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                             70 results found
no title author magazine year volume issue page(s) type
1 Advances in microminiaturization 1963
 2 2 p. 158-
1 p.
 article
2 Analysis of random failures 1963
 2 2 p. 156-
1 p.
 article
3 A new method of bonding metals to thermoplastics 1963
 2 2 p. 158-
1 p.
 article
4 A review of government-sponsored microminiaturization work in the United Kingdom 1963
 2 2 p. 158-
1 p.
 article
5 Arrays of microphotographs for microelectronic components 1963
 2 2 p. 158-
1 p.
 article
6 A solid circuit multivibrator using a unijunction transistor Ambroziak, A.
 1963
 2 2 p. 133-134
2 p.
 article
7 A status report on equipment reliability—a new approach is indicated 1963
 2 2 p. 156-
1 p.
 article
8 A technique for transient thermal prediction in microminiaturized circuits 1963
 2 2 p. 158-
1 p.
 article
9 A technique for transient thermal prediction in microminiaturized circuits 1963
 2 2 p. 158-
1 p.
 article
10 Characteristic energy losses of electrons in copper, silver and gold 1963
 2 2 p. 159-
1 p.
 article
11 Characteristic values of ultra high frequency diodes and their measurement (Part I) 1963
 2 2 p. 157-
1 p.
 article
12 Design and construction of an automatic transistor testing and sorting machine 1963
 2 2 p. 156-
1 p.
 article
13 Designer's check list for reliable, producible transistor circuits 1963
 2 2 p. 157-
1 p.
 article
14 Designing digital equipment with semiconductor networks 1963
 2 2 p. 159-
1 p.
 article
15 Diameter correction factors for the resistivity measurement of semiconductor slices 1963
 2 2 p. 159-
1 p.
 article
16 Dielectric properties of thin films 1963
 2 2 p. 160-
1 p.
 article
17 Differential amplifier grown in silicon block 1963
 2 2 p. 159-
1 p.
 article
18 Effects of temperature on high-frequency transistors 1963
 2 2 p. 156-
1 p.
 article
19 Electronic engineering in 1973 1963
 2 2 p. 158-
1 p.
 article
20 Epitaxial vapor growth of crystal Ge 1963
 2 2 p. 158-
1 p.
 article
21 Equipment reliability 1963
 2 2 p. 155-
1 p.
 article
22 Evaporated circuits incorporating a thin film transistor 1963
 2 2 p. 159-
1 p.
 article
23 Evaporated integrated microcircuitry for electronic systems Moore, David WM.
 1963
 2 2 p. 129-132
4 p.
 article
24 Fail-safe logic using multi-aperture ferrite cores 1963
 2 2 p. 155-
1 p.
 article
25 Growing oxide crystals 1963
 2 2 p. 159-
1 p.
 article
26 Heterocrystals for microelectronics Long, Donald
 1963
 2 2 p. 107-115
9 p.
 article
27 High-speed micro-energy switching Simmons, C.D.
 1963
 2 2 p. 117-128
12 p.
 article
28 How good are thin-film triodes? 1963
 2 2 p. 160-
1 p.
 article
29 How to measure dynamic characteristics of semiconductors for reliable circuit design 1963
 2 2 p. 157-
1 p.
 article
30 Improving the reliability of digital devices with redundancy: an application of decision theory 1963
 2 2 p. 155-
1 p.
 article
31 Integrated circuits go operational 1963
 2 2 p. 159-
1 p.
 article
32 Junction diodes made on plastically deformed germanium 1963
 2 2 p. 159-
1 p.
 article
33 Long-term component analysis utilizing short-term materials and design studies 1963
 2 2 p. 156-
1 p.
 article
34 Measurement of semiconductor component parts in manufacture 1963
 2 2 p. 156-
1 p.
 article
35 Microelectronics, Part II 1963
 2 2 p. 158-
1 p.
 article
36 Microminiaturization 1963
 2 2 p. 158-
1 p.
 article
37 Miniaturisation techniques in pocket radio receivers 1963
 2 2 p. 158-
1 p.
 article
38 On models for reliability prediction 1963
 2 2 p. 155-
1 p.
 article
39 On standby redundancy scheme achieving maximum reliability 1963
 2 2 p. 157-
1 p.
 article
40 On the preparation of high purity gallium arsenide 1963
 2 2 p. 159-
1 p.
 article
41 Operational reliability of the Athena computer 1963
 2 2 p. 155-
1 p.
 article
42 Packaging and interconnecting integrated networks 1963
 2 2 p. 159-
1 p.
 article
43 Printed circuits and microelectronics 1963
 2 2 p. 158-
1 p.
 article
44 Progressive stress—a new accelerated approach to voltage endurance 1963
 2 2 p. 156-
1 p.
 article
45 Properties of the tunnel diode (in C.W. circuits) 1963
 2 2 p. 157-
1 p.
 article
46 Proposed formation of microintegrated circuits 1963
 2 2 p. 158-
1 p.
 article
47 Putting a servo amplifier on a small silicon wafer 1963
 2 2 p. 159-
1 p.
 article
48 Reactions with dip-soldering of printed circuits 1963
 2 2 p. 156-
1 p.
 article
49 Redundancy and switching failure 1963
 2 2 p. 156-
1 p.
 article
50 Reliability aspects of an experimental data processing system 1963
 2 2 p. 155-
1 p.
 article
51 Reliability bibliography 1963
 2 2 p. 135-153
19 p.
 article
52 Reliability considerations in the application of power transistors to consumer products 1963
 2 2 p. 157-
1 p.
 article
53 Reliability in direct coupled transistor logic 1963
 2 2 p. 157-
1 p.
 article
54 Reliable electron beam welded micro-connections Garibotti, D.J.
 1963
 2 2 p. 81-88
8 p.
 article
55 Reliable networks from unreliable components 1963
 2 2 p. 157-
1 p.
 article
56 Some considerations of scheduled maintenance 1963
 2 2 p. 157-
1 p.
 article
57 Statistical procedures for circuits-parts selection 1963
 2 2 p. 156-
1 p.
 article
58 Surface wetting and alloying in semiconductor device fabrication (Part I) 1963
 2 2 p. 159-
1 p.
 article
59 Tantalum thin film microcircuits—Fabrication techniques and component characteristics STAFF,
 1963
 2 2 p. 99-104
6 p.
 article
60 Techniques in the demonstration of reliability attainment 1963
 2 2 p. 156-
1 p.
 article
61 Technology of transistor mask fabrication 1963
 2 2 p. 160-
1 p.
 article
62 The Air Force approach to reliability in ballistic missile weapon systems 1963
 2 2 p. 156-
1 p.
 article
63 The electrical protection of semiconductor devices in the light of available data 1963
 2 2 p. 156-
1 p.
 article
64 The reliability and quality control field from its inception to the present 1963
 2 2 p. 155-
1 p.
 article
65 The reliability demands of automatic error-correcting equipment for digital data 1963
 2 2 p. 155-
1 p.
 article
66 Thermistor compensation simplified 1963
 2 2 p. 157-
1 p.
 article
67 The use of triple-modular redundancy to improve computer reliability 1963
 2 2 p. 155-
1 p.
 article
68 Transistor failure modes in high power switching operation 1963
 2 2 p. 157-
1 p.
 article
69 Which road to satellite reliability 1963
 2 2 p. 155-
1 p.
 article
70 Worst case design of variable-threshold TRL circuits 1963
 2 2 p. 157-
1 p.
 article
                             70 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands