nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Advanced copper/polyimide hybrid technology
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
2 |
Advantages of a floating annular ring in three-layer tab assembly
|
|
|
1988 |
28 |
5 |
p. 832-833 2 p. |
artikel |
3 |
Air force systems command approach to R&M
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
4 |
A method to estimate the Weibull parameters for progressively censored tests
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
5 |
A modified Monte Carlo technique for confidence limits of system reliability using pass-fail data
|
|
|
1988 |
28 |
5 |
p. 828-829 2 p. |
artikel |
6 |
An algorithm for symbolic reliability computation with path-sets or cut-sets
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
7 |
Analysis of CMOS transistor instabilities
|
|
|
1988 |
28 |
5 |
p. 825-826 2 p. |
artikel |
8 |
A new failure mode of very thin (< 50 Å) thermal SiO2 films
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
9 |
A new laser hermetic sealing technique for aluminum package
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
10 |
A new Monte Carlo method for evaluating system-failure probability
|
|
|
1988 |
28 |
5 |
p. 831-832 2 p. |
artikel |
11 |
A new VLSI diagnosis technique: focused ion beam assisted multi-level circuit probing
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
12 |
An improved method of enumerating all trees and minimal paths in a graph using Petri nets
|
Kontoleon, J.M. |
|
1988 |
28 |
5 |
p. 783-791 9 p. |
artikel |
13 |
A novel thermal expansion matched heatspreader for plastic encapsulation of silicon chips
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
14 |
A probabilistic model of quality control in microelectronics
|
Wojcik, Barbara E. |
|
1988 |
28 |
5 |
p. 721-728 8 p. |
artikel |
15 |
A sequence of diagnosis and repair for a 2-state repairable system
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
16 |
Association of bonding-wire displacement with gas bubbles in plastic-encapsulated integrated circuits
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
17 |
A stable algorithm to calculate steady-state probability and frequency of a Markov system
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
18 |
A test to identify the uniform distribution, with applications to probability plotting and other distributions
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
19 |
Automation of solder joint inspection procedures utilizing laser induced infrared
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
20 |
Boron implantation effects on Au: GaAs Schottky barrier
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
21 |
Boron implantation influence on the backgating effect in GaAs MESFETs
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
22 |
Buried coaxial conductors for high-speed interconnections
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
23 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1988 |
28 |
5 |
p. 673-675 3 p. |
artikel |
24 |
Chemical vapor deposition for microelectronics
|
G.W.A.D., |
|
1988 |
28 |
5 |
p. 821- 1 p. |
artikel |
25 |
Circuits intégrés logiques GaAs et leurs évaluations
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
26 |
Closed formulas for the failure probability of a strict-consecutive-k-out-of-n:F system
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
27 |
Comments on “Stochastic analysis of a two unit cold standby system with preparation time for repair”
|
De, Guo Tong |
|
1988 |
28 |
5 |
p. 687- 1 p. |
artikel |
28 |
Comparison of wafer scale integration with VLSI packaging approaches
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
29 |
Computer guided logic IC fault location
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
30 |
Controlled electromigration for field failure acceleration
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
31 |
Cost-density analysis of interconnections
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
32 |
4726023 Determination of testability of combined logic end memory by ignoring memory
|
Carter, JohnL |
|
1988 |
28 |
5 |
p. 838- 1 p. |
artikel |
33 |
4724965 Device for conveying components, particularly integrated chips, from an input magazine to an output magazine
|
Willberg, Hans-Heinrich |
|
1988 |
28 |
5 |
p. 837- 1 p. |
artikel |
34 |
4727317 Device orientation test method suitable for automatic test equipment
|
Oliver, MartinJ |
|
1988 |
28 |
5 |
p. 838- 1 p. |
artikel |
35 |
‘Double-R/half-M’, a reasonable design objective?
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
36 |
Effects of the atmosphere on the resistance of ITO thin films
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
37 |
Elastoplastic analysis of surface-mount solder joints
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
38 |
Electrical conduction mechanisms of barium-titanate-based thick-film capacitors
|
|
|
1988 |
28 |
5 |
p. 827-828 2 p. |
artikel |
39 |
Electrical modeling of interconnections in multilayer packaging structures
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
40 |
Electrical performances of devices made in SiO films obtained by lamp ZMR
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
41 |
Electromigration testing of Ti/Al-Si metallization for integrated circuits
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
42 |
Epitaxial growth of in situ doped silicon by LPCVD
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
43 |
Estimation of the Weibull renewal function
|
Card, Jill |
|
1988 |
28 |
5 |
p. 751-756 6 p. |
artikel |
44 |
Fabrication of 16-bit DAC using infrared fired thick-film process
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
45 |
4726024 Fail safe architecture for a computer system
|
Guziak, Robert |
|
1988 |
28 |
5 |
p. 838- 1 p. |
artikel |
46 |
Fast recursive algorithm to evaluate the reliability of a circular consecutive-k-out-of-n:F system
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
47 |
FIST—Ein symbolisches VLSI-design-system (FIST—a symbolic VLSI design-system)
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
48 |
Gas purity requirements for titanium silicide metalization
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
49 |
Half-maintainability — a formidable goal
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
50 |
High-frequency performance of TAB
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
51 |
Highly reliable trench capacitor with SiO2/Si3N4/SiO2 stacked film
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
52 |
How to identify a bathtub hazard rate
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
53 |
Hybrid ICs make the most of limited space
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
54 |
Hybrid ICs vital to high density mounting
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
55 |
Hypermedia and network reliability
|
Page, Lavon B. |
|
1988 |
28 |
5 |
p. 793-800 8 p. |
artikel |
56 |
In-process voltage stressing to increase reliability of MOS integrated circuits
|
Schnable, George L. |
|
1988 |
28 |
5 |
p. 757-781 25 p. |
artikel |
57 |
Introduction to microelectronic fabrication
|
G.W.A.D., |
|
1988 |
28 |
5 |
p. 823- 1 p. |
artikel |
58 |
Investigation of aluminum ball bonding mechanism
|
|
|
1988 |
28 |
5 |
p. 833-834 2 p. |
artikel |
59 |
Investigations of large PLCC package cracking during surface mount exposure
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
60 |
Ion implantation
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
61 |
Is the incoming physical inspection of microelectronic components really necessary?
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
62 |
Les circuits intégrés GaAs
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
63 |
Life expectancy of communication satellites
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
64 |
Mean time to failure for a consecutive-k-out-of-n:F system
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
65 |
Measurement of silicon strength as affected by wafer back processing
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
66 |
4728885 Method and apparatus for duplicating electrical environmental conditions
|
DeSanto, JosephJ |
|
1988 |
28 |
5 |
p. 839- 1 p. |
artikel |
67 |
4729126 Method and apparatus for supervising the accessing and testing of communication systems
|
Okek, DavidJ |
|
1988 |
28 |
5 |
p. 839- 1 p. |
artikel |
68 |
Micro-corrosion of Al-Cu bonding pads
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
69 |
Modern techniques of surface science
|
G.W.A.D., |
|
1988 |
28 |
5 |
p. 822- 1 p. |
artikel |
70 |
New process for automated IC assembly manufacturing
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
71 |
Novel failure mechanism and anomalous acceleration factor on a beam-lead IC
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
72 |
On reliability of a large consecutive-k-out-of-n:F system with (k-l)-step Markov dependence
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
73 |
On the implications of R&M 2000 environmental stress screening
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
74 |
On the relationship between component failure rate and stress-strength distributional characteristics
|
Shen, Kecheng |
|
1988 |
28 |
5 |
p. 801-812 12 p. |
artikel |
75 |
Optical properties of reactively sputtered silicon nitride films
|
|
|
1988 |
28 |
5 |
p. 834-835 2 p. |
artikel |
76 |
Optimal logic for multi-channel protective systems duing online maintenance
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
77 |
Optimizing the wire-bonding process for copper ball bonding, using classic experimental designs
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
78 |
Oxide thickness determination in Cr-SiO2-Si structures by dc current-voltage pairs
|
|
|
1988 |
28 |
5 |
p. 834- 1 p. |
artikel |
79 |
Planarization of sputtered aluminum
|
|
|
1988 |
28 |
5 |
p. 836- 1 p. |
artikel |
80 |
Probabilistic analysis of K-out-of-N:F three state-unit redundant system with common-cause failure and replacements
|
Mahmoud, M. |
|
1988 |
28 |
5 |
p. 729-742 14 p. |
artikel |
81 |
Publications, notices, calls for papers, etc.
|
|
|
1988 |
28 |
5 |
p. 677-685 9 p. |
artikel |
82 |
QC/QA for hybrid circuit manufacturing: a broader role
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
83 |
Recursive technique for computing system reliability
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
84 |
Reliability and key-protection for computer-security systems
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
85 |
Reliability of a consecutive-k-out-of-n:F system for Markov-dependent components
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
86 |
Reliability of high frequency high power GaAs MESFETs
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
87 |
Reliability of nano-meter thick multi-layer dielectric films on poly-crystalline silicon
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
88 |
Reliability of standby equipment with periodic testing
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
89 |
Reliability physics and a new discipline
|
Gao, Guang-Bo |
|
1988 |
28 |
5 |
p. 713-720 8 p. |
artikel |
90 |
Resist image reversal for next-generation VLSI circuit fabrication
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
91 |
4725775 Resistor isolated burn-in socket board
|
McMinn, Tommy |
|
1988 |
28 |
5 |
p. 837- 1 p. |
artikel |
92 |
R&M 2000. An Air Force Logistics Command challenge do it now
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
93 |
R&M 2000 and environmental stress screening
|
|
|
1988 |
28 |
5 |
p. 825- 1 p. |
artikel |
94 |
R&M 2000 and the Air Force acquisition process
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
95 |
R&M 2000—coequality between R&M, cost, performance, and schedule
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
96 |
R&M 2000: cutting the tether
|
|
|
1988 |
28 |
5 |
p. 830- 1 p. |
artikel |
97 |
R&M 2000 environmental stress screening
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
98 |
R&M 2000. The engineering connection
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
99 |
R&M 2000. The Strategic Air Command perspective
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
100 |
R&M 2000. The Tactical Air Command approach
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
101 |
Scanning electron microscopy for production
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
102 |
4727516 Semiconductor memory device having redundancy means
|
Yoshida, Masahiro |
|
1988 |
28 |
5 |
p. 838-839 2 p. |
artikel |
103 |
4726021 Semiconductor memory having error correcting means
|
Horiguchi, Masashi |
|
1988 |
28 |
5 |
p. 837- 1 p. |
artikel |
104 |
Simulation of resist profiles in single and triple layer electron beam lithography
|
|
|
1988 |
28 |
5 |
p. 835-836 2 p. |
artikel |
105 |
Smell identification using a thick-film hybrid gas sensor
|
|
|
1988 |
28 |
5 |
p. 835- 1 p. |
artikel |
106 |
Software metrics: Measuring the progress of software development
|
Tran, Tuyet-Lan |
|
1988 |
28 |
5 |
p. 693-702 10 p. |
artikel |
107 |
Some criteria for reliability growth
|
Baxter, Laurence A. |
|
1988 |
28 |
5 |
p. 743-750 8 p. |
artikel |
108 |
Some techniques of minimum mean square error estimation
|
Shah, M.C. |
|
1988 |
28 |
5 |
p. 689-691 3 p. |
artikel |
109 |
Stress analysis of partially yielded soldered joint for surface mount connectors
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
110 |
Stress related failures causing open metallization
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
111 |
Study of acceleration factor on moisture resistance test of plastic encapsulated semiconductor devices
|
Wada, T. |
|
1988 |
28 |
5 |
p. 813-820 8 p. |
artikel |
112 |
Surface attach chip carriers for conventional and high-performance applications
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
113 |
Test et encapsulation des circuits intégrés logiques GaAs
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
114 |
Testing whether F is “more IFRA than is G”
|
Tiwari, Ram C. |
|
1988 |
28 |
5 |
p. 703-712 10 p. |
artikel |
115 |
The clean module: advanced technology for processing silicon wafers
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
116 |
The effect of Cu addition to Al-Si interconnects on stress induced open-circuit failures
|
|
|
1988 |
28 |
5 |
p. 827- 1 p. |
artikel |
117 |
The effects of processing of EEPROM reliability
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
118 |
The fundamental limits for electronic packaging and systems
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
119 |
The impact of R&M 2000 on MCAIR integrated logistic support
|
|
|
1988 |
28 |
5 |
p. 828- 1 p. |
artikel |
120 |
The microstructure of ball bond corrosion failures
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
121 |
The Navy's best practices approach to reliability and quality
|
|
|
1988 |
28 |
5 |
p. 832- 1 p. |
artikel |
122 |
Theoretical and experimental study of subsurface burnout and ESD in GaAs FETs and HEMTs
|
|
|
1988 |
28 |
5 |
p. 825- 1 p. |
artikel |
123 |
Thermal fatigue reliability of SMT packages and interconnections
|
|
|
1988 |
28 |
5 |
p. 826- 1 p. |
artikel |
124 |
Thermal management of air- and liquid-cooled multichip modules
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |
125 |
The R&M 2000 initiative Air Force R&M policy letters
|
|
|
1988 |
28 |
5 |
p. 831- 1 p. |
artikel |
126 |
Trends in parametric test systems
|
|
|
1988 |
28 |
5 |
p. 825- 1 p. |
artikel |
127 |
Uncertainty propagation in fault tree analyses using lognormal distributions
|
|
|
1988 |
28 |
5 |
p. 829- 1 p. |
artikel |
128 |
US Army reliability initiatives—in concert with Air Force R&M 2000
|
|
|
1988 |
28 |
5 |
p. 830-831 2 p. |
artikel |
129 |
Wet bench fire suppression
|
|
|
1988 |
28 |
5 |
p. 833- 1 p. |
artikel |