nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Addendum
|
Nieuwhof, G.W.E. |
|
1979 |
19 |
1-2 |
p. 161-168 8 p. |
artikel |
2 |
A design review approach toward dynamic RAM reliability
|
Roberts, J.A. |
|
1979 |
19 |
1-2 |
p. 97-105 9 p. |
artikel |
3 |
A low cost reliability test specification
|
de Corlieu, Jacques |
|
1979 |
19 |
1-2 |
p. 11-14 4 p. |
artikel |
4 |
A new ERA in reliability
|
Balke, Nicholas |
|
1979 |
19 |
1-2 |
p. iii- 1 p. |
artikel |
5 |
Availability of k-out-of-m:G repairable system with non-identical elements
|
Gadani, J.P. |
|
1979 |
19 |
1-2 |
p. 65-71 7 p. |
artikel |
6 |
Behavioral prediction of materials degradation in load-bearing structures
|
Hay, D.Robert |
|
1979 |
19 |
1-2 |
p. 127-132 6 p. |
artikel |
7 |
Biographies
|
|
|
1979 |
19 |
1-2 |
p. 151-160 10 p. |
artikel |
8 |
Component replacement and the use of Relcode
|
Hastings, N.A.J. |
|
1979 |
19 |
1-2 |
p. 49-56 8 p. |
artikel |
9 |
CP-140 aircraft reliability program — A “tailored” management approach
|
Steiner, R.F. |
|
1979 |
19 |
1-2 |
p. 133-139 7 p. |
artikel |
10 |
Editorial Board
|
|
|
1979 |
19 |
1-2 |
p. IFC- 1 p. |
artikel |
11 |
Empirical studies of software validation
|
Howden, William E. |
|
1979 |
19 |
1-2 |
p. 39-47 9 p. |
artikel |
12 |
Management of satellite systems reliability program
|
Behmann, François |
|
1979 |
19 |
1-2 |
p. 15-21 7 p. |
artikel |
13 |
Management of total reliability
|
Puri, S.C. |
|
1979 |
19 |
1-2 |
p. 7-10 4 p. |
artikel |
14 |
Manual backup operations: Some behavioral aspects of human reliability
|
Abo El-Ela, Maged A. |
|
1979 |
19 |
1-2 |
p. 141-149 9 p. |
artikel |
15 |
MOS semiconductor random access memory failure rate
|
Arsenault, J.E. |
|
1979 |
19 |
1-2 |
p. 81-88 8 p. |
artikel |
16 |
On fault trees and other reliability evaluation methods
|
Dhillon, Balbir S. |
|
1979 |
19 |
1-2 |
p. 57-63 7 p. |
artikel |
17 |
Reliability and maintainability growth of a modern, high performance aircraft, the F-14A
|
Bigel, Gary |
|
1979 |
19 |
1-2 |
p. 31-38 8 p. |
artikel |
18 |
Reliability assessment of small signal GaAs FETs
|
Behmann, François |
|
1979 |
19 |
1-2 |
p. 107-115 9 p. |
artikel |
19 |
Reliability based quality (RBQ) technique for evaluating the degradation of reliability during manufacturing
|
Neri, Lewis |
|
1979 |
19 |
1-2 |
p. 117-126 10 p. |
artikel |
20 |
Reliability learning model: Application to color TV
|
Imai, J. |
|
1979 |
19 |
1-2 |
p. 73-80 8 p. |
artikel |
21 |
Selling reliability engineering to the company
|
Darch, M.B. |
|
1979 |
19 |
1-2 |
p. 1-5 5 p. |
artikel |
22 |
The 1978 Canadian SRE Reliability Symposium Committee
|
|
|
1979 |
19 |
1-2 |
p. v- 1 p. |
artikel |
23 |
The logistics of life cycle cost
|
Peronnet, John R. |
|
1979 |
19 |
1-2 |
p. 23-30 8 p. |
artikel |
24 |
The need for feedback of field RAM data
|
Gillis, A.R. |
|
1979 |
19 |
1-2 |
p. 89-95 7 p. |
artikel |