no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A complex two unit system with stochastic demand
|
Sharafali, M. |
|
1988 |
28 |
3 |
p. 359-361 3 p. |
article |
2 |
An automatic concurrent error detecting tool for PLA generation
|
Guy, C.G. |
|
1988 |
28 |
3 |
p. 395-405 11 p. |
article |
3 |
An availability analysis of a k-out-of-N:G redundant system with dependant failure rates and common-cause failures
|
Chung, Who Kee |
|
1988 |
28 |
3 |
p. 391-393 3 p. |
article |
4 |
4703858 Apparatus for testing and sorting oblong, electronic components, more particularly integrated chips
|
Ueberreiter, Ekkehar |
|
1988 |
28 |
3 |
p. 498- 1 p. |
article |
5 |
A study of a 2-unit system with ‘random breakdown’ of the repair facility
|
Shankar Bhat, K. |
|
1988 |
28 |
3 |
p. 369-371 3 p. |
article |
6 |
4713815 Automatic fault location system for electronic devices
|
Bryan, Dennis P |
|
1988 |
28 |
3 |
p. 500- 1 p. |
article |
7 |
4701703 Bed-of-pins test fixture
|
Malloy, James T |
|
1988 |
28 |
3 |
p. 497- 1 p. |
article |
8 |
4713611 Burn-in apparatus for integrated circuits mounted on a carrier tape
|
Solstad, Russell V |
|
1988 |
28 |
3 |
p. 499-500 2 p. |
article |
9 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1988 |
28 |
3 |
p. 335-339 5 p. |
article |
10 |
4703483 Chip on chip type integrated circuit device
|
Enomoto, Yoshinori |
|
1988 |
28 |
3 |
p. 498- 1 p. |
article |
11 |
4714876 Circuit for initiating test modes
|
Gay, Richard |
|
1988 |
28 |
3 |
p. 500- 1 p. |
article |
12 |
Competing risks in parallel and series systems
|
Jaisingh, Lloyd R. |
|
1988 |
28 |
3 |
p. 469-485 17 p. |
article |
13 |
Computer networks and distributed systems
|
Sherif, Yosef S. |
|
1988 |
28 |
3 |
p. 419-467 49 p. |
article |
14 |
4714839 Control circuit for disabling or enabling the provision of redundancy
|
Chung, Shine C |
|
1988 |
28 |
3 |
p. 500- 1 p. |
article |
15 |
Cost-benefit analysis of a system with inspection, replacement and two types of repair
|
Singh, S.K. |
|
1988 |
28 |
3 |
p. 383-389 7 p. |
article |
16 |
4706019 Electron beam test probe system for analyzing integrated circuits
|
Richardson, Neil |
|
1988 |
28 |
3 |
p. 499- 1 p. |
article |
17 |
Estimating lower confidence limits on system reliability using a Monte-Carlo technique on binomial data
|
Lin, C.T. |
|
1988 |
28 |
3 |
p. 487-493 7 p. |
article |
18 |
4703260 Full chip integrated circuit tester
|
Beha, Johannes G |
|
1988 |
28 |
3 |
p. 497- 1 p. |
article |
19 |
Integrated circuit quality and reliability
|
G.W.A.D, |
|
1988 |
28 |
3 |
p. 496- 1 p. |
article |
20 |
Modified preliminary test estimator for average life in one parameter exponential distribution
|
Rai, V.N. |
|
1988 |
28 |
3 |
p. 379-382 4 p. |
article |
21 |
4706018 Noncontact dynamic tester for integrated circuits
|
Beha, Johannes |
|
1988 |
28 |
3 |
p. 498-499 2 p. |
article |
22 |
One unit reliability system subject to random shocks and preventive maintenance
|
Al-Ali, Abdul Ameer |
|
1988 |
28 |
3 |
p. 373-377 5 p. |
article |
23 |
Optimum system availability and spare allocation
|
Cǎtuneanu, V.M. |
|
1988 |
28 |
3 |
p. 353-357 5 p. |
article |
24 |
Printability of mask defects in negative resist projection photolithography
|
Ramamurthy, S. |
|
1988 |
28 |
3 |
p. 345-351 7 p. |
article |
25 |
4703484 Programmable integrated circuit fault detection apparatus
|
Rolfe, Robert M |
|
1988 |
28 |
3 |
p. 498- 1 p. |
article |
26 |
Publications, notices, calls for papers, etc
|
|
|
1988 |
28 |
3 |
p. 341-343 3 p. |
article |
27 |
Surfactants in emerging technologies (Surfactant Science Series, Volume 26)
|
G.W.A.D, |
|
1988 |
28 |
3 |
p. 495- 1 p. |
article |
28 |
Systolic array for VLSI implementation of realization techniques
|
Eydgahi, Ali M. |
|
1988 |
28 |
3 |
p. 363-367 5 p. |
article |
29 |
4706208 Technique for the operational life test of microprocessors
|
Helms, Howard D |
|
1988 |
28 |
3 |
p. 499- 1 p. |
article |
30 |
Time-dependent benefit analysis of two competing fault-tolerant systems
|
Eddaifi, D. |
|
1988 |
28 |
3 |
p. 407-417 11 p. |
article |
31 |
4703482 Universal apparatus for detecting faults in microprocessor systems
|
Auger, Jean |
|
1988 |
28 |
3 |
p. 497-498 2 p. |
article |