nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A certain model of reliability diagnostic of renewal objects
|
Czaplicki, Jacek M. |
|
1985 |
25 |
4 |
p. 695-698 4 p. |
artikel |
2 |
Analysis of a two-unit system subject to repair and preventive maintenance with non-linear revenue and costs
|
Gopalan, M.N. |
|
1985 |
25 |
4 |
p. 621-623 3 p. |
artikel |
3 |
A new measure for time-dependent queueing systems with statistically dependent arrivals
|
Sharda, |
|
1985 |
25 |
4 |
p. 651-653 3 p. |
artikel |
4 |
A new method for system reliability bounds
|
Gopal, Krishna |
|
1985 |
25 |
4 |
p. 703-708 6 p. |
artikel |
5 |
A queueing problem with random memory arrivals and heterogeneous servers
|
Sharda, |
|
1985 |
25 |
4 |
p. 645-650 6 p. |
artikel |
6 |
4500836 Automatic wafer prober with programmable tester interface
|
Staudacher, George |
|
1985 |
25 |
4 |
p. 810- 1 p. |
artikel |
7 |
Bibliography of literature on telecommunication systems reliability
|
Dhillon, Balbir S. |
|
1985 |
25 |
4 |
p. 715-727 13 p. |
artikel |
8 |
Busy period analysis of a two-unit warm standby system with imperfect switch
|
Garg, Rajiv |
|
1985 |
25 |
4 |
p. 675-679 5 p. |
artikel |
9 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1985 |
25 |
4 |
p. 607-610 4 p. |
artikel |
10 |
4503386 Chip partitioning aid (CPA)—A structure for test pattern generation for large logic networks
|
DasGupta, Sumit |
|
1985 |
25 |
4 |
p. 812- 1 p. |
artikel |
11 |
Computer aided fault tree synthesis
|
Bossche, A. |
|
1985 |
25 |
4 |
p. 773-788 16 p. |
artikel |
12 |
4495468 Controlled phase off-set digital test system
|
Richards, EdwardW |
|
1985 |
25 |
4 |
p. 810- 1 p. |
artikel |
13 |
Cost analysis of a two unit cold standby system under different weather conditions
|
Goel, L.R. |
|
1985 |
25 |
4 |
p. 655-659 5 p. |
artikel |
14 |
Cost analysis of a two-unit warm standby reliability system with two types of repair facilities
|
Murari, K. |
|
1985 |
25 |
4 |
p. 681-689 9 p. |
artikel |
15 |
Cost-benefit analysis of a system with intermittent repair and inspection under abnormal weather
|
Goel, L.R. |
|
1985 |
25 |
4 |
p. 665-668 4 p. |
artikel |
16 |
Cost-benefit analysis of one-server two-unit system with imperfect switch
|
Gopalan, M.N. |
|
1985 |
25 |
4 |
p. 643-644 2 p. |
artikel |
17 |
4504782 Detection of catastrophic failure of dielectric, improper connection, and temperature of a printed circuit assembly via one wire
|
Zbinden, TerryB |
|
1985 |
25 |
4 |
p. 812-813 2 p. |
artikel |
18 |
Effect of reliability on the efficiency of communication systems
|
Aggarwal, K.K. |
|
1985 |
25 |
4 |
p. 691-693 3 p. |
artikel |
19 |
Estimation of failure probability from a bivariate normal stress-strength distribution
|
Mukherjee, S.P. |
|
1985 |
25 |
4 |
p. 699-702 4 p. |
artikel |
20 |
4502209 Forming low-resistance contact to silicon
|
Eizenberg, Moshe |
|
1985 |
25 |
4 |
p. 811-812 2 p. |
artikel |
21 |
4502140 Go/no go margin test circuit for semiconductor memory
|
Proebsting, RobertJ |
|
1985 |
25 |
4 |
p. 811- 1 p. |
artikel |
22 |
Heat flow resistance measurements of silicon p +-v-n + diodes under forward and reverse biased conditions
|
Eranna, G. |
|
1985 |
25 |
4 |
p. 709-712 4 p. |
artikel |
23 |
4500993 In-circuit digital tester for testing microprocessor boards
|
Jacobson, Robert |
|
1985 |
25 |
4 |
p. 811- 1 p. |
artikel |
24 |
4504887 Leadless integrated circuit package housing having means for contact replacement
|
Bakermans, Johannes |
|
1985 |
25 |
4 |
p. 813- 1 p. |
artikel |
25 |
4506212 Method and apparatus for testing integrated circuits using AC test input and comparison of resulting frequency spectrum outputs
|
Melia, Alan |
|
1985 |
25 |
4 |
p. 814- 1 p. |
artikel |
26 |
4504784 Method of electrically testing a packaging structure having n interconnected integrated circuit chips
|
Goel, Prabhakar |
|
1985 |
25 |
4 |
p. 813- 1 p. |
artikel |
27 |
4494066 Method of electrically testing a packaging structure having N interconnected integrated circuit chips
|
Goel, Prabhaka |
|
1985 |
25 |
4 |
p. 809- 1 p. |
artikel |
28 |
4506215 Modular test probe
|
Coughlin, Charles |
|
1985 |
25 |
4 |
p. 814- 1 p. |
artikel |
29 |
On a two-dissimilar unit standby redundant system with imperfect switch
|
Mahmoud, M.A.W. |
|
1985 |
25 |
4 |
p. 753-758 6 p. |
artikel |
30 |
On the stochastic behaviour of a one-server n-unit system subject to random inspection
|
Naidu, R.Subramanyam |
|
1985 |
25 |
4 |
p. 625-629 5 p. |
artikel |
31 |
4494069 Optical scanning method of testing material defects
|
Lin, HungC |
|
1985 |
25 |
4 |
p. 809- 1 p. |
artikel |
32 |
Optimal number of major failures before replacement
|
Park, Kyung S. |
|
1985 |
25 |
4 |
p. 797-805 9 p. |
artikel |
33 |
Power system reliability, safety and management
|
G.W.A.D., |
|
1985 |
25 |
4 |
p. 808- 1 p. |
artikel |
34 |
4506363 Programmable logic array in ECL technology
|
Barre, Claude |
|
1985 |
25 |
4 |
p. 814- 1 p. |
artikel |
35 |
Publications, notices, calls for papers, etc.
|
|
|
1985 |
25 |
4 |
p. 611-617 7 p. |
artikel |
36 |
Reliability derivation by cutset approach
|
Jamil, A.T.M. |
|
1985 |
25 |
4 |
p. 789-795 7 p. |
artikel |
37 |
Reliability evaluation of human operators under stress
|
Dhillon, Balbir S. |
|
1985 |
25 |
4 |
p. 729-752 24 p. |
artikel |
38 |
Stochastic analysis of a man-machine system with critical human error
|
Goel, L.R. |
|
1985 |
25 |
4 |
p. 669-674 6 p. |
artikel |
39 |
Stochastic analysis of a one-server two-unit (dissimilar) system subject to slow switch
|
Gopalan, M.N. |
|
1985 |
25 |
4 |
p. 631-636 6 p. |
artikel |
40 |
Stochastic analysis of a two unit adaptive system subject to slow switch with random service
|
Radhakrishnan, R. |
|
1985 |
25 |
4 |
p. 759-771 13 p. |
artikel |
41 |
Stochastic analysis of one-server two-unit adaptive system with slow switch
|
Gopalan, M.N. |
|
1985 |
25 |
4 |
p. 637-642 6 p. |
artikel |
42 |
Stochastic behaviour and profit function of a system with precautionary measures under abnormal weather
|
Goel, L.R. |
|
1985 |
25 |
4 |
p. 661-664 4 p. |
artikel |
43 |
Systems reliability, maintainability and management
|
G.W.A.D., |
|
1985 |
25 |
4 |
p. 807- 1 p. |
artikel |
44 |
Technique for lifting off thick film print fired on alumina
|
Singh, Awatar |
|
1985 |
25 |
4 |
p. 619-620 2 p. |
artikel |
45 |
4495603 Test system for segmented memory
|
Varshney, RameshC |
|
1985 |
25 |
4 |
p. 810- 1 p. |
artikel |
46 |
The new applications of the hypergeometric distribution model on software reliability
|
Xizi, Huang |
|
1985 |
25 |
4 |
p. 713-714 2 p. |
artikel |
47 |
The problem of reliability
|
G.W.A.D., |
|
1985 |
25 |
4 |
p. 617- 1 p. |
artikel |