nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A cyclic queueing system with three servers and optional two-way feedback
|
Madan, K.C. |
|
1988 |
28 |
6 |
p. 873-875 3 p. |
artikel |
2 |
Availability of the feeding system in the sugar industry
|
Kumar, Dinesh |
|
1988 |
28 |
6 |
p. 867-871 5 p. |
artikel |
3 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1988 |
28 |
6 |
p. 841-843 3 p. |
artikel |
4 |
4724378 Calibrated automatic test system
|
Murray, DonaldF |
|
1988 |
28 |
6 |
p. 999- 1 p. |
artikel |
5 |
Device failure analysis in VLSI circuits due to missing flashes in mask fabrication process—A case study
|
Srivastava, A. |
|
1988 |
28 |
6 |
p. 885-888 4 p. |
artikel |
6 |
4730316 Digital integrated circuits
|
Desyllas, PeterLL |
|
1988 |
28 |
6 |
p. 1000- 1 p. |
artikel |
7 |
4730317 Digital integrated circuits
|
Desyllas, PeterLL |
|
1988 |
28 |
6 |
p. 1000- 1 p. |
artikel |
8 |
Electronic alarm circuits manual
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 992-993 2 p. |
artikel |
9 |
Estimation of series system reliability for exponentially distributed component life times
|
Dey, Dipak K. |
|
1988 |
28 |
6 |
p. 909-917 9 p. |
artikel |
10 |
Handbook of contamination control in microelectronics
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 994- 1 p. |
artikel |
11 |
4730232 High density microelectronic packaging module for high speed chips
|
Lindberg, FrankA |
|
1988 |
28 |
6 |
p. 999- 1 p. |
artikel |
12 |
4724380 Integrated circuit having a built-in self test design
|
Burrows, David |
|
1988 |
28 |
6 |
p. 999- 1 p. |
artikel |
13 |
4731759 Integrated circuit with built-in indicator of internal repair
|
Watanabe, Takayuk |
|
1988 |
28 |
6 |
p. 1000- 1 p. |
artikel |
14 |
4734923 Lithographic system mask inspection device
|
Frankel, RobertD |
|
1988 |
28 |
6 |
p. 1001- 1 p. |
artikel |
15 |
LSI interfacing
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 995-996 2 p. |
artikel |
16 |
Memo to all Indian authors
|
G.W.A.D, |
|
1988 |
28 |
6 |
p. 855- 1 p. |
artikel |
17 |
4734641 Method for the thermal characterization of semiconductor packaging systems
|
Byrd, Dee |
|
1988 |
28 |
6 |
p. 1000- 1 p. |
artikel |
18 |
MTBRD analysis of fail-safe systems
|
Zhou, Zhibang |
|
1988 |
28 |
6 |
p. 857-860 4 p. |
artikel |
19 |
MTBRD evaluation of an actual fail-safe system
|
Zhou, Zhibang |
|
1988 |
28 |
6 |
p. 861-864 4 p. |
artikel |
20 |
Non-linear regression for predicting software reliability
|
Xizi, Huang |
|
1988 |
28 |
6 |
p. 865-866 2 p. |
artikel |
21 |
On a two-unit cold standby redundant system with random switching time
|
Mahmoud, M.A.W. |
|
1988 |
28 |
6 |
p. 897-900 4 p. |
artikel |
22 |
On the determination of overall computer network reliability with m-level hierachical routing
|
Mandaltsis, D. |
|
1988 |
28 |
6 |
p. 967-977 11 p. |
artikel |
23 |
Optimization of maintenance facility for a repairable system subject to availability constraint
|
Shetty, B.N. |
|
1988 |
28 |
6 |
p. 893-896 4 p. |
artikel |
24 |
Parallel processing, distributed systems and local area networks
|
Canter, L.H. |
|
1988 |
28 |
6 |
p. 919-927 9 p. |
artikel |
25 |
Power reduction methods for NMOS dynamic random access memories
|
Naidu, R.Venkatapathi |
|
1988 |
28 |
6 |
p. 877-883 7 p. |
artikel |
26 |
Practical electronics handbook — Second edition
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 993- 1 p. |
artikel |
27 |
Publications, notices, calls for papers, etc.
|
|
|
1988 |
28 |
6 |
p. 845-854 10 p. |
artikel |
28 |
Reliability analysis of a repairable system in a changing environment subject to a general alternating renewal process
|
Cao, Jinhua |
|
1988 |
28 |
6 |
p. 889-892 4 p. |
artikel |
29 |
Rigid-flex printed wiring design for production readiness
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 996- 1 p. |
artikel |
30 |
Sensors and transducers
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 991- 1 p. |
artikel |
31 |
Shrinkage testimators for the variance of a normal distribution at single and double stages
|
Pandey, B.N. |
|
1988 |
28 |
6 |
p. 929-944 16 p. |
artikel |
32 |
4730749 Singulatory apparatus
|
Buesing, Jonathan |
|
1988 |
28 |
6 |
p. 1000- 1 p. |
artikel |
33 |
4734872 Temperature control for device under test
|
Eager, George |
|
1988 |
28 |
6 |
p. 1001- 1 p. |
artikel |
34 |
Testing whether F is “more NBU” than is G with randomly censored data
|
Wells, Martin T. |
|
1988 |
28 |
6 |
p. 901-908 8 p. |
artikel |
35 |
The conquest of the microchip
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 997- 1 p. |
artikel |
36 |
The hybrid approach for improving the reliability of ring systems
|
Roda, Valentin Obac |
|
1988 |
28 |
6 |
p. 979-989 11 p. |
artikel |
37 |
Title section, volume contents and author index, volume 28, 1988
|
|
|
1988 |
28 |
6 |
p. i-x nvt p. |
artikel |
38 |
Tolerance design of electronic circuits
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 991-992 2 p. |
artikel |
39 |
Uncertainty propagation in fault-tree analyses using an exact method of moments
|
Rushdi, Ali M. |
|
1988 |
28 |
6 |
p. 945-965 21 p. |
artikel |
40 |
VLSI electronics — Microstructure science
|
G.W.A.D., |
|
1988 |
28 |
6 |
p. 994-995 2 p. |
artikel |