| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Admissibility of a conditionally specified test procedure for life data
|
Saxena, S.K.
|
|
1985
|
25 |
1 |
p. 59-60
2 p.
|
artikel
|
| 2 |
A new algorithm for network system reliability
|
Chen, Hua Cheng
|
|
1985
|
25 |
1 |
p. 35-40
6 p.
|
artikel
|
| 3 |
A new CMOS IC structure and its characterization
|
Živić, Z.
|
|
1985
|
25 |
1 |
p. 123-146
24 p.
|
artikel
|
| 4 |
An improved method for a redundancy optimization problem
|
Dakshina Murty, V.
|
|
1985
|
25 |
1 |
p. 93-95
3 p.
|
artikel
|
| 5 |
4454413 Apparatus for tracking integrated circuit devices
|
Morton, WilliamD
|
|
1985
|
25 |
1 |
p. 203-
1 p.
|
artikel
|
| 6 |
A reliability physics model for dissimilar two-unit standby system with single repair facility
|
Gopalan, M.N.
|
|
1985
|
25 |
1 |
p. 17-23
7 p.
|
artikel
|
| 7 |
Availability analysis of a two-unit (dissimilar) parallel system with inspection and bivariate exponential life times
|
Goel, L.R.
|
|
1985
|
25 |
1 |
p. 77-80
4 p.
|
artikel
|
| 8 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1985
|
25 |
1 |
p. 1-4
4 p.
|
artikel
|
| 9 |
4444309 Carrier for a leadless integrated circuit chip
|
Morton, WilliamD
|
|
1985
|
25 |
1 |
p. 201-
1 p.
|
artikel
|
| 10 |
Conductibilité thermique des éléments dans les circuits hybrides
|
Berlicki, T.M.
|
|
1985
|
25 |
1 |
p. 101-103
3 p.
|
artikel
|
| 11 |
Cost analysis of a two-unit cold standby system with two types of operation and repair
|
Goel, L.R.
|
|
1985
|
25 |
1 |
p. 71-75
5 p.
|
artikel
|
| 12 |
Cost analysis of a two unit priority standby system with imperfect switch and arbitrary distributions
|
Goel, L.R.
|
|
1985
|
25 |
1 |
p. 65-69
5 p.
|
artikel
|
| 13 |
Cost analysis of a two-unit standby system with delayed replacement and better utilization of units
|
Goel, L.R.
|
|
1985
|
25 |
1 |
p. 81-86
6 p.
|
artikel
|
| 14 |
Cost-benefit analysis of an n-unit repairable adaptive system
|
Vijayakumar, A.
|
|
1985
|
25 |
1 |
p. 31-34
4 p.
|
artikel
|
| 15 |
Cost-benefit analysis of a two-unit adaptive system with slow switch
|
Gopalan, M.N.
|
|
1985
|
25 |
1 |
p. 25-30
6 p.
|
artikel
|
| 16 |
Cost-benefit analysis of one-server two-unit system subject to slow switch and random service
|
Gopalan, M.N.
|
|
1985
|
25 |
1 |
p. 183-194
12 p.
|
artikel
|
| 17 |
Direct computation of expected numbers of failures and repairs via integral equation approach
|
Inagaki, Toshiyuki
|
|
1985
|
25 |
1 |
p. 105-109
5 p.
|
artikel
|
| 18 |
Editorial Board
|
|
|
1985
|
25 |
1 |
p. IFC-
1 p.
|
artikel
|
| 19 |
4456978 Electrically alterable read only memory semiconductor device made by low pressure chemical vapor deposition process
|
Morley, RichardM
|
|
1985
|
25 |
1 |
p. 204-
1 p.
|
artikel
|
| 20 |
Erratum
|
|
|
1985
|
25 |
1 |
p. 197-199
3 p.
|
artikel
|
| 21 |
4453248 Fault alignment exclusion method to prevent realignment of previously paired memory defects
|
Ryan, PhilipM
|
|
1985
|
25 |
1 |
p. 203-
1 p.
|
artikel
|
| 22 |
4445085 Fault location methods and apparatus using current pulse injection
|
Metcalf, Eric
|
|
1985
|
25 |
1 |
p. 201-
1 p.
|
artikel
|
| 23 |
4459694 Field programmable device with circuitry for detecting poor insulation between adjacent word lines
|
Ueno, Kouji
|
|
1985
|
25 |
1 |
p. 205-
1 p.
|
artikel
|
| 24 |
Human reliability with probabilistic learning in discrete and continuous tasks: Conceptualization and modeling
|
Park, Kyung S.
|
|
1985
|
25 |
1 |
p. 157-166
10 p.
|
artikel
|
| 25 |
4450402 Integrated circuit testing apparatus
|
Owen, WilliamH
|
|
1985
|
25 |
1 |
p. 202-
1 p.
|
artikel
|
| 26 |
4446341 Mechanized testing of subscriber facilities
|
Rubin, Harvey
|
|
1985
|
25 |
1 |
p. 201-202
2 p.
|
artikel
|
| 27 |
4458349 Method for storing data words in fault tolerant memory to recover uncorrectable errors
|
Aichelmann, FrederickJ
|
|
1985
|
25 |
1 |
p. 205-
1 p.
|
artikel
|
| 28 |
4459693 Method of and apparatus for the automatic diagnosis of the failure of electrical devices connected to common bus nodes and the like
|
Prang, Joseph
|
|
1985
|
25 |
1 |
p. 205-
1 p.
|
artikel
|
| 29 |
Modelling the firing tables of field artillery (cannon 105 mm howitzer)
|
Sherif, Y.S
|
|
1985
|
25 |
1 |
p. 41-53
13 p.
|
artikel
|
| 30 |
On a compound redundant system without repair
|
Fukuta, Jiro
|
|
1985
|
25 |
1 |
p. 167-182
16 p.
|
artikel
|
| 31 |
Optimal stocking for replacement with minimal repair
|
Park, Y.T.
|
|
1985
|
25 |
1 |
p. 147-155
9 p.
|
artikel
|
| 32 |
4451742 Power supply control for integrated circuit
|
Aswell, CecilJ
|
|
1985
|
25 |
1 |
p. 202-
1 p.
|
artikel
|
| 33 |
4455737 Process for and structure of high density VLSI circuits, having selfaligned gates and contacts for FET devices and conducting lines
|
Godejahn, GordonC
|
|
1985
|
25 |
1 |
p. 204-
1 p.
|
artikel
|
| 34 |
4455739 Process protection for individual device gates on large area MIS devices
|
Hynecek, Jaroslav
|
|
1985
|
25 |
1 |
p. 204-
1 p.
|
artikel
|
| 35 |
Program solves N-job, M-machine sequencing problem
|
Sherif, Yosef S.
|
|
1985
|
25 |
1 |
p. 55-57
3 p.
|
artikel
|
| 36 |
Publications, notices, calls for papers, etc.
|
|
|
1985
|
25 |
1 |
p. 5-9
5 p.
|
artikel
|
| 37 |
4459685 Redundancy system for high speed, wide-word semiconductor memories
|
Sud, Rahul
|
|
1985
|
25 |
1 |
p. 205-
1 p.
|
artikel
|
| 38 |
Reliability analysis of non-maintained parallel systems subject to hardware failure and human error
|
Dhillon, Balbir S.
|
|
1985
|
25 |
1 |
p. 111-122
12 p.
|
artikel
|
| 39 |
Reliability of analogue electron systems
|
G.W.A.D.,
|
|
1985
|
25 |
1 |
p. 195-
1 p.
|
artikel
|
| 40 |
Reverse photolithographic technique for thick film circuits
|
Singh, Awatar
|
|
1985
|
25 |
1 |
p. 61-63
3 p.
|
artikel
|
| 41 |
Sensitivity analysis of a coherent system
|
Lu, Pei-En
|
|
1985
|
25 |
1 |
p. 97-99
3 p.
|
artikel
|
| 42 |
Stochastic behaviour of man-machine systems operating under different weather conditions
|
Goel, L.R.
|
|
1985
|
25 |
1 |
p. 87-91
5 p.
|
artikel
|
| 43 |
4455654 Test apparatus for electronic assemblies employing a microprocessor
|
Bhaskar, KasiS
|
|
1985
|
25 |
1 |
p. 203-204
2 p.
|
artikel
|
| 44 |
The microelectronics applications of differential scanning calorimetry for packaging and materials—Including solder pastes
|
Anjard Sr., Ronald P.
|
|
1985
|
25 |
1 |
p. 9-16
8 p.
|
artikel
|
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