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70 gevonden resultaten
nr
titel
auteur
tijdschrift
jaar
jaarg.
afl.
pagina('s)
type
1
Advances in microminiaturization
1963
2
2
p. 158-
1 p.
artikel
2
Analysis of random failures
1963
2
2
p. 156-
1 p.
artikel
3
A new method of bonding metals to thermoplastics
1963
2
2
p. 158-
1 p.
artikel
4
A review of government-sponsored microminiaturization work in the United Kingdom
1963
2
2
p. 158-
1 p.
artikel
5
Arrays of microphotographs for microelectronic components
1963
2
2
p. 158-
1 p.
artikel
6
A solid circuit multivibrator using a unijunction transistor
Ambroziak, A.
1963
2
2
p. 133-134
2 p.
artikel
7
A status report on equipment reliability—a new approach is indicated
1963
2
2
p. 156-
1 p.
artikel
8
A technique for transient thermal prediction in microminiaturized circuits
1963
2
2
p. 158-
1 p.
artikel
9
A technique for transient thermal prediction in microminiaturized circuits
1963
2
2
p. 158-
1 p.
artikel
10
Characteristic energy losses of electrons in copper, silver and gold
1963
2
2
p. 159-
1 p.
artikel
11
Characteristic values of ultra high frequency diodes and their measurement (Part I)
1963
2
2
p. 157-
1 p.
artikel
12
Design and construction of an automatic transistor testing and sorting machine
1963
2
2
p. 156-
1 p.
artikel
13
Designer's check list for reliable, producible transistor circuits
1963
2
2
p. 157-
1 p.
artikel
14
Designing digital equipment with semiconductor networks
1963
2
2
p. 159-
1 p.
artikel
15
Diameter correction factors for the resistivity measurement of semiconductor slices
1963
2
2
p. 159-
1 p.
artikel
16
Dielectric properties of thin films
1963
2
2
p. 160-
1 p.
artikel
17
Differential amplifier grown in silicon block
1963
2
2
p. 159-
1 p.
artikel
18
Effects of temperature on high-frequency transistors
1963
2
2
p. 156-
1 p.
artikel
19
Electronic engineering in 1973
1963
2
2
p. 158-
1 p.
artikel
20
Epitaxial vapor growth of crystal Ge
1963
2
2
p. 158-
1 p.
artikel
21
Equipment reliability
1963
2
2
p. 155-
1 p.
artikel
22
Evaporated circuits incorporating a thin film transistor
1963
2
2
p. 159-
1 p.
artikel
23
Evaporated integrated microcircuitry for electronic systems
Moore, David WM.
1963
2
2
p. 129-132
4 p.
artikel
24
Fail-safe logic using multi-aperture ferrite cores
1963
2
2
p. 155-
1 p.
artikel
25
Growing oxide crystals
1963
2
2
p. 159-
1 p.
artikel
26
Heterocrystals for microelectronics
Long, Donald
1963
2
2
p. 107-115
9 p.
artikel
27
High-speed micro-energy switching
Simmons, C.D.
1963
2
2
p. 117-128
12 p.
artikel
28
How good are thin-film triodes?
1963
2
2
p. 160-
1 p.
artikel
29
How to measure dynamic characteristics of semiconductors for reliable circuit design
1963
2
2
p. 157-
1 p.
artikel
30
Improving the reliability of digital devices with redundancy: an application of decision theory
1963
2
2
p. 155-
1 p.
artikel
31
Integrated circuits go operational
1963
2
2
p. 159-
1 p.
artikel
32
Junction diodes made on plastically deformed germanium
1963
2
2
p. 159-
1 p.
artikel
33
Long-term component analysis utilizing short-term materials and design studies
1963
2
2
p. 156-
1 p.
artikel
34
Measurement of semiconductor component parts in manufacture
1963
2
2
p. 156-
1 p.
artikel
35
Microelectronics, Part II
1963
2
2
p. 158-
1 p.
artikel
36
Microminiaturization
1963
2
2
p. 158-
1 p.
artikel
37
Miniaturisation techniques in pocket radio receivers
1963
2
2
p. 158-
1 p.
artikel
38
On models for reliability prediction
1963
2
2
p. 155-
1 p.
artikel
39
On standby redundancy scheme achieving maximum reliability
1963
2
2
p. 157-
1 p.
artikel
40
On the preparation of high purity gallium arsenide
1963
2
2
p. 159-
1 p.
artikel
41
Operational reliability of the Athena computer
1963
2
2
p. 155-
1 p.
artikel
42
Packaging and interconnecting integrated networks
1963
2
2
p. 159-
1 p.
artikel
43
Printed circuits and microelectronics
1963
2
2
p. 158-
1 p.
artikel
44
Progressive stress—a new accelerated approach to voltage endurance
1963
2
2
p. 156-
1 p.
artikel
45
Properties of the tunnel diode (in C.W. circuits)
1963
2
2
p. 157-
1 p.
artikel
46
Proposed formation of microintegrated circuits
1963
2
2
p. 158-
1 p.
artikel
47
Putting a servo amplifier on a small silicon wafer
1963
2
2
p. 159-
1 p.
artikel
48
Reactions with dip-soldering of printed circuits
1963
2
2
p. 156-
1 p.
artikel
49
Redundancy and switching failure
1963
2
2
p. 156-
1 p.
artikel
50
Reliability aspects of an experimental data processing system
1963
2
2
p. 155-
1 p.
artikel
51
Reliability bibliography
1963
2
2
p. 135-153
19 p.
artikel
52
Reliability considerations in the application of power transistors to consumer products
1963
2
2
p. 157-
1 p.
artikel
53
Reliability in direct coupled transistor logic
1963
2
2
p. 157-
1 p.
artikel
54
Reliable electron beam welded micro-connections
Garibotti, D.J.
1963
2
2
p. 81-88
8 p.
artikel
55
Reliable networks from unreliable components
1963
2
2
p. 157-
1 p.
artikel
56
Some considerations of scheduled maintenance
1963
2
2
p. 157-
1 p.
artikel
57
Statistical procedures for circuits-parts selection
1963
2
2
p. 156-
1 p.
artikel
58
Surface wetting and alloying in semiconductor device fabrication (Part I)
1963
2
2
p. 159-
1 p.
artikel
59
Tantalum thin film microcircuits—Fabrication techniques and component characteristics
STAFF,
1963
2
2
p. 99-104
6 p.
artikel
60
Techniques in the demonstration of reliability attainment
1963
2
2
p. 156-
1 p.
artikel
61
Technology of transistor mask fabrication
1963
2
2
p. 160-
1 p.
artikel
62
The Air Force approach to reliability in ballistic missile weapon systems
1963
2
2
p. 156-
1 p.
artikel
63
The electrical protection of semiconductor devices in the light of available data
1963
2
2
p. 156-
1 p.
artikel
64
The reliability and quality control field from its inception to the present
1963
2
2
p. 155-
1 p.
artikel
65
The reliability demands of automatic error-correcting equipment for digital data
1963
2
2
p. 155-
1 p.
artikel
66
Thermistor compensation simplified
1963
2
2
p. 157-
1 p.
artikel
67
The use of triple-modular redundancy to improve computer reliability
1963
2
2
p. 155-
1 p.
artikel
68
Transistor failure modes in high power switching operation
1963
2
2
p. 157-
1 p.
artikel
69
Which road to satellite reliability
1963
2
2
p. 155-
1 p.
artikel
70
Worst case design of variable-threshold TRL circuits
1963
2
2
p. 157-
1 p.
artikel
70 gevonden resultaten
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