1964
 3 3 p. 204-
1 p.
 artikel
68 Thin film cold cathodes 1964
 3 3 p. 201-
1 p.
 artikel
69 Trends in logic circuit design 1964
 3 3 p. 195-
1 p.
 artikel
70 Tunnel emission into an insulating film with traps 1964
 3 3 p. 202-
1 p.
 artikel
71 Vacuum deposition techniques in an engineering laboratory facility for producing thin film integrated circuits 1964
 3 3 p. 203-204
2 p.
 artikel
72 Vanadium films evaporated on to liquid helium cooled substrates in ultra-high vacuum 1964
 3 3 p. 202-
1 p.
 artikel
73 Vapour sources for vacuum deposition of superconductive thin-film circuitry 1964
 3 3 p. 201-
1 p.
 artikel
                             73 gevonden resultaten
 
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