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                             105 results found
no title author magazine year volume issue page(s) type
1 A Bayesian note on reliability growth during a development testing program 1978
17 5 p. 486-
1 p.
article
2 A direct method to calculate the frequency and duration of failures for large networks 1978
17 5 p. 486-
1 p.
article
3 A high speed ECL multiplexer in beam lead, hybrid technology 1978
17 5 p. 487-488
2 p.
article
4 Alloy element additions to gold thick film conductors: Effects on indium/lead soldering and ultrasonic aluminum wire bonding 1978
17 5 p. 493-
1 p.
article
5 Alloy scattering and high field transport in ternary and quaternary III–V semiconductors 1978
17 5 p. 491-
1 p.
article
6 A method for estimating the reliability of ICs 1978
17 5 p. 483-
1 p.
article
7 A method of automatic centering of chips, masks and semiconductor wafers 1978
17 5 p. 487-
1 p.
article
8 Amorphous semiconducting silicon-hydrogen alloys 1978
17 5 p. 488-
1 p.
article
9 A new concept in calculation of thick film resistors 1978
17 5 p. 493-
1 p.
article
10 An experimental application of microprocessors to railway signalling 1978
17 5 p. 489-
1 p.
article
11 An optimum procedure for component testing in the demonstration of series system reliability 1978
17 5 p. 483-
1 p.
article
12 A recursive algorithm for bounding network reliability 1978
17 5 p. 486-
1 p.
article
13 A survey of published information on universal logic arrays 1978
17 5 p. 489-
1 p.
article
14 A unified availability analysis method for sysstems containing design errors 1978
17 5 p. 486-
1 p.
article
15 A 4-unit redundant system with common-cause failures 1978
17 5 p. 484-
1 p.
article
16 Behaviour of a two correlated units redundant system with many types of failure Itoi, Takashi
1978
17 5 p. 517-522
6 p.
article
17 Bibliography of literature on fault trees Dhillon, Balbir S.
1978
17 5 p. 501-503
3 p.
article
18 Biomedical applications of microprocessors 1978
17 5 p. 488-
1 p.
article
19 16-bit wave gathering speed 1978
17 5 p. 489-
1 p.
article
20 Calculation of hot electron phenomena 1978
17 5 p. 492-
1 p.
article
21 Calendar of international conferences, symposia, lectures and meetings of interest 1978
17 5 p. 469-472
4 p.
article
22 Carrier distributions function in semiconductors 1978
17 5 p. 492-
1 p.
article
23 CCD memory circuits of highest packing density—technological and electrical improvements 1978
17 5 p. 487-
1 p.
article
24 Characterization of thick film capicitors 1978
17 5 p. 493-
1 p.
article
25 Comments on “Experimental evidence against the shell model of bound multiexciton complexes in silicon” 1978
17 5 p. 490-
1 p.
article
26 Communications chip interfaces with most microprocessors 1978
17 5 p. 489-
1 p.
article
27 Complete ranking of reliability-related distributions 1978
17 5 p. 484-
1 p.
article
28 Courses International Society for Hybrid Microelectronics 1978
17 5 p. 477-
1 p.
article
29 dc voltage effects on saw device interdigital electrodes 1978
17 5 p. 484-
1 p.
article
30 Decision tools for use by management Ryerson, C.M.
1978
17 5 p. 527-542
16 p.
article
31 Dedicated LSI chips aim at communications 1978
17 5 p. 489-
1 p.
article
32 Density variation in the strain-confined electron-hole liquid in Ge 1978
17 5 p. 492-493
2 p.
article
33 Derivation of fault-detection tests using Boolean matrices 1978
17 5 p. 485-
1 p.
article
34 Design of a pattern on a photomask-like physical standard for evaluation and calibration of linewidth-measuring systems 1978
17 5 p. 487-
1 p.
article
35 Digital testing oscilloscope cushions against mounting costs of troubleshooting 1978
17 5 p. 483-
1 p.
article
36 Duration of hidden faults in randomly checked systems 1978
17 5 p. 486-
1 p.
article
37 Dynamic decision elements for 3-unit systems 1978
17 5 p. 486-
1 p.
article
38 Economics of thick and thin film hybrid production in Europe 1978
17 5 p. 493-
1 p.
article
39 Efficient evaluation of system reliability by Monte Carlo method 1978
17 5 p. 486-
1 p.
article
40 Electrical characteristics of sputtering-induced defects in n-type silicon 1978
17 5 p. 490-
1 p.
article
41 Electronic system thermal design for reliability 1978
17 5 p. 483-
1 p.
article
42 Electron transport and ionization in silicon at high fields 1978
17 5 p. 490-491
2 p.
article
43 Estimation of reliability after corrective action 1978
17 5 p. 484-
1 p.
article
44 Evolving microprocessors which better meet the needs of automotive electronics 1978
17 5 p. 488-
1 p.
article
45 Experimental and theoretical determination of hot electron distribution in GaAs and related mixed crystals 1978
17 5 p. 492-
1 p.
article
46 Experimental aspects of hot electron distribution functions 1978
17 5 p. 491-492
2 p.
article
47 Far-infrared absorption by excitons in silicon 1978
17 5 p. 492-
1 p.
article
48 Far infrared emission from hot electrons in Si-inversion layers 1978
17 5 p. 491-
1 p.
article
49 FETs move up in power and frequency 1978
17 5 p. 489-
1 p.
article
50 Grade-of-service and service quality concepts in public telephone exchanges 1978
17 5 p. 485-
1 p.
article
51 High field electronic properties of SiO2 1978
17 5 p. 491-
1 p.
article
52 Hot electron and magneto-transport properties of In 1−x Ga x P 1−y As y liquid phase epitaxial films 1978
17 5 p. 491-
1 p.
article
53 Hot-electron relaxation effects in devices 1978
17 5 p. 492-
1 p.
article
54 Hot electron transport effects in field effect transistors 1978
17 5 p. 492-
1 p.
article
55 IEEE Standard 488 and microprocessor synergism 1978
17 5 p. 488-
1 p.
article
56 Increasing the functional speed of positive photoresist 1978
17 5 p. 488-
1 p.
article
57 Integrated circuit process and design rule evaluation techniques 1978
17 5 p. 487-
1 p.
article
58 Investigation of metalization failures of glass sealed ceramic dual in line integrated circuits 1978
17 5 p. 484-
1 p.
article
59 Japan Fact Book 1978 (Guide to Japan's Electronics Manufacturers and Industry) G.W.A.D.,
1978
17 5 p. 495-
1 p.
article
60 Life characteristics of plastic encapsulated semiconductor devices Reich, Bernard
1978
17 5 p. 513-515
3 p.
article
61 L.S.I. CMOS applications 1978
17 5 p. 487-
1 p.
article
62 Maintenance strategies for PCM circuit switching 1978
17 5 p. 485-
1 p.
article
63 Majority and similarity voting in analogue redundant systems 1978
17 5 p. 484-
1 p.
article
64 Microcomputer applications in telephony 1978
17 5 p. 490-
1 p.
article
65 Microcomputers, miracle or myth? 1978
17 5 p. 486-487
2 p.
article
66 Microprocessors heed the call to supervise I/O 1978
17 5 p. 489-
1 p.
article
67 Microprocessors in consumer products 1978
17 5 p. 488-
1 p.
article
68 Microprocessors in instrumentation 1978
17 5 p. 488-
1 p.
article
69 Microprocessors in telecommunication systems 1978
17 5 p. 490-
1 p.
article
70 Microprogramming a minicomputer for fast signal processing 1978
17 5 p. 489-
1 p.
article
71 Molybdenum-gate RAM is designed for high speed 1978
17 5 p. 489-
1 p.
article
72 Monte Carlo comparisons of parameter estimators of the 2-parameter Weibull distribution 1978
17 5 p. 484-
1 p.
article
73 Multiprocessor systems 1978
17 5 p. 489-
1 p.
article
74 Noise and diffusion of hot holes in Si 1978
17 5 p. 491-
1 p.
article
75 Noise of hot carriers in the channel of n silicon junction gate field effect transistors 1978
17 5 p. 491-
1 p.
article
76 Optimal ordering and replacement for a 1-unit system 1978
17 5 p. 485-
1 p.
article
77 Optimization of system reliability by sequential weight increasing factor technique 1978
17 5 p. 486-
1 p.
article
78 Phosphorus concentration in low temperature vapor deposited oxide 1978
17 5 p. 487-
1 p.
article
79 Physical and thermodynamic properties of silane 1978
17 5 p. 487-
1 p.
article
80 Physical phenomena in an ideal MOS structure 1978
17 5 p. 488-
1 p.
article
81 Product liability: A mechanical design for liability prevention 1978
17 5 p. 485-486
2 p.
article
82 Publications, notices, calls for papers, etc. 1978
17 5 p. 473-476
4 p.
article
83 Recent patents on microelectronics 1978
17 5 p. 479-482
4 p.
article
84 Reliability analysis of an m n system with inspections 1978
17 5 p. 485-
1 p.
article
85 Reliability analysis of logic circuits 1978
17 5 p. 485-
1 p.
article
86 Reliability engineering in microelectronics Jowett, C.E.
1978
17 5 p. 505-512
8 p.
article
87 Reliability model and analysis of a system with non-exponential down-time distrubitions including a derated state 1978
17 5 p. 485-
1 p.
article
88 Reliability of power supplies 1978
17 5 p. 484-
1 p.
article
89 Reliability of several standby-priority-redundant systems 1978
17 5 p. 484-485
2 p.
article
90 Repair limit suspension policies for a two-unit standby redundant system with two phase repairs 1978
17 5 p. 485-
1 p.
article
91 Review of some microwave integrated circuit components utilizing microstrip techniques 1978
17 5 p. 488-489
2 p.
article
92 Screening results of JAN transitors and diodes used in military and aerospace programmes 1978
17 5 p. 484-
1 p.
article
93 Significance of GaAs solubility in GaAl Alloys in multilayer LPE of Al x Ga 1−x As 1978
17 5 p. 490-
1 p.
article
94 Staggered testing of electronic systems revisited Schneeweiss, Winfrid G.
1978
17 5 p. 523-526
4 p.
article
95 Stationary model of the chemical vapour deposition of homoepitaxial silicon layers 1978
17 5 p. 490-
1 p.
article
96 Surface and bulk charge transport in a buried-layer MOS structure 1978
17 5 p. 492-
1 p.
article
97 Take the guesswork out of thick microstrip 1978
17 5 p. 489-
1 p.
article
98 The band structure dependence of impact ionization by hot carriers in semiconductors: GaAs 1978
17 5 p. 490-
1 p.
article
99 The 1977 Canadian SRE reliability symposium: Keynote address Hall, C.D.
1978
17 5 p. 497-500
4 p.
article
100 The effect of integration steps and manufacturing improvements on the mean life of semiconductor circuits 1978
17 5 p. 483-484
2 p.
article
101 Theory of the mobility of electrons limited by charged impurities in two dimensions 1978
17 5 p. 490-
1 p.
article
102 The reliability, testing and evaluation of hybrid microcircuits 1978
17 5 p. 493-
1 p.
article
103 The study of microcircuits by transmission electron microscopy 1978
17 5 p. 489-
1 p.
article
104 Variational wave functions for the biexciton in polar semiconductors 1978
17 5 p. 491-
1 p.
article
105 What happens to semiconductors in a nuclear environment 1978
17 5 p. 483-
1 p.
article
                             105 results found
 
 Koninklijke Bibliotheek - National Library of the Netherlands