| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A datebase design for automated RAM analysis
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 2 |
Advances in laser assisted semiconductor processing
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 3 |
Airflow controller improves photoresist spin/coat uniformity
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 4 |
Algorithms for strict consecutive-k-out-of-n:F systems
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 5 |
A low cost lead frame technology for automated laser packaging
|
|
|
1987
|
27 |
6 |
p. 1040-
1 p.
|
artikel
|
| 6 |
A lower bound for system availability computation
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 7 |
Aluminum alloy bonding wires in corrosive environments
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 8 |
A model of substrate surface roughness effect on the electrical properties of thin films
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 9 |
An abstract language for specifying Markov reliability models
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 10 |
An age replacement policy with minimal repair cost limit
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 11 |
An algorithm for direct computation in consecutive-k-out-of-n:F systems
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 12 |
An algorithm for exact fault-tree probabilities without cut sets
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 13 |
An algorithm for reducing cut sets in fault-tree analysis
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 14 |
Analysis of a repairable 2-unit parallel redundant system with dependent failures
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 15 |
Analytical spares screening evaluation technique (ASSET)
|
|
|
1987
|
27 |
6 |
p. 1033-1034
2 p.
|
artikel
|
| 16 |
4657172 Apparatus and method of solder coating integrated circuit leads
|
Lee, JongS
|
|
1987
|
27 |
6 |
p. 1041-
1 p.
|
artikel
|
| 17 |
A RAMCAD/ULCE workstation shell structure
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 18 |
Army aviation warranty concepts
|
|
|
1987
|
27 |
6 |
p. 1027-
1 p.
|
artikel
|
| 19 |
A shrinkage testimator for scale parameter of an exponential distribution
|
Pandey, B.N.
|
|
1987
|
27 |
6 |
p. 949-951
3 p.
|
artikel
|
| 20 |
A simplified design-procedure for fixed-time life tests based on Kullback-Leibler information
|
|
|
1987
|
27 |
6 |
p. 1030-1031
2 p.
|
artikel
|
| 21 |
A software reliability model with multiple-error introduction and removal
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 22 |
A software tool for designing burn-in programs
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 23 |
A theoretical study of the electronic structure for twin stacking faults in silicon
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 24 |
Automating electronics manufacturing
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 25 |
Black aluminium films
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 26 |
Bounds on reliability of a coherent system with positively correlated components
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 27 |
Capacity planning with flow and reliability evaluation using Monte Carlo simulation
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 28 |
Classes of discrete decreasing and increasing mean-residual-life distributions
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 29 |
Comment on: extension of the Duane plotting technique
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 30 |
Comparison of the stability of gold and palladium alloy connector contacts subjected to vibration
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 31 |
Composite-type pin grid array package
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 32 |
Computation of mean time to failure for a system with simple redundancy
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 33 |
Cost analysis of a two unit, three state standby redundant complex system with two types of repair facilities under waiting
|
Gupta, P.P.
|
|
1987
|
27 |
6 |
p. 959-963
5 p.
|
artikel
|
| 34 |
Culprits causing avionic equipment failures
|
|
|
1987
|
27 |
6 |
p. 1032-1033
2 p.
|
artikel
|
| 35 |
Current-leakage failures in hybrid microcircuits
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 36 |
Dedrudging reliability prediction
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 37 |
Determining heat sink requirements for ceramic LCCs
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 38 |
Deterministic failure prediction
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 39 |
Development of ship equipment maintenance history
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 40 |
Development of stress screens
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 41 |
4660069 Device with captivate chip capacitor devices and method of making the same
|
Kochanski, Ronald
|
|
1987
|
27 |
6 |
p. 1042-
1 p.
|
artikel
|
| 42 |
Die attach evaluation using test chips containing localized temperature measurement diodes
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 43 |
Early design phase life cycle reliability modeling
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 44 |
Effect of system processes on error repetition: a probabilistic and measurement approach
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 45 |
Effect of uncertainty in failure rates on memory system reliability
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 46 |
Effects of field implants on small geometry CMOS devices
|
Roy, J.N.
|
|
1987
|
27 |
6 |
p. 953-957
5 p.
|
artikel
|
| 47 |
Electrical properties of Cr-Al alloy thin films
|
|
|
1987
|
27 |
6 |
p. 1038-1039
2 p.
|
artikel
|
| 48 |
Electrical resistivity and surface profile due to Al/Si/Ti reaction kinetics on an oxidised silicon wafer
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 49 |
Empirical Bayes estimation of mean life for a censored sample, constant hazard rate model
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 50 |
Evaluation of failure models through step-stress tests
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 51 |
Fabrication of RF reactivity sputtered TiN thin films
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 52 |
4660127 Fail-safe lead configuration for polar SMD components
|
Gunter, CharlesE
|
|
1987
|
27 |
6 |
p. 1042-
1 p.
|
artikel
|
| 53 |
Fatigue of 60/40 solder
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 54 |
Flow measurement and control in vacuum systems for microelectronics processing
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 55 |
Forthcoming papers
|
|
|
1987
|
27 |
6 |
p. 1045-
1 p.
|
artikel
|
| 56 |
GaAs monolithic microwave integrated circuits
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 57 |
GaAs on silicon
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 58 |
Gallium arsenide versus silicon for digital applications—a user's view
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 59 |
Generic automated model for early MTTR predictions
|
|
|
1987
|
27 |
6 |
p. 1031-1032
2 p.
|
artikel
|
| 60 |
Growth of Ta-oxide on thin tantalum films containing grain boundary particles
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 61 |
High reliability by automation and design quality
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 62 |
High-speed gallium arsenide for digital integrated circuits
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 63 |
4661930 High speed testing of integrated circuit
|
Tran, Bao
|
|
1987
|
27 |
6 |
p. 1043-
1 p.
|
artikel
|
| 64 |
8702166 Improvements relating to wafer scale integrated circuits
|
Westmore, RichardJ
|
|
1987
|
27 |
6 |
p. 1043-1044
2 p.
|
artikel
|
| 65 |
Impurity induced vibrations in light doped silicon
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 66 |
Integrated data base for computer-integrated manufacturing
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 67 |
Interval estimation of MTBF based on minimal information from a reliability demonstration test
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 68 |
Ion-implanted GaAs slow wave monolithic structure
|
|
|
1987
|
27 |
6 |
p. 1039-1040
2 p.
|
artikel
|
| 69 |
Jointly optimal block-replacement and spare provisioning policy
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 70 |
Life cycle support for microprocessor-based products
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 71 |
Life estimation after testing for early failures
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 72 |
LIF investigations of the surface chemistry in the dry processing of semiconductor devices
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 73 |
Linking centers and reliable trees of a network
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 74 |
Maximum entropy and reliability distributions
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 75 |
4661772 Measuring and testing circuit
|
Kirstein, Gerhard
|
|
1987
|
27 |
6 |
p. 1043-
1 p.
|
artikel
|
| 76 |
Mechanisms of positive gate-bias stress induced instabilities in CMOS transistors
|
Dimitrijev, S.
|
|
1987
|
27 |
6 |
p. 1001-1016
16 p.
|
artikel
|
| 77 |
4658395 Method for locating faults in a carrier subscriber communication system
|
Blackburn, Tom
|
|
1987
|
27 |
6 |
p. 1042-
1 p.
|
artikel
|
| 78 |
4661771 Method of screening resin-sealed semiconductor devices
|
Nakamura, Kazuo
|
|
1987
|
27 |
6 |
p. 1043-
1 p.
|
artikel
|
| 79 |
Minset splitting for improved reliability computation
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 80 |
Multilythics—a new circuit technology
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 81 |
On computing the spectral coefficients of a switching function
|
Rushdi, Ali M.
|
|
1987
|
27 |
6 |
p. 965-979
15 p.
|
artikel
|
| 82 |
On determination of spare quantity
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 83 |
On estimating the shape parameter of the Weibull distribution by shrinkage towards an interval
|
Pandey, B.N.
|
|
1987
|
27 |
6 |
p. 1017-1026
10 p.
|
artikel
|
| 84 |
On the mean time between failures for repairable systems
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 85 |
Operational reliability of the DX 200 switching system
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 86 |
Optimal replacement policies for irreparable warrantied items
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 87 |
Optimum multilayer design selection in relation to production errors
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 88 |
Ordnance system failure analysis
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 89 |
Parameter estimation for the Arrhenius model
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 90 |
Parametric study of heatspreader thermal performance in 48 lead plastic DIP's and 68 lead plastic leaded chip carriers
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 91 |
Planning life tests in which units are inspected for failure
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 92 |
Plasma etching of metals
|
|
|
1987
|
27 |
6 |
p. 1040-
1 p.
|
artikel
|
| 93 |
Positive photoresist enhancement options
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 94 |
Process specific chemical vapor deposition
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 95 |
Quality and reliability data collection and analysis system in integrated manufacturing of computer hard-ware
|
|
|
1987
|
27 |
6 |
p. 1028-1029
2 p.
|
artikel
|
| 96 |
Quantitative reliability evaluation of repairable phased-mission systems using Markov approach
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 97 |
Radial yield variations in semiconductor wafers
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 98 |
RAM growth of the PATRIOT missile system
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 99 |
Recent trends in surface treatment using ion beam processes
|
|
|
1987
|
27 |
6 |
p. 1040-
1 p.
|
artikel
|
| 100 |
Refractory metals pace IC complexity
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 101 |
Reliability analysis of computer systems using dataflow graph models
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 102 |
Reliability analysis of networks with capacity-constraints and failures at branches and nodes
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 103 |
Reliability analysis of networks with human errors: A block diagram approach
|
Dhillon, Balbir S.
|
|
1987
|
27 |
6 |
p. 981-999
19 p.
|
artikel
|
| 104 |
Reliability analysis within a CAE infrastructure
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 105 |
Reliability asessment of spacecraft electronics
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 106 |
Reliability cost in software life-cycle models
|
|
|
1987
|
27 |
6 |
p. 1033-
1 p.
|
artikel
|
| 107 |
Reliability evaluation of flow networks using delta-star trans-formations
|
|
|
1987
|
27 |
6 |
p. 1030-
1 p.
|
artikel
|
| 108 |
Reliability of metallized ceramic/polyimide substrates
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 109 |
Reliability of periodic, coherent, binary systems
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 110 |
Reliability optimization problems with multiple constraints
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 111 |
Robotic telepresence
|
|
|
1987
|
27 |
6 |
p. 1027-
1 p.
|
artikel
|
| 112 |
RTP: on the edge of acceptance
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 113 |
Safety evaluation of coal mine power systems
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 114 |
4658379 Semiconductor memory device with a laser programmable redundancy circuit
|
Fujishima, Kazuyasu
|
|
1987
|
27 |
6 |
p. 1041-1042
2 p.
|
artikel
|
| 115 |
4660179 Semiconductor memory device with switching for redundant cells
|
Aoyama, Keizo
|
|
1987
|
27 |
6 |
p. 1042-1043
2 p.
|
artikel
|
| 116 |
Semi-empirical model for the threshold voltage of a double implanted MOSFET and its temperature dependence
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 117 |
SEM study of etching of GaAs substrates in the H3PO4:H2O2:H2O system
|
|
|
1987
|
27 |
6 |
p. 1037-
1 p.
|
artikel
|
| 118 |
Signature analysis of dispatch schemes in wafer fabrication
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 119 |
Signature analysis: simulation of inventory, cycle time, and throughput trade-offs in wafer fabrication
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 120 |
Simple test of hypotheses on system availability and mean time to repair
|
|
|
1987
|
27 |
6 |
p. 1029-
1 p.
|
artikel
|
| 121 |
Simplification of Markov models by state merging
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 122 |
Smart BIT. An AI approach to better systems-level built-in test
|
|
|
1987
|
27 |
6 |
p. 1032-
1 p.
|
artikel
|
| 123 |
Software reliability: statistical modeling and estimation
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 124 |
Statistical control of stepper alignment
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 125 |
Stress screening can benefit a pipeline requirement
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 126 |
Structure and growth morphology of SiOx films deposited on NaCl (001) faces
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 127 |
Surface mount technology—the future of electronic assembly
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 128 |
Surge current failure in solid electrolyte tantalum capacitors
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|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 129 |
Technical monitoring in a communications satellite program
|
|
|
1987
|
27 |
6 |
p. 1034-1035
2 p.
|
artikel
|
| 130 |
The effect of oxygen on the structure and growth morphology of vapour deposited Cu films
|
|
|
1987
|
27 |
6 |
p. 1039-
1 p.
|
artikel
|
| 131 |
The efficient simulation of phased fault trees
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 132 |
The preparation and properties of 4.7 μF 2220 size 50 V Z5U relaxor multilayer ceramic capacitors
|
|
|
1987
|
27 |
6 |
p. 1028-
1 p.
|
artikel
|
| 133 |
The real world—a maintainer's view
|
|
|
1987
|
27 |
6 |
p. 1027-
1 p.
|
artikel
|
| 134 |
Thermal characteristics of plastic small outline transistor (SOT) packages
|
|
|
1987
|
27 |
6 |
p. 1027-1028
2 p.
|
artikel
|
| 135 |
The score statistic in constancy testing for a discrete hazard rate
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 136 |
Title section, volume contents and author index for volume 27, 1987
|
|
|
1987
|
27 |
6 |
p. i-x
nvt p.
|
artikel
|
| 137 |
Unified life cycle engineering
|
|
|
1987
|
27 |
6 |
p. 1027-
1 p.
|
artikel
|
| 138 |
4658209 Universal test board, serial input (for synthesizer testing)
|
Page, RobertE
|
|
1987
|
27 |
6 |
p. 1041-
1 p.
|
artikel
|
| 139 |
Upper and lower bounds for the reliability of a consecutive-k-out-n:F s system
|
|
|
1987
|
27 |
6 |
p. 1034-
1 p.
|
artikel
|
| 140 |
U.S. Naval Forces aircraft battle damage repair
|
|
|
1987
|
27 |
6 |
p. 1031-
1 p.
|
artikel
|
| 141 |
UV radiation effects of argon plasma on Si-SiO2 structures
|
|
|
1987
|
27 |
6 |
p. 1038-
1 p.
|
artikel
|
| 142 |
VLSI packaging technique using liquid-cooled channels
|
|
|
1987
|
27 |
6 |
p. 1036-
1 p.
|
artikel
|
| 143 |
Weighted coverage in fault-tolerant systems
|
|
|
1987
|
27 |
6 |
p. 1035-
1 p.
|
artikel
|
| 144 |
4659761 Zinc oxide in poly(arylene sulfide) compositions
|
Leland, JohnE
|
|
1987
|
27 |
6 |
p. 1042-
1 p.
|
artikel
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