| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
An inspection policy for one-unit system subject to revealed and unrevealed failures
|
Adachi, Kouichi
|
|
1981
|
21 |
1 |
p. 51-62
12 p.
|
artikel
|
| 2 |
A repairable system with partial and catastrophic failure modes
|
Yamashiro, Mitsuo
|
|
1981
|
21 |
1 |
p. 97-101
5 p.
|
artikel
|
| 3 |
Author index
|
|
|
1981
|
21 |
1 |
p. vi-
1 p.
|
artikel
|
| 4 |
Availability of a two-unit standby system with switchover time and proper initialization of connect switching
|
Kumar, Ashok
|
|
1981
|
21 |
1 |
p. 113-115
3 p.
|
artikel
|
| 5 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1981
|
21 |
1 |
p. 1-3
3 p.
|
artikel
|
| 6 |
CMOS integrated circuit reliability
|
Schnable, George L.
|
|
1981
|
21 |
1 |
p. 33-50
18 p.
|
artikel
|
| 7 |
Computer-communication network reliability: Trends and issues
|
Soi, Inder M.
|
|
1981
|
21 |
1 |
p. 79-95
17 p.
|
artikel
|
| 8 |
Editorial Board
|
|
|
1981
|
21 |
1 |
p. IFC-
1 p.
|
artikel
|
| 9 |
Investigation of the molecular processes controlling corrosion failure mechanisms in plastic encapsulated semiconductor devices
|
Lum, R.M.
|
|
1981
|
21 |
1 |
p. 15-31
17 p.
|
artikel
|
| 10 |
Micro-electronics - processing and device design
|
G.W.A.D,
|
|
1981
|
21 |
1 |
p. 11-
1 p.
|
artikel
|
| 11 |
Network reliability evaluation: Application of bathtub failure rate curve
|
Dhillon, Balbir S.
|
|
1981
|
21 |
1 |
p. 103-111
9 p.
|
artikel
|
| 12 |
Optimal maintenance of a two-unit standby redundant system with a generalized cost structure
|
Kumar, Ashok
|
|
1981
|
21 |
1 |
p. 117-120
4 p.
|
artikel
|
| 13 |
Printed circuit boards for microelectronics (second edition)
|
Manfield, H.G.
|
|
1981
|
21 |
1 |
p. 12-13
2 p.
|
artikel
|
| 14 |
Publications, notices, calls for papers, etc.
|
|
|
1981
|
21 |
1 |
p. 5-10
6 p.
|
artikel
|
| 15 |
Quality technology handbook third edition
|
G.W.A.D,
|
|
1981
|
21 |
1 |
p. 11-12
2 p.
|
artikel
|
| 16 |
Recoverable ionic contaminant induced failures on n-channel memory products
|
Hemmert, R.S.
|
|
1981
|
21 |
1 |
p. 63-77
15 p.
|
artikel
|
| 17 |
World abstract on microelectronics and reliability
|
|
|
1981
|
21 |
1 |
p. 121-142
22 p.
|
artikel
|
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