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                             137 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A basic distributed microcomputer control system 1978
17 3 p. 357-
1 p.
artikel
2 Absolute dosimetry of ion implanted impurities using a calorimetric method 1978
17 3 p. 364-
1 p.
artikel
3 A case history: procurement of quality plastic encapsulated semiconductors 1978
17 3 p. 351-
1 p.
artikel
4 Accurate two-port models for distributed-RC notch filters Kumar, Umesh
1978
17 3 p. 393-397
5 p.
artikel
5 A cold standby redundant system with delayed switchover and preventive maintenance 1978
17 3 p. 352-
1 p.
artikel
6 A heuristic method for determining optimal reliability allocation 1978
17 3 p. 353-
1 p.
artikel
7 A kinetic study of the incorporation of impurities during the epitaxial growth of silicon 1978
17 3 p. 358-
1 p.
artikel
8 A magnetic bubble condensed time-slot interchanging gate 1978
17 3 p. 357-
1 p.
artikel
9 A microelectronic active band-pass filter 1978
17 3 p. 357-
1 p.
artikel
10 Analysis of the merged charge memory (MCM) cell 1978
17 3 p. 355-
1 p.
artikel
11 An application of optimal control theory to repairman problem with machine interference 1978
17 3 p. 354-
1 p.
artikel
12 An electron beam gun with a multi-crucible for evaporation in UHV and its characteristics 1978
17 3 p. 364-
1 p.
artikel
13 A new generation of large hybrid modules—SLM 1978
17 3 p. 362-
1 p.
artikel
14 A new method for recognition of defects in electronic devices 1978
17 3 p. 354-
1 p.
artikel
15 A new short channel MOSFET structure (UMOST) 1978
17 3 p. 356-
1 p.
artikel
16 An investigation of software reliability models 1978
17 3 p. 354-
1 p.
artikel
17 An optical scanning system for semiconductor junction examination Singmin, A.
1978
17 3 p. 399-402
4 p.
artikel
18 A novel FET frequency discriminator 1978
17 3 p. 357-
1 p.
artikel
19 Arsenic-doped polycrystalline silicon film for bipolar integrated circuits 1978
17 3 p. 358-
1 p.
artikel
20 Assessment of silicone encapsulants for hybrid integrated circuits (HIC) 1978
17 3 p. 362-
1 p.
artikel
21 A system for an automatic detection of defects of semiconductor masks and printed circuit boards 1978
17 3 p. 352-
1 p.
artikel
22 Automatic electronic component failure-rate prediction with MIL-HDBK-217B 1978
17 3 p. 351-
1 p.
artikel
23 Big bubble chips point the way to low-cost memories 1978
17 3 p. 356-
1 p.
artikel
24 Calendar of international conferences, symposia, lectures and meetings of interest 1978
17 3 p. 333-335
3 p.
artikel
25 C-MOS converters resolve 12 bits 1978
17 3 p. 356-
1 p.
artikel
26 C-MOS gets a rise out of LSI 1978
17 3 p. 358-
1 p.
artikel
27 Combining diagnosis and emulation yields fast fault-finding 1978
17 3 p. 352-
1 p.
artikel
28 Conduction phenomena in Nb-Nb2O5-Au thin film structures fabricated by various techniques 1978
17 3 p. 363-
1 p.
artikel
29 Conduction studies in silicon nitride; dark currents and photocurrents 1978
17 3 p. 361-
1 p.
artikel
30 Conference report Jacobs, Richard M
1978
17 3 p. 343-350
8 p.
artikel
31 Cost-optimised burn-in duration for repairable electronic systems 1978
17 3 p. 353-
1 p.
artikel
32 Crossover chips for hybrid-integrated film circuits 1978
17 3 p. 363-
1 p.
artikel
33 Design and investigation of PCB receptacles for direct plugging of thin-film hybrid circuits 1978
17 3 p. 362-
1 p.
artikel
34 Design method for thick film resistors 1978
17 3 p. 362-
1 p.
artikel
35 Design of self-checking and fault tolerant microprogrammed controllers 1978
17 3 p. 352-
1 p.
artikel
36 Determination of the mass-anistropy exciton splitting in silicon 1978
17 3 p. 359-
1 p.
artikel
37 Determining component reliability and redundancy for optimum system reliability 1978
17 3 p. 353-
1 p.
artikel
38 Dielectric anomaly in amorphous Si 100−x Au x system 1978
17 3 p. 360-
1 p.
artikel
39 Drift of the breakdown voltage in p-n junctions in silicon (walk-out) 1978
17 3 p. 352-
1 p.
artikel
40 Dynamic testing of control systems 1978
17 3 p. 356-357
2 p.
artikel
41 EBIC—a valuable tool for semiconductor evaluation and failure analysis 1978
17 3 p. 352-
1 p.
artikel
42 Effect of heat treatment on electron traps in n-type GaAs 1978
17 3 p. 360-
1 p.
artikel
43 Effect of human error on the availability of periodically inspected redundant systems 1978
17 3 p. 351-
1 p.
artikel
44 Effects of burn-in and temperature cycling on the corrosion resistance of plastic encapsulated integrated circuits 1978
17 3 p. 351-
1 p.
artikel
45 Efficient construction of minimal cut sets from fault trees 1978
17 3 p. 354-
1 p.
artikel
46 Electrical properties of thin films—dielectrics. Deposition methods of dielectric films and their electrical properties 1978
17 3 p. 363-
1 p.
artikel
47 Electroforming, switching and memory effects in oxide thin films 1978
17 3 p. 361-362
2 p.
artikel
48 Electrolytic oxidation of semiconductor surfaces 1978
17 3 p. 361-
1 p.
artikel
49 Electron beam scans 2-μm patterns directly on Japanese wafer 1978
17 3 p. 363-364
2 p.
artikel
50 Electronic behaviours of the gap states in amorphous semiconductors 1978
17 3 p. 360-
1 p.
artikel
51 Etude des processus de depot du silicium en phase gazeuse 1978
17 3 p. 361-
1 p.
artikel
52 Even-parity acceptor excited states in Si from bound exciton two hole transitions 1978
17 3 p. 359-360
2 p.
artikel
53 Evolution of surface-states density of Si/Wet thermal SiO2 interface during bias-temperature treatment 1978
17 3 p. 358-
1 p.
artikel
54 Experimental studies of switching in metal semi-insulating n-p silicon devices 1978
17 3 p. 359-
1 p.
artikel
55 Failure analysis techniques applied in resolving hybrid microcircuit reliability problems 1978
17 3 p. 363-
1 p.
artikel
56 Ferromagnetic interaction between spins in amorphous Si-Ge films 1978
17 3 p. 360-
1 p.
artikel
57 Flex-mount polishing of silicon wafers 1978
17 3 p. 356-
1 p.
artikel
58 1/f noise measurements in ion-implanted silicon resistors as a function of the substrate reverse bias voltage 1978
17 3 p. 364-
1 p.
artikel
59 1/f noise voltage in a thin film structure 1978
17 3 p. 363-
1 p.
artikel
60 Functional decomposition on multi-microprocessor systems 1978
17 3 p. 357-
1 p.
artikel
61 Functional modelling of floating substrate MOS structures 1978
17 3 p. 355-
1 p.
artikel
62 G-R noise and microscopic defects in irradiated junction field effect transistors 1978
17 3 p. 359-
1 p.
artikel
63 Humidity threshold variations for dendrite growth on hybrid substrates 1978
17 3 p. 362-
1 p.
artikel
64 Hybrid interconnection of I.C.'s by means of patterns on flexible tape 1978
17 3 p. 363-
1 p.
artikel
65 Hydrogen sensitive MOS structures 1978
17 3 p. 351-
1 p.
artikel
66 IEDM heralds breakthroughs in LSI fabrication, power discretes 1978
17 3 p. 355-
1 p.
artikel
67 Impurity bands in semiconductors in arbitrary magnetic fields 1978
17 3 p. 361-
1 p.
artikel
68 Indication of the presence of acceptor states around the Fermi level of amorphous silicon 1978
17 3 p. 361-
1 p.
artikel
69 Integrated circuit testing 1978
17 3 p. 352-
1 p.
artikel
70 Integrated injection logic using non-optimized processes 1978
17 3 p. 355-356
2 p.
artikel
71 Interval reliability and optimum preventive maintenance policy 1978
17 3 p. 354-
1 p.
artikel
72 Logic-simulator programs set pace of computer-aided design 1978
17 3 p. 358-
1 p.
artikel
73 Mackintosh Yearbook of West European electronics data 1978 G.W.A.D.,
1978
17 3 p. 366-
1 p.
artikel
74 Markov processes for reliability analyses of large systems 1978
17 3 p. 352-
1 p.
artikel
75 Measurement and interpretation of phosphorus concentration in phosphosilicate glass passivation layers 1978
17 3 p. 359-
1 p.
artikel
76 Memory-oriented designs maximise throughout 1978
17 3 p. 358-
1 p.
artikel
77 Metastable impurity bands: conduction in Si 1−x Co x and Si 1−x Ni x alloy films 1978
17 3 p. 361-
1 p.
artikel
78 Microprocessor device reliability Hnatek, Eugene R.
1978
17 3 p. 379-385
7 p.
artikel
79 Minimum cost systems with specified reliability 1978
17 3 p. 353-
1 p.
artikel
80 New materials for low cost thick film circuits 1978
17 3 p. 362-
1 p.
artikel
81 New MOS processes set speed, density records 1978
17 3 p. 358-
1 p.
artikel
82 Non-equilibrium response of MOS devices to a linear voltage ramp—1. Bulk discrete traps 1978
17 3 p. 360-
1 p.
artikel
83 NT2000 coin telephone using microprocessor techniques 1978
17 3 p. 357-
1 p.
artikel
84 Nucleation of electron-hole drops in Si 1978
17 3 p. 360-
1 p.
artikel
85 Numerical solution of the one-dimensional phenomenological transport equation set in semiconductors 1978
17 3 p. 358-
1 p.
artikel
86 OHMIC contacts to low-resistivity ZnS: preparation, noise properties and nature of contact resistance 1978
17 3 p. 359-
1 p.
artikel
87 On the nature of photoelectric fatigue in semiconductors 1978
17 3 p. 361-
1 p.
artikel
88 On the performance of CCD channel filters for telephone systems 1978
17 3 p. 357-
1 p.
artikel
89 Optical emission end-point detecting for monitoring oxygen plasma photoresist stripping 1978
17 3 p. 356-
1 p.
artikel
90 Optimal design of a series-parallel system with time-dependent reliability 1978
17 3 p. 354-
1 p.
artikel
91 Optimization techniques for system reliability with redundancy—a review 1978
17 3 p. 353-
1 p.
artikel
92 Optimum demonstration tests with grouped inspection data from an exponential distribution 1978
17 3 p. 352-
1 p.
artikel
93 Optimum preventive maintenance policies for repairable systems 1978
17 3 p. 353-
1 p.
artikel
94 Photoelectric scanning of wafer inhomogeneities 1978
17 3 p. 356-
1 p.
artikel
95 Photo-excitation of electrons from ionized silver acceptors in silicon 1978
17 3 p. 360-
1 p.
artikel
96 Photoionization of acceptors in uniaxially stressed germanium 1978
17 3 p. 358-
1 p.
artikel
97 Potential and field distribution in high resistivity microresistors and halltrons for MOS integrated circuits 1978
17 3 p. 356-
1 p.
artikel
98 Pragmatic software reliability prediction 1978
17 3 p. 354-
1 p.
artikel
99 Preloading compliant bonding tape with beam-lead integrated circuits 1978
17 3 p. 356-
1 p.
artikel
100 Preparation of highly photoconductive amorphous silicon by rf sputtering 1978
17 3 p. 361-
1 p.
artikel
101 Publications, notices, calls for papers, etc. 1978
17 3 p. 337-341
5 p.
artikel
102 Quality assurance in the manufacture of multi-pole connectors 1978
17 3 p. 351-
1 p.
artikel
103 Quantized feedback takes its place in analog-to-digital conversion 1978
17 3 p. 358-
1 p.
artikel
104 Raising yield and throughput in front-end wafer processing 1978
17 3 p. 356-
1 p.
artikel
105 Redundant systems with appreciable exchange time 1978
17 3 p. 353-354
2 p.
artikel
106 Relationship between disk diameter, chip surface, degree of integration, efficiency and quota of cost in LSI circuits 1978
17 3 p. 357-
1 p.
artikel
107 Reliability optimization in telephone switching systems design 1978
17 3 p. 352-
1 p.
artikel
108 Reliability reporting guide G.W.A.D.,
1978
17 3 p. 365-366
2 p.
artikel
109 Reliability testing and screening: A general review paper Ryerson, C.M.
1978
17 3 p. 367-377
11 p.
artikel
110 Resistor stability and power dissipation 1978
17 3 p. 362-
1 p.
artikel
111 Safe opening area for bipolar transistors 1978
17 3 p. 357-
1 p.
artikel
112 Selected bibliography on integrated injection logic (I2L)/merged transistor logic (MTL) technology 1978
17 3 p. 355-
1 p.
artikel
113 Single crystal silicon photocells for terrestrial use: state of the art and future prospects 1978
17 3 p. 360-
1 p.
artikel
114 Some graphical methods for maintenance planning 1978
17 3 p. 355-
1 p.
artikel
115 Some theoretical bases of error analysis in analogue circuits 1978
17 3 p. 354-
1 p.
artikel
116 System 250—a fault-tolerant, modular processing system for control applications 1978
17 3 p. 353-
1 p.
artikel
117 Techniques for servicing LSI-based gear evolve 1978
17 3 p. 353-
1 p.
artikel
118 The CCDs future takes on a bright hue 1978
17 3 p. 355-
1 p.
artikel
119 The confidence in reliability predictions 1978
17 3 p. 354-
1 p.
artikel
120 The dependence of CCD dark current upon power dissipation Mavor, J.
1978
17 3 p. 403-404
2 p.
artikel
121 The development of the voltage-to-current transactor (VCT) 1978
17 3 p. 357-
1 p.
artikel
122 The dopant density and temperature dependence of electron mobility and resistivity in n-type silicon 1978
17 3 p. 361-
1 p.
artikel
123 The effect of low-temperature annealing upon the structure and electrical characteristics of rectifying nickel-silicon contacts 1978
17 3 p. 361-
1 p.
artikel
124 The highest and lowest reliability achievable with redundancy 1978
17 3 p. 353-
1 p.
artikel
125 The implications of microprocessor architecture on speed, programming and memory size 1978
17 3 p. 356-
1 p.
artikel
126 The influence of surface recombination on some properties of semiconductor devices—steady-state relationships 1978
17 3 p. 359-
1 p.
artikel
127 The lateral diffusion of boron in polycrystalline silicon and its influence on the fabrication of sub-micron MOSTs 1978
17 3 p. 359-
1 p.
artikel
128 The method of stages for non-Markov models 1978
17 3 p. 354-
1 p.
artikel
129 The neutral vacancy in silicon and diamond: generalized valence bond studies 1978
17 3 p. 362-
1 p.
artikel
130 The particulate matter in semiconductor chemicals 1978
17 3 p. 356-
1 p.
artikel
131 The present state, future and possibilities or application of the principles of magnetic bubble memories 1978
17 3 p. 355-
1 p.
artikel
132 Thermal fatigue failure of soft-soldered contacts to silicon power transistors 1978
17 3 p. 351-352
2 p.
artikel
133 Thermionic-field emission through silicon Schottky barriers at room temperature 1978
17 3 p. 360-
1 p.
artikel
134 Thickness dependent effects of thermal ageing in thin conductive films 1978
17 3 p. 363-
1 p.
artikel
135 Thirty LED pointer-display rigfet chip 1978
17 3 p. 357-358
2 p.
artikel
136 US Army Panama field test of plastic encapsulated devices Hakim, Edward B.
1978
17 3 p. 387-392
6 p.
artikel
137 V-groove MOS (VMOS) enhancement lead logic 1978
17 3 p. 355-
1 p.
artikel
                             137 gevonden resultaten
 
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