nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A case study in availability forecasting
|
Baxter, Laurence A. |
|
1985 |
25 |
5 |
p. 927-942 16 p. |
artikel |
2 |
A general method for turning a coherent system's structure function to SLE
|
Lu, Pei-En |
|
1985 |
25 |
5 |
p. 833-835 3 p. |
artikel |
3 |
Analysis of a one-server two-unit parallel system
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 859-863 5 p. |
artikel |
4 |
Analysis of two-unit-standby redundant system with administrative delay in repair
|
Pandey, D.K. |
|
1985 |
25 |
5 |
p. 917-920 4 p. |
artikel |
5 |
Analyzing data for CMOS leakage faults
|
Malaiya, Yashwant K. |
|
1985 |
25 |
5 |
p. 943-948 6 p. |
artikel |
6 |
Bayesian shrinkage estimation of reliability in parallel system with exponential failure of the components
|
Pandey, M. |
|
1985 |
25 |
5 |
p. 899-903 5 p. |
artikel |
7 |
Calculate coherent system's reliability by using SLE
|
Lu, Pei-En |
|
1985 |
25 |
5 |
p. 829-831 3 p. |
artikel |
8 |
Calendar of International Conferences, Symposia, Lectures and Meetings of Interest
|
|
|
1985 |
25 |
5 |
p. 815-817 3 p. |
artikel |
9 |
Call for papers
|
|
|
1985 |
25 |
5 |
p. 819-825 7 p. |
artikel |
10 |
4493059 Circuit and method for writing in a semiconductor memory device
|
|
|
1985 |
25 |
5 |
p. 1012- 1 p. |
artikel |
11 |
Cost analysis of a two-unit electronic parallel redundant system with overloading effect
|
Gupta, P.P. |
|
1985 |
25 |
5 |
p. 847-851 5 p. |
artikel |
12 |
Cost-benefit analysis of a one-server two-nonidentical-unit cold standby system with repair and preventive maitenance
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 991-1000 10 p. |
artikel |
13 |
Cost-benefit analysis of a one-server two-unit cold standby system with repair and age replacement
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 977-990 14 p. |
artikel |
14 |
Cost-benefit analysis of a one-server two-unit imperfect switch system with delayed repair
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 865-867 3 p. |
artikel |
15 |
Cost-benefit analysis of a two-unit adaptive system subject to slow switch with random service
|
Radhakrishnan, R. |
|
1985 |
25 |
5 |
p. 869-875 7 p. |
artikel |
16 |
Cost-benefit analysis of one-server two-unit imperfect switch system with degradation
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 949-958 10 p. |
artikel |
17 |
Cost-benefit analysis of one-server two-unit parallel system subject to random service
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 959-975 17 p. |
artikel |
18 |
Cost-benefit analysis of one-server two-unit replacement system with imperfect switch
|
Gopalan, M.N. |
|
1985 |
25 |
5 |
p. 877-879 3 p. |
artikel |
19 |
4493010 Electronic packaging module utilizing phase-chage conductive cooling
|
|
|
1985 |
25 |
5 |
p. 1012- 1 p. |
artikel |
20 |
Fitting cost-reliability data in a standard curve
|
Kamal Kumar Govil, |
|
1985 |
25 |
5 |
p. 913-915 3 p. |
artikel |
21 |
Further results on the solution of a queueing model by Sharda and Garg
|
Sharda, |
|
1985 |
25 |
5 |
p. 909-912 4 p. |
artikel |
22 |
Invited guest editorial
|
Ryerson, Clifford M. |
|
1985 |
25 |
5 |
p. 827- 1 p. |
artikel |
23 |
4489479 Method for repair of buried contacts in mosfet devices
|
|
|
1985 |
25 |
5 |
p. 1011- 1 p. |
artikel |
24 |
4490783 Microcomputer with self-test of microcode
|
|
|
1985 |
25 |
5 |
p. 1011- 1 p. |
artikel |
25 |
4496900 Nonlinearity detection using fault-generated second harmonic
|
|
|
1985 |
25 |
5 |
p. 1013- 1 p. |
artikel |
26 |
Note on the solution of a queueing model by Sharda and Garg
|
Sharda, |
|
1985 |
25 |
5 |
p. 905-907 3 p. |
artikel |
27 |
Preliminary test estimator for life data
|
Gupta, V.P. |
|
1985 |
25 |
5 |
p. 881-887 7 p. |
artikel |
28 |
Program verification for microprocessors through Petri net modeling
|
Hura, G.S. |
|
1985 |
25 |
5 |
p. 1001-1010 10 p. |
artikel |
29 |
Reliability/performance evaluation for a multisystem with preventive maintenance
|
Ohshimo, Hideshi |
|
1985 |
25 |
5 |
p. 841-846 6 p. |
artikel |
30 |
4493077 Scan testable integrated circuit
|
|
|
1985 |
25 |
5 |
p. 1012- 1 p. |
artikel |
31 |
Screen printed thick film nickel-silicon interaction
|
Singh, Awatar |
|
1985 |
25 |
5 |
p. 889-893 5 p. |
artikel |
32 |
Some notes on availability theory
|
Baxter, Laurence A. |
|
1985 |
25 |
5 |
p. 921-926 6 p. |
artikel |
33 |
Specific resistivity of a metal-n GaAs OHMIC contact with an intermediate N + layer
|
Gupta, R.P. |
|
1985 |
25 |
5 |
p. 837-840 4 p. |
artikel |
34 |
Stochastic behaviour of a three-state complex repairable system with three types of failures
|
Gupta, P.P. |
|
1985 |
25 |
5 |
p. 853-858 6 p. |
artikel |
35 |
4490673 Testing an integrated circuit containing a tristate driver and a control signal generating network therefor
|
|
|
1985 |
25 |
5 |
p. 1011- 1 p. |
artikel |
36 |
Thermal stresses developed in thin films of germanium
|
Arora, R.K. |
|
1985 |
25 |
5 |
p. 895-898 4 p. |
artikel |
37 |
4498227 Wafer fabrication by implanting through protective layer
|
|
|
1985 |
25 |
5 |
p. 1013- 1 p. |
artikel |
38 |
4493055 Wafer-scale integrated circuits
|
|
|
1985 |
25 |
5 |
p. 1012- 1 p. |
artikel |