| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comprehensive approach to IC design and fabrication
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 2 |
A comprehensive test sequence for the electron beam exposure system
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 3 |
A life-cycle cost viewpoint of software maintainability
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 4 |
A Markov approach to wear-out modelling
|
Bobbio, Andrea
|
|
1983
|
23 |
1 |
p. 113-119
7 p.
|
artikel
|
| 5 |
A model of maintenance decision errors
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 6 |
A modified SEM type EB direct writing system and its application on MOS LSI fabrication
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 7 |
An approach to ensure stability of precision laser trimmed thick film resistors
|
Joshi, Anil G.
|
|
1983
|
23 |
1 |
p. 161-165
5 p.
|
artikel
|
| 8 |
An approach to high reliability for a spacecraft IRU
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 9 |
An evaluation of palladium and palladium silver alloy in a dual-in-line package switch
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 10 |
A Petri net approach to minimize ROM in microprogrammed digital computers
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 11 |
Application of a software reliability model to decide software release time
|
Shanthikumar, J.G.
|
|
1983
|
23 |
1 |
p. 41-59
19 p.
|
artikel
|
| 12 |
Applications of high-speed data acquisition for semiconductor device yield analysis, Part I
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 13 |
Applications of profile simulation for thin film deposition and etching processes
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 14 |
Approaches to software reliability prediction
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 15 |
A quasi-Bayes estimate of the failure intensity of a reliability-growth model
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 16 |
A reliability warranty concept for the FMS environment
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 17 |
A review of the electronic reliability design handbook
|
|
|
1983
|
23 |
1 |
p. 187-
1 p.
|
artikel
|
| 18 |
A simple method for modeling VLSI yields
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 19 |
A single-chip digital signal processor for telecommunication applications
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 20 |
A survey of 1982 testing trends
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 21 |
Back-contact resistor network pares wire count in ECL hybrids
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 22 |
Calculation of the electric field enhancement for a degenerate diffusion process
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 23 |
Characteristics of metal/tunnel-oxide/n/p+ silicon switching devices—II. Two-dimensional effects in oxide-isolated structures
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 24 |
C-MOS chip set streamlines floating-point processing
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 25 |
Combined analog/digital LSI design using I2L gate arrays
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 26 |
Combined hardware/software reliability models
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 27 |
Comparison of GaAs device approaches for ultrahigh-speed VLSI
|
|
|
1983
|
23 |
1 |
p. 193-194
2 p.
|
artikel
|
| 28 |
Comparison of mean time to first failure and mean up time
|
Singh, Chanan
|
|
1983
|
23 |
1 |
p. 79-90
12 p.
|
artikel
|
| 29 |
Computer-generated models abridge thermal analysis of packaged VLSI
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 30 |
Confidence intervals and tests of hypotheses for the reliability of a 2-parameter Weibull system
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 31 |
Control of boron diffusion in polysilicon for constructing overlapping polysilicon gate charge-coupled devices
|
Srivastava, A.
|
|
1983
|
23 |
1 |
p. 179-181
3 p.
|
artikel
|
| 32 |
Cost-benefit analysis of a one-server two-unit warm standby system subject to different inspection strategies
|
Subramanyam Naidu, R.
|
|
1983
|
23 |
1 |
p. 121-128
8 p.
|
artikel
|
| 33 |
Crystal slicing equipment directions
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 34 |
Custom chip adds frequency to hand-held meter's repertoire
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 35 |
Custom ICs spread their influence
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 36 |
Deep metal-related centres in germanium
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 37 |
Deep UV exposure technology
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 38 |
Derivative MIL-STD-781C truncated sequential tests
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 39 |
Design curves for integrated uniform thin film band-pass filter
|
Singh, H.R.
|
|
1983
|
23 |
1 |
p. 183-184
2 p.
|
artikel
|
| 40 |
Detecting and diagnosing latent quality losses
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 41 |
Diffusion of zinc into ion-implanted gallium arsenide
|
|
|
1983
|
23 |
1 |
p. 198-199
2 p.
|
artikel
|
| 42 |
Discharge treated thin films
|
Singh, Awatar
|
|
1983
|
23 |
1 |
p. 185-
1 p.
|
artikel
|
| 43 |
Discrete convolution in power system reliability
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 44 |
Dopant density from maximum-minimum capacitance ratio of implanted MOS structures
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 45 |
Editorial Board
|
|
|
1983
|
23 |
1 |
p. IFC-
1 p.
|
artikel
|
| 46 |
Effect of age in vitreous As2Se3 thin films
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 47 |
Effect of oxidation-induced positive charges on the kinetics of silicon oxidation
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 48 |
Effect of the presence of an inversion layer in an MPN structure
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 49 |
Electrical characteristics and memory behavior of GE3N4-GaAs MIS devices
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 50 |
Electrical surface properties of semi-insulating and ion implanted GaAs revealed by thermo-optical acousto-electric voltage method
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 51 |
Electron beam direct writing technology applied to 512 Kbit ROM with 1 μm geometry
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 52 |
Electron-beam fabricated high-speed digital GaAs integrated circuits
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 53 |
Electron lithography
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 54 |
Empirical prediction of overall reliability in computer communication networks
|
Srivastava, Sanjaya
|
|
1983
|
23 |
1 |
p. 137-139
3 p.
|
artikel
|
| 55 |
Engineered marine system maintenance extends life cycle
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 56 |
Engineers for VLSI—a scarce commodity
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 57 |
Enumeration of all simple paths in a directed graph using Petri net: A systematic approach
|
Hura, G.S.
|
|
1983
|
23 |
1 |
p. 157-159
3 p.
|
artikel
|
| 58 |
Evaluation of interposed gold wire leads for TC bonded external hybrid IC connections
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 59 |
Failure analysis of contaminated gold-plated connector contacts from operating communication equipment
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 60 |
Failure and overheating of aluminum-wired twist-on connections
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 61 |
Forming feedthroughs in laser-drilled holes in semiconductor wafers by double-sided sputtering
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 62 |
Gate arrays for VLSI design
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 63 |
Generation-recombination noise in p-type silicon
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 64 |
GIMOS—a nonvolatile MOS memory transistor
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 65 |
Graduate and undergraduate educational methods for microelectronics
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 66 |
Heterogeneous distribution of interstitial oxygen in annealed Czochralski-grown silicon crystals
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 67 |
Heterostructure bipolar transistors and integrated circuits
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 68 |
Improved implementation of search technique to find spanning trees
|
Bansal, V.K.
|
|
1983
|
23 |
1 |
p. 141-147
7 p.
|
artikel
|
| 69 |
Independent test laboratories for LSI test services
|
|
|
1983
|
23 |
1 |
p. 192-193
2 p.
|
artikel
|
| 70 |
Industry-compatible applications for visible laser energy in semiconductor production
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 71 |
Influence variables in the precision thick-film technology
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 72 |
In-situ testability design (ISTD)—a new approach for testing high-speed LSI/VLSI logic
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 73 |
Integrated injection logic—a review of its status and prospects
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 74 |
Interval reliability of a two-unit stand-by redundant system
|
Kapur, P.K.
|
|
1983
|
23 |
1 |
p. 167-168
2 p.
|
artikel
|
| 75 |
Investment analysis of introducing standby or redundancy into a production system
|
Kochar, Inderpal Singh
|
|
1983
|
23 |
1 |
p. 175-178
4 p.
|
artikel
|
| 76 |
Laser-enhanced chemical etching of solid surfaces
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 77 |
Laser processing in silicon microelectronics technology
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 78 |
Life of magnetic electroless Co-P thin films
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 79 |
LSI chip for monochrome TV steals the show from multiple ICs
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 80 |
Maximum likelihood estimation of parameters of several continuous and discrete failure distributions
|
Govil, K.K.
|
|
1983
|
23 |
1 |
p. 169-171
3 p.
|
artikel
|
| 81 |
Measurement of minority carrier lifetime in GaAs and GaAs 1−x P x with an intensity-modulated electron beam
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 82 |
Microwave device transient-power failure mechanisms yield to computer analysis
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 83 |
Minority carrier injection and extraction in neutron bombarded germanium
|
|
|
1983
|
23 |
1 |
p. 195-
1 p.
|
artikel
|
| 84 |
Model for transient and permanent error-detection and fault-isolation coverage
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 85 |
Modification of semiconductor device characteristics by lasers
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 86 |
Modularizing, minimizing, and interpreting the K&H fault-tree
|
|
|
1983
|
23 |
1 |
p. 189-190
2 p.
|
artikel
|
| 87 |
Moments in terms of the mean residual life function
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 88 |
Moments of N-unit redundant systems with time dependent failure rates
|
Dhillon, Balbir S.
|
|
1983
|
23 |
1 |
p. 61-69
9 p.
|
artikel
|
| 89 |
MOS networks and fault-tolerant sequential machines
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 90 |
MVU estimators for some multivariate normal probability models: An application to stress-strength models
|
Singh, N.
|
|
1983
|
23 |
1 |
p. 5-10
6 p.
|
artikel
|
| 91 |
Observations of electron and hole transport through thin SiO2 films
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 92 |
On hardware/software trade-offs in computer system design
|
Srivastava, Sanjaya
|
|
1983
|
23 |
1 |
p. 133-136
4 p.
|
artikel
|
| 93 |
On the reliability of biconnected networks
|
Khalil, Z.
|
|
1983
|
23 |
1 |
p. 71-78
8 p.
|
artikel
|
| 94 |
Operational readiness of a complex redundant system with waiting and environmental effects
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 95 |
Optimal inventory problem of a repairable K-out-of-N:G system
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 96 |
2-out-of-n:F intermittently-used system
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 97 |
Packaging and assembly: the 1982 semiconductor technology forecast
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 98 |
Palladium alloy as a plating alternative for hybrid micro-electronic packages
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 99 |
Parts control and reliability assurance of RF hybrids
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 100 |
Pentagon moves to expand VHSIC
|
|
|
1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 101 |
Pitfalls to avoid in maintability testing
|
|
|
1983
|
23 |
1 |
p. 190-191
2 p.
|
artikel
|
| 102 |
Practical availability analysis of standby systems
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 103 |
Prediction limits for the last failure time of a (log) normal sample from early failures
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 104 |
Prediction of nonrelevant failures
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 105 |
Production techniques with S.O. packages
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 106 |
Properties of Mn-doped p-type In x Ga 1−x As y P 1−y grown by liquid-phase epitaxy
|
|
|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 107 |
Publications, notices, calls for papers, etc.
|
|
|
1983
|
23 |
1 |
p. 1-3
3 p.
|
artikel
|
| 108 |
Reliability analysis and investment decision in electric motors for irrigation
|
Kochar, Inderpal Singh
|
|
1983
|
23 |
1 |
p. 173-174
2 p.
|
artikel
|
| 109 |
Reliability growth models for hardware and software systems based on nonhomogeneous Poisson processes: A survey
|
Yamada, Shigeru
|
|
1983
|
23 |
1 |
p. 91-112
22 p.
|
artikel
|
| 110 |
Reliability indices for topological design of computer communication networks
|
|
|
1983
|
23 |
1 |
p. 191-192
2 p.
|
artikel
|
| 111 |
Reliability, maintainability and cost-effectiveness: A bibliographical note
|
Lau, H.T.
|
|
1983
|
23 |
1 |
p. 21-40
20 p.
|
artikel
|
| 112 |
Reliability of a class of telephone switching systems
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 113 |
Reliability study of a digital radio
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 114 |
Repairable-system models
|
|
|
1983
|
23 |
1 |
p. 191-
1 p.
|
artikel
|
| 115 |
Role of reliability and accelerated testing in VHSIC technology
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 116 |
Satellite travelling wave tubes reliability controls
|
|
|
1983
|
23 |
1 |
p. 187-
1 p.
|
artikel
|
| 117 |
Short-channel MOSFETs fabricated using cw Nd: YAG laser annealing of As-implanted source and drain
|
|
|
1983
|
23 |
1 |
p. 199-
1 p.
|
artikel
|
| 118 |
Silicon crystal growing needs vs. equipment
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 119 |
Some UMP invariant tests for comparing two exponential and two gamma populations
|
Singh, N.
|
|
1983
|
23 |
1 |
p. 11-20
10 p.
|
artikel
|
| 120 |
(S−1, S) Spare-part inventory policy for fleet maintenance
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 121 |
Statistical analysis of noisy and incomplete failure data
|
|
|
1983
|
23 |
1 |
p. 189-
1 p.
|
artikel
|
| 122 |
Stochastic behavior of a 2-unit standby redundant system with imperfect switchover and preventive maintenance
|
Mahmoud, M.I.
|
|
1983
|
23 |
1 |
p. 153-156
4 p.
|
artikel
|
| 123 |
Surface topography of printed wiring boards and its effect on flashover
|
|
|
1983
|
23 |
1 |
p. 188-
1 p.
|
artikel
|
| 124 |
Switch failure in a two-unit standby redundant system
|
Gupta, S.M.
|
|
1983
|
23 |
1 |
p. 129-132
4 p.
|
artikel
|
| 125 |
The application of GaAlAs lasers to high-resolution liquidcrystal projection displays
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 126 |
The effect of preventive maintenance to a standby system with two types of failures
|
Mahmoud, M.I.
|
|
1983
|
23 |
1 |
p. 149-152
4 p.
|
artikel
|
| 127 |
The effects of package integrity on DIP reliability
|
|
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1983
|
23 |
1 |
p. 187-188
2 p.
|
artikel
|
| 128 |
The growth of semi-insulating gallium arsenide by the LEC process
|
|
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1983
|
23 |
1 |
p. 193-
1 p.
|
artikel
|
| 129 |
The practical aspects of restarting a high reliability hybrid line
|
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|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 130 |
The reliability bathtub curve is vigorously alive
|
|
|
1983
|
23 |
1 |
p. 187-
1 p.
|
artikel
|
| 131 |
Thermally induced defect behaviour and effective intrinsic gettering sink in silicon wafers
|
|
|
1983
|
23 |
1 |
p. 195-196
2 p.
|
artikel
|
| 132 |
The SSTC integrated circuit facility
|
|
|
1983
|
23 |
1 |
p. 194-
1 p.
|
artikel
|
| 133 |
The use of backscatter electron imaging in inspection and evaluation of thick film circuitry
|
|
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1983
|
23 |
1 |
p. 196-197
2 p.
|
artikel
|
| 134 |
The use of high magnetic fields for characterization of impurities in epitaxial GaAs
|
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|
1983
|
23 |
1 |
p. 196-
1 p.
|
artikel
|
| 135 |
Thick film composition reproducibility and its impact on yields
|
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1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 136 |
Thin-film systems for hybrid circuits—produced by plasmatron atomizers
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|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 137 |
Time-resolved optical transmission during pulsed-laser annealing of ion-implanted amorphous silicon-on-sapphire
|
|
|
1983
|
23 |
1 |
p. 197-198
2 p.
|
artikel
|
| 138 |
TMI rare event? Lessons to be learned
|
|
|
1983
|
23 |
1 |
p. 190-
1 p.
|
artikel
|
| 139 |
UK RAF approach to reliability and maintainability
|
|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 140 |
Ultrafast high-resolution contact lithography with excimer lasers
|
|
|
1983
|
23 |
1 |
p. 198-
1 p.
|
artikel
|
| 141 |
Use of scanning electron microscopy to solve thick film manufacturing problems
|
|
|
1983
|
23 |
1 |
p. 197-
1 p.
|
artikel
|
| 142 |
U.S. vs Asia-Pacific semiconductor manufacturing in the 1980s
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|
|
1983
|
23 |
1 |
p. 192-
1 p.
|
artikel
|
| 143 |
Wafer flatness testing
|
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|
1983
|
23 |
1 |
p. 193-
1 p.
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artikel
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