| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An improved method of selecting network topology for optimal terminal reliability
|
Jain, S.P.
|
|
1986
|
26 |
2 |
p. 255-259
5 p.
|
artikel
|
| 2 |
An M/M/1 ∞ queueing system with feedback
|
Sharda,
|
|
1986
|
26 |
2 |
p. 261-264
4 p.
|
artikel
|
| 3 |
Approaches to life cycle cost analysis with system availability constraints — A review
|
Ntuen, Celestine A.
|
|
1986
|
26 |
2 |
p. 341-354
14 p.
|
artikel
|
| 4 |
Availability modelling of a vehicle fleet
|
Dhillon, Balbir S.
|
|
1986
|
26 |
2 |
p. 355-364
10 p.
|
artikel
|
| 5 |
Bayes estimation of reliability in stress-strength model of Weibull distribution with equal scale parameters
|
Pandey, M.
|
|
1986
|
26 |
2 |
p. 275-278
4 p.
|
artikel
|
| 6 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1986
|
26 |
2 |
p. 205-207
3 p.
|
artikel
|
| 7 |
4517659 Constant-distance structure polycellular very large scale integrated circuit
|
Chamberlain, JohnT
|
|
1986
|
26 |
2 |
p. 402-403
2 p.
|
artikel
|
| 8 |
4514846 Control fault detection for machine recovery and diagnostics prior to malfunction
|
Federico, AnthonyM
|
|
1986
|
26 |
2 |
p. 400-
1 p.
|
artikel
|
| 9 |
Cost-benefit analysis of a single server three-unit redundant system with inspection, delayed replacement and two types of repair
|
Gupta, Rakesh
|
|
1986
|
26 |
2 |
p. 247-253
7 p.
|
artikel
|
| 10 |
4517511 Current probe signal processing circuit employing sample and hold technique to locate circuit faults
|
Suto, AnthonyJ
|
|
1986
|
26 |
2 |
p. 401-402
2 p.
|
artikel
|
| 11 |
4516072 Device for use in testing printed circuit board components
|
Marpoe, Gary
|
|
1986
|
26 |
2 |
p. 401-
1 p.
|
artikel
|
| 12 |
4510439 Digital circuit multi-test system with automatic setting of test pulse levels
|
Roth, Rolf
|
|
1986
|
26 |
2 |
p. 397-
1 p.
|
artikel
|
| 13 |
Formulae for the average unavailability (MFDT) of a coherent system with periodically tested components
|
Aven, Terje
|
|
1986
|
26 |
2 |
p. 283-288
6 p.
|
artikel
|
| 14 |
Fuzzy convex cones and functions for ordinary and parametric programs
|
El-Kafrawy, M.M.
|
|
1986
|
26 |
2 |
p. 241-245
5 p.
|
artikel
|
| 15 |
4514254 Groundplane post-etch anodization
|
Klepner, Stephen
|
|
1986
|
26 |
2 |
p. 399-
1 p.
|
artikel
|
| 16 |
4514806 High speed link controller wraparound test logic
|
Hartig, KentH
|
|
1986
|
26 |
2 |
p. 400-
1 p.
|
artikel
|
| 17 |
4513905 Integrated circuit metallization technique
|
Nowicki, Ronald
|
|
1986
|
26 |
2 |
p. 399-
1 p.
|
artikel
|
| 18 |
4514786 Integrated-circuit support device employed in a system for selecting high-reliability integrated circuits
|
Charruau, Stephan
|
|
1986
|
26 |
2 |
p. 400-
1 p.
|
artikel
|
| 19 |
4517512 Integrated circuit test apparatus test head
|
Petrich, DennisM
|
|
1986
|
26 |
2 |
p. 402-
1 p.
|
artikel
|
| 20 |
4510673 Laser written chip identification method
|
Shils, AlanJ
|
|
1986
|
26 |
2 |
p. 398-
1 p.
|
artikel
|
| 21 |
4512950 Lead alloy soft solder containing radioactive particles used to make more reliable semiconductor devices
|
Hosoda, Naoyuki
|
|
1986
|
26 |
2 |
p. 398-
1 p.
|
artikel
|
| 22 |
Letter to the editor
|
Reiser, Benjamin
|
|
1986
|
26 |
2 |
p. 393-
1 p.
|
artikel
|
| 23 |
4508403 Low profile IC test clip
|
Weltman, David
|
|
1986
|
26 |
2 |
p. 396-
1 p.
|
artikel
|
| 24 |
4509132 Method and apparatus for transfer function simulator for testing complex systems
|
Kavaya, Michael
|
|
1986
|
26 |
2 |
p. 397-
1 p.
|
artikel
|
| 25 |
4507852 Method for making a reliable OHMIC contact between two layers of integrated circuit metallizations
|
Karulkar, PramodC
|
|
1986
|
26 |
2 |
p. 395-396
2 p.
|
artikel
|
| 26 |
4509008 Method of concurrently testing each of a plurality of interconnected integrated circuit chips
|
DasGupta, Sumit
|
|
1986
|
26 |
2 |
p. 396-
1 p.
|
artikel
|
| 27 |
4514436 Methods of highlighting pinholes in a surface layer of an article
|
Moerschel, KennethG
|
|
1986
|
26 |
2 |
p. 399-400
2 p.
|
artikel
|
| 28 |
N-MOS JK master/slave flip flop design for use in high speed control and counting applications
|
Srivastava, Ashok
|
|
1986
|
26 |
2 |
p. 265-269
5 p.
|
artikel
|
| 29 |
On fuzzy convexity of parametric programs
|
El-Kafrawy, M.M.
|
|
1986
|
26 |
2 |
p. 235-239
5 p.
|
artikel
|
| 30 |
On reliability of a certain elementary safety system
|
Czaplicki, Jacek M.
|
|
1986
|
26 |
2 |
p. 271-273
3 p.
|
artikel
|
| 31 |
On the computation of certain measures of importance of system components
|
Aven, Terje
|
|
1986
|
26 |
2 |
p. 279-281
3 p.
|
artikel
|
| 32 |
Optimal number of uses for an intermittently-used system
|
Nakagawa, Toshio
|
|
1986
|
26 |
2 |
p. 385-392
8 p.
|
artikel
|
| 33 |
4513064 Package for rugged electronics
|
Marcus, IraR
|
|
1986
|
26 |
2 |
p. 398-399
2 p.
|
artikel
|
| 34 |
Point-wise availability of a two-unit standby redundant electronic equipment under human failure
|
Gupta, P.P.
|
|
1986
|
26 |
2 |
p. 225-228
4 p.
|
artikel
|
| 35 |
4506437 Process for and structure of high density VLSI circuits, having self-aligned gates and contacts for FET devices and conducting lines
|
Godejahn, GordonC
|
|
1986
|
26 |
2 |
p. 395-
1 p.
|
artikel
|
| 36 |
Publications, notices, calls for papers, etc.
|
|
|
1986
|
26 |
2 |
p. 209-211
3 p.
|
artikel
|
| 37 |
Reliability analysis of a two state repairable parallel redundant system under human failure
|
Gupta, P.P.
|
|
1986
|
26 |
2 |
p. 221-224
4 p.
|
artikel
|
| 38 |
Reliability and application considerations for hard drives used in computers
|
Anjard, Ronald P.
|
|
1986
|
26 |
2 |
p. 289-291
3 p.
|
artikel
|
| 39 |
Reliability and manufacturing require effective floppy disk drive tests for computers
|
Anjard, Ronald P.
|
|
1986
|
26 |
2 |
p. 293-296
4 p.
|
artikel
|
| 40 |
Reliability and MTTF analysis of a non repairable parallel redundant complex system under hardware and human failures
|
Gupta, P.P.
|
|
1986
|
26 |
2 |
p. 229-234
6 p.
|
artikel
|
| 41 |
Reliability evaluation of plastic packaged devices for long life applications by THB test
|
Brambilla, P.
|
|
1986
|
26 |
2 |
p. 365-384
20 p.
|
artikel
|
| 42 |
4158431 Self-test feature for appliances or electronic systems operated by microprocessor
|
Van, BavelMichaelG
|
|
1986
|
26 |
2 |
p. 395-
1 p.
|
artikel
|
| 43 |
4517154 Self-test subsystem for nuclear reactor protection system
|
Dennis, UlricE
|
|
1986
|
26 |
2 |
p. 401-
1 p.
|
artikel
|
| 44 |
4517583 Semiconductor integrated circuit including a fuse element
|
Uchida, Yukimasa
|
|
1986
|
26 |
2 |
p. 402-
1 p.
|
artikel
|
| 45 |
Special notice to all Indian authors
|
Misra, K.B.
|
|
1986
|
26 |
2 |
p. 213-
1 p.
|
artikel
|
| 46 |
4516071 Split-cross-bridge resistor for testing for proper fabrication of integrated circuits
|
Buehler, MartinG
|
|
1986
|
26 |
2 |
p. 400-401
2 p.
|
artikel
|
| 47 |
Stochastic behaviour and profit analysis of a redundant system with slow switching device
|
Goel, L.R.
|
|
1986
|
26 |
2 |
p. 215-219
5 p.
|
artikel
|
| 48 |
4510017 Testable tape for bonding leads to semiconductor die and process for manufacturing same
|
Barber, LarryJ
|
|
1986
|
26 |
2 |
p. 397-
1 p.
|
artikel
|
| 49 |
4510603 Testing system for reliable access times in rom semiconductor memories
|
Catiller, RobertD
|
|
1986
|
26 |
2 |
p. 398-
1 p.
|
artikel
|
| 50 |
The degradation of optocouplers in accelerated tests: A comparison of experimental results with two published models
|
Williams, V.
|
|
1986
|
26 |
2 |
p. 297-339
43 p.
|
artikel
|
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