| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Accelerated ageing of IMPATT diodes
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 2 |
A computer algorithm for optimal maintenance of standby redundant systems
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 3 |
A computer algorithm for the analysis of maintained standby redundant systems
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 4 |
A data information system for RIW contracts
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 5 |
Advanced process technology for VLSI circuits
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 6 |
A dynamic bias system for burn-in or thermal endurance treatments of 8085A microprocessors
|
Shaw, R.N
|
|
1982
|
22 |
1 |
p. 117-130
14 p.
|
artikel
|
| 7 |
Analysis of a repairable redundant system with delayed replacement
|
|
|
1982
|
22 |
1 |
p. 138-139
2 p.
|
artikel
|
| 8 |
Analytical approach to hot electron transport in small size Mosfet's
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 9 |
A new method for lifetime prediction of electronic devices
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 10 |
An inspection policy for one-unit system subject to revealed and unrevealed failures
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 11 |
An integrated FM receiver
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 12 |
A numerical analysis of avalanche breakdown in short-channel MOSFETs
|
|
|
1982
|
22 |
1 |
p. 131-132
2 p.
|
artikel
|
| 13 |
A rational approach to stress screening vibration
|
|
|
1982
|
22 |
1 |
p. 137-138
2 p.
|
artikel
|
| 14 |
A repairable multistate device with arbitrarily distributed repair times
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 15 |
A repairable system with N failure modes and K standby units
|
Yamashiro, Mitsuo
|
|
1982
|
22 |
1 |
p. 53-57
5 p.
|
artikel
|
| 16 |
A repairable system with N failure modes and one standby unit
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 17 |
A repairable system with partial and catastrophic failure modes
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 18 |
A review of fine-line lithographic techniques: present and future
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 19 |
Author index
|
|
|
1982
|
22 |
1 |
p. viii-
1 p.
|
artikel
|
| 20 |
Availability of a two-unit standby system with switchover time and proper initialization of connect switching
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 21 |
Average conductivity of complementary-error and Gaussian doped layers in Gallium arsenide
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 22 |
Benefit analysis of concurrent redundancy techniques
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 23 |
Bipolar circuit design for a 5000-circuit VLSI gate array
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 24 |
Britain takes the lead on hybrid components
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 25 |
Carrier mobility in laser-annealed silicon-on-sapphire films
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 26 |
Checking request policies for a one-unit system and their comparisons
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 27 |
CMOS integrated circuit reliability
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 28 |
CMOS reliability: a useful case history to revise extrapolation effectiveness, length and slope of the learning curve
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 29 |
Combined hardware and software availability
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 30 |
Computer-communication network reliability: trends and issues
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 31 |
Configuring computer suites for system performance, reliability, and availability—a systems approach
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 32 |
Contracting for life cycle cost to improve system affordability
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 33 |
Cost-risk procedures for weapon system risk analysis
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 34 |
Cyclotron resonance at Na+-doped Si-Si02 interfaces
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 35 |
Delay regulation—a circuit solution to the power/performance tradeoff
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 36 |
Design trade-offs in availability warranties
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 37 |
Diamond structure versus Wurtzite structure for silicon
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 38 |
Digital signal processing hits stride with 64-bit correlator IC
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 39 |
Dry etching technology for fine line devices
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 40 |
Early implementation/Measurement of testability
|
|
|
1982
|
22 |
1 |
p. 133-134
2 p.
|
artikel
|
| 41 |
E-beam machines paired with optics pare wafer costs
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 42 |
Editorial Board
|
|
|
1982
|
22 |
1 |
p. ii-
1 p.
|
artikel
|
| 43 |
Effect of the model uniform product liability act in quality assurance
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 44 |
Electrical testing for process evaluations
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 45 |
Electro-optical properties of doped anthracene films
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 46 |
Epitaxial layer blocks unwanted charge in MOS RAMs
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 47 |
Errors in life prediction due to temperature inaccuracies
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 48 |
Expected repair cost under doubly stochastic damage processes
|
Sherif, Yosef S
|
|
1982
|
22 |
1 |
p. 9-13
5 p.
|
artikel
|
| 49 |
Experimental characterization of MOST's scaled down to the 1μm level
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 50 |
Fabrication technologies for GaAs monolithic circuits
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 51 |
Field effect transistor automatic microwave characterization
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 52 |
Field effect transistor microwave characterization: noise figure, gain, power measurements on microwave bench
|
|
|
1982
|
22 |
1 |
p. 131-
1 p.
|
artikel
|
| 53 |
GaAs Hall devices produced by local ion implantation
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 54 |
Gallium arsenide metal field effect transistor reliability study
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 55 |
GIDEP can improve productivity through information exchange
|
|
|
1982
|
22 |
1 |
p. 131-
1 p.
|
artikel
|
| 56 |
Hard and soft failures in dynamic RAM fault tolerant memories
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 57 |
Hardware approach for generating spanning trees in reliability studies
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 58 |
Hardware vs software reliability—a comparative study
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 59 |
IBM system designs from scratch
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 60 |
Improved reliability for new satellite systems
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 61 |
Increased productivity through planned screens
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 62 |
Interpretation of non-equilibrium measurements on MOS devices using the linear voltage ramp technique
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 63 |
Investigation of the molecular processes controlling corrosion failure mechanisms in plastic encapsulated semiconductor devices
|
|
|
1982
|
22 |
1 |
p. 131-
1 p.
|
artikel
|
| 64 |
Joint logistics commanders (JLC) software workshop
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 65 |
Laser crystallization of amorphoussilicium thin-films
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 66 |
Lasers automate pc-board inspection
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 67 |
LCC versus confidence testing during long-term storage
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 68 |
Low-resistance, long-life contacts by laser-annealing of silverimplanted p-type PbTe
|
|
|
1982
|
22 |
1 |
p. 142-143
2 p.
|
artikel
|
| 69 |
LSI chips shrink synchro-to-digital converter hybrids
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 70 |
Maintenance improvement policy to optimise system availability
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 71 |
Microelectronic test structures for characterizing fine-line lithography
|
|
|
1982
|
22 |
1 |
p. 140-141
2 p.
|
artikel
|
| 72 |
Modelling of submicrometer gate field effect transistors
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 73 |
Modelling the repairability function by the first passage time distribution of Brownian motion
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 74 |
Modified SEM depicts operation of dense chips
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 75 |
Multi-state homogeneous Markov models in reliability analysis
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 76 |
Network reliability evaluation: application of bathtub failure rate curve
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 77 |
Network reliability evaluation of three-state devices using transformation technique
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 78 |
New process boosts current levels of monolithic voltage regulator
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 79 |
On anomalous drift mobility results in a-silicon alloys
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 80 |
On human reliability trends in digitial communication systems
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 81 |
On trends in automatic testing of analog circuits
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 82 |
Optimal age-policy with imperfect preventive maintenance
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 83 |
Optimal maintenance of a two-unit standby redundant system with a generalized cost structure
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 84 |
Optimal maintenance schedules of systems subject to stochastic failure
|
Sherif, Yosef S
|
|
1982
|
22 |
1 |
p. 15-29
15 p.
|
artikel
|
| 85 |
Optimum planned maintenance policies with lead time
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 86 |
Optimum preventive maintenance policies for a 2-unit redundant system with repair and post-repair
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 87 |
Optimum time-domain design of system reliability
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 88 |
Oxygen and carbon in Czochralski-grown silicon
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 89 |
Polymer-monomer conversion in anthracene thin films as a switching and memory device
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 90 |
Portable tester learns boards to simplify service
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 91 |
Power gallium arsenide metal field effect transistor: design and technology
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 92 |
Progress in electronic systems reliability
|
|
|
1982
|
22 |
1 |
p. 135-
1 p.
|
artikel
|
| 93 |
Projection lithography with high numerical aperture optics
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 94 |
Quenched-in-deep levels in boron-doped silicon
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 95 |
RADC oracle
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 96 |
Raman scattering from amorphous zones in neutron irradiated silicon
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 97 |
R and M test data collection and management
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 98 |
Readiness analyses for a remotely deployed naval weapon system
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 99 |
Recoverable ionic contaminant induced failures on n-channel memory products
|
|
|
1982
|
22 |
1 |
p. 132-
1 p.
|
artikel
|
| 100 |
Reliability analysis : Optimal inspection and maintenance schedules of failing systems
|
Sherif, Yosef S
|
|
1982
|
22 |
1 |
p. 59-115
57 p.
|
artikel
|
| 101 |
Reliability education in India—Present and future
|
|
|
1982
|
22 |
1 |
p. 139-
1 p.
|
artikel
|
| 102 |
Reliability evaluation in computer-communication networks
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 103 |
Reliability modelling of TMR computer systems with repair and common mode failures
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 104 |
Reliability of a stand-by system with common-cause failures and scheduled maintenance
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 105 |
Reliability optimization of a surveillance radar
|
|
|
1982
|
22 |
1 |
p. 135-
1 p.
|
artikel
|
| 106 |
Reliability theory for multistate systems with multistate components
|
Hudson, Joseph C
|
|
1982
|
22 |
1 |
p. 1-7
7 p.
|
artikel
|
| 107 |
Scanning electron beam probes VLSI chips
|
|
|
1982
|
22 |
1 |
p. 143-
1 p.
|
artikel
|
| 108 |
Sequence test method for reliability evaluation of semiconductor devices
|
|
|
1982
|
22 |
1 |
p. 132-133
2 p.
|
artikel
|
| 109 |
s -Expected number of repairs from online, standby and frequency of failures of a 1-server 2-unit warm standby system
|
Gopalan, M.N
|
|
1982
|
22 |
1 |
p. 43-51
9 p.
|
artikel
|
| 110 |
Software reliability of programs with network structure
|
|
|
1982
|
22 |
1 |
p. 138-
1 p.
|
artikel
|
| 111 |
Soldering without shorts—joints are auto ND tested
|
|
|
1982
|
22 |
1 |
p. 131-
1 p.
|
artikel
|
| 112 |
Some reliability routing problems in an acyclic directed network with stochastic terminal node
|
Kumar, Santosh
|
|
1982
|
22 |
1 |
p. 31-41
11 p.
|
artikel
|
| 113 |
Statistics of breakdown
|
|
|
1982
|
22 |
1 |
p. 136-
1 p.
|
artikel
|
| 114 |
Stepping into the 80's with die-by-die alignment
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 115 |
Stress dependence of electron-hole liquid parameters in silicon
|
|
|
1982
|
22 |
1 |
p. 141-
1 p.
|
artikel
|
| 116 |
System effectiveness evaluation using star and delta transformations
|
|
|
1982
|
22 |
1 |
p. 135-136
2 p.
|
artikel
|
| 117 |
System-reliability effort at the Indian Space Research Organisation
|
|
|
1982
|
22 |
1 |
p. 139-140
2 p.
|
artikel
|
| 118 |
Techniques for improving engineering productivity of VLSI designs
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 119 |
The cost of test system requirements
|
|
|
1982
|
22 |
1 |
p. 135-
1 p.
|
artikel
|
| 120 |
The failure rate function estimated from parameter drift measurements
|
|
|
1982
|
22 |
1 |
p. 137-
1 p.
|
artikel
|
| 121 |
The influence of mobile ions on the Si/SiO2 interface traps
|
|
|
1982
|
22 |
1 |
p. 142-
1 p.
|
artikel
|
| 122 |
The new look in reliability—it works
|
|
|
1982
|
22 |
1 |
p. 135-
1 p.
|
artikel
|
| 123 |
Time-compressing reliability investigations of integrated circuits
|
|
|
1982
|
22 |
1 |
p. 133-
1 p.
|
artikel
|
| 124 |
Time variable failure rate prediction
|
|
|
1982
|
22 |
1 |
p. 135-
1 p.
|
artikel
|
| 125 |
Two original methods for the vapor phase epitaxial growth of GaInAs and GaInAsP compounds
|
|
|
1982
|
22 |
1 |
p. 141-142
2 p.
|
artikel
|
| 126 |
Unified field (failure) theory—demise of the bathtub curve
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
| 127 |
U.S. IC gear makers build in Japan
|
|
|
1982
|
22 |
1 |
p. 140-
1 p.
|
artikel
|
| 128 |
Weibull distribution vs “Weibull process”
|
|
|
1982
|
22 |
1 |
p. 134-
1 p.
|
artikel
|
Tijdschrift beschrijving