| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
A comparison of the performance of plastic and ceramic encapsulations based on evaluation of CMOS integrated circuits
|
Fox, M.J.
|
|
1977
|
16 |
3 |
p. 251-254
4 p.
|
artikel
|
| 2 |
Adsorption of H2S, H2O and O2 on Si(111) surfaces
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 3 |
Al2O3 as a radiation-tolerant CMOS dielectric
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 4 |
A manufacturing reliability program for xerographic copying machines
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 5 |
A modification to fault tree “AND” gate
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 6 |
A new model for bound multiexciton complexes
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 7 |
A new type of galvanomagnetic effect for hot electrons in many-valley semiconductors
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 8 |
An improved approach to locating pinhole defects in MOS and bipolar integrated circuits using liquid crystals
|
|
|
1977
|
16 |
3 |
p. 208-209
2 p.
|
artikel
|
| 9 |
Application of aluminium oxide to integrated circuits fabrication
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 10 |
A program to predict the resistance of trimmed film resistors
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 11 |
Assessment of the oxide-semiconductor interface in CCDs
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 12 |
A study of parasitic MOS formation mechanism in plastic encapsulated MOS devices
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 13 |
Automatic detection of semiconductor mask defects
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 14 |
Availability analysis of a repairable system with non-repairable standby units
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 15 |
Beware of the general-purpose microprocessor
|
|
|
1977
|
16 |
3 |
p. 207-
1 p.
|
artikel
|
| 16 |
Bias influence on corrosion of plastic encapsulated device metal systems
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 17 |
Blowholes and Voids: causes and cures
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 18 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1977
|
16 |
3 |
p. 183-184
2 p.
|
artikel
|
| 19 |
Charge coupled devices—basic operation and principles
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 20 |
Cleanliness and the cleaning of silicon wafers
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 21 |
Computer-aided thermal analysis of a hybrid multistage active bandpass filter/amplifier
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 22 |
Conduction Processes in thick film resistors. Part I
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 23 |
Conduction processes in thick film resistors. Part II
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 24 |
Contribution to the study of the vicinal surfaces of GaAs application to homoepitaxy
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 25 |
Control of the encapsulation material as an aid to long term reliability in plastic encapsulated semiconductor components (PEDs)
|
Harrison, JC
|
|
1977
|
16 |
3 |
p. 233-244
12 p.
|
artikel
|
| 26 |
Cost effective testing techniques for LSI components
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 27 |
Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 28 |
Defective design: toward a better standard
|
|
|
1977
|
16 |
3 |
p. 207-
1 p.
|
artikel
|
| 29 |
Density of states of impurity bands in semiconductors
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 30 |
Design and manufacture of modern mechanical vacuum pumps
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 31 |
Design considerations for flush circuits
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 32 |
Design for Reliability
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 33 |
Doping, Schottky barrier and p-n junction formation in amorphous germanium and silicon by rf sputtering
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 34 |
Effect of a thin transition layer at a Si-SiO2 interface on electron mobility and energy levels
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 35 |
Effect of heat treatment on n-type bulk grown and vapour phase epitaxial indium phosphide
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 36 |
Effects of varying base and collector doping on high current behaviour in bipolar epitaxial transistors
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 37 |
Electric potential and field in surface-channel charge-coupled devices
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 38 |
Electronic inventions 1745–1976
|
Manfield, H.G.
|
|
1977
|
16 |
3 |
p. 223-
1 p.
|
artikel
|
| 39 |
Electron states in quartz (SiO2)
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 40 |
Evaluation of thick film conductors
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 41 |
Evidence for correlated hopping in impurity conduction at moderate impurity concentrations
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 42 |
Excited states of donor bound excitons and bound multiexciton complexes in silicon
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 43 |
Experiences in making original photomasks with micron-size features on the ANR 4 Automatic Nine-Barrel Repeater of VEB Carl Zeiss JENA. (Part 1)
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 44 |
Explosive instabilities in electron-hole drops under microwave radiation
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 45 |
Fabrication of thin film Cu2S/CdS solar cells by a novel evaporation technique
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 46 |
Factors contributing to the corrosion of the aluminium metal on semiconductor devices packaged in plastics
|
|
|
1977
|
16 |
3 |
p. 207-
1 p.
|
artikel
|
| 47 |
Failure mechanism of solid tantalum capacitors
|
|
|
1977
|
16 |
3 |
p. 207-
1 p.
|
artikel
|
| 48 |
Failure modes of beam-lead semiconductors in thin-film hybrid microcircuits
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 49 |
Finding alternating minimum cost path in a directed network using dynamic programming
|
Bansal, S.P.
|
|
1977
|
16 |
3 |
p. 231-232
2 p.
|
artikel
|
| 50 |
Fire retardent printed circuit laminates
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 51 |
Frequency response of bulk traps in the metal-oxide-silicon structure under strong-inversion conditions
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 52 |
Fundamental one-dimensional analysis of transistors
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 53 |
Fusing mechanism of nichrome thin films
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 54 |
Heat treatment of DC-sputtered tin dioxide thin films
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 55 |
Hexadecimal signatures identify trouble spots in microprocessor systems
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 56 |
High efficiency n-Cds/p-InP solar cells prepared by the close-spaced technique
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 57 |
High-voltage damage and low-frequency noise in thick-film resistors
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 58 |
High voltage stable thick film resistors
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 59 |
Influence of discontinuous resistivity distribution in semiconductor wafers on the results of measurements with a four-point probe method
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 60 |
Influence of high temperature processes on properties of high resistivity region of the pin diode
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 61 |
Instability phenomena in thin insulating films on silicon
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 62 |
Interaction between shallow hydrogenic donors: three impurity molecules in semiconductors
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 63 |
Interfacing data converters and microprocessors
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 64 |
Interpretation of far-infrared absorption spectra in germanium
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 65 |
Investigation of deep traps in GaAs by a capacitive method
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 66 |
Investigation of transferred-electron amplifier diodes with a doping notch
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 67 |
Maintenance problems in microwave beam systems
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 68 |
Markov renewal processes with some non-regeneration points and their applications to reliability theory
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 69 |
Maximum reliability route subject to K-improvements in a non-directed network
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 70 |
Mechanical stresses likely to be encountered in the manufacture and use of plastically encapsulated devices
|
Dale, J.R.
|
|
1977
|
16 |
3 |
p. 255-258
4 p.
|
artikel
|
| 71 |
Metal-insulator-metal sandwich structures with anomalous properties
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 72 |
Microelectronic balanced modulator
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 73 |
Microprocessor automated sputtering
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 74 |
Minority carrier recombination in MOS capacitors switched from inversion to accumulation
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 75 |
Nondestructive SEM studies of localised defects in gate dielectric films of MIS devices
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 76 |
Note on a recent Canadian automatic testing symposium
|
|
|
1977
|
16 |
3 |
p. 196-
1 p.
|
artikel
|
| 77 |
On the carrier distribution function in semiconductors in the presence of an external electric field
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 78 |
On the interpretation of noise in thick-film resistors
|
|
|
1977
|
16 |
3 |
p. 219-
1 p.
|
artikel
|
| 79 |
On the mobility of a very pure semiconductor including the low impurity concentration limit
|
|
|
1977
|
16 |
3 |
p. 216-
1 p.
|
artikel
|
| 80 |
On the nonlinearity of the P(V) characteristics of heavily doped semiconductors
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 81 |
On the quantitative analysis of priority-AND failure logic
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 82 |
On the reliability analysis of complex systems
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 83 |
Optimization of system reliability by branch and bound
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 84 |
Ordering policies with two types of lead times
|
Kaio, Naoto
|
|
1977
|
16 |
3 |
p. 225-229
5 p.
|
artikel
|
| 85 |
Photomask/resist capability—an approach to assessment
|
|
|
1977
|
16 |
3 |
p. 213-214
2 p.
|
artikel
|
| 86 |
Piezoresistance in silicon inversion layers
|
|
|
1977
|
16 |
3 |
p. 215-
1 p.
|
artikel
|
| 87 |
Planar magnetron sputtering; a new industrial coating technique
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 88 |
Prediction of future failures of a system
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 89 |
Prevention of bridging failure in mercury switches
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 90 |
Publications, notices, calls for papers, etc.
|
|
|
1977
|
16 |
3 |
p. 185-188
4 p.
|
artikel
|
| 91 |
Quality control and screening in the production of plastic encapsulated semiconductor devices (PEDs)
|
King, G.R.
|
|
1977
|
16 |
3 |
p. 245-249
5 p.
|
artikel
|
| 92 |
Rapid activation energy determination for a reversible failure mechanism in an integrated operational amplifier
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 93 |
Recent patents on microelectronics
|
|
|
1977
|
16 |
3 |
p. 189-191
3 p.
|
artikel
|
| 94 |
Redundancy optimization in general systems
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 95 |
Reliability of a tree network
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 96 |
Reliability of probablistic logic circuits with random inputs
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 97 |
Reliability of thin film conductors and air gap crossovers for hybrid circuits; tests, results and design criteria
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 98 |
Report on a technical meeting, held by the micro joining technical group, Welding Research Institute Cambridge, at 54 Princess Gate, London, S.W.7. on 25.11.76
|
|
|
1977
|
16 |
3 |
p. 193-195
3 p.
|
artikel
|
| 99 |
Rigid-flexible Multilayer Circuit Boards: Three-dimensional printed circuits enable a further miniaturization and increase the reliability
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 100 |
Rubidium lamp stability and reliability for rubidium frequency standard
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 101 |
Rutherford scattering analysis: a tool for semiconductor-device technology
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 102 |
Selenium implantation in GaAs
|
|
|
1977
|
16 |
3 |
p. 220-
1 p.
|
artikel
|
| 103 |
Sensitivity analysis of availability of units in a production/electrical system
|
Basker, B.A.
|
|
1977
|
16 |
3 |
p. 259-271
13 p.
|
artikel
|
| 104 |
Small-signal response of bulk traps in MNOS devices
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 105 |
Spin-on diffusion sources
|
|
|
1977
|
16 |
3 |
p. 212-
1 p.
|
artikel
|
| 106 |
Stability and reliability of indium arsenide Hall Effect devices
|
|
|
1977
|
16 |
3 |
p. 208-
1 p.
|
artikel
|
| 107 |
Stochastic behaviour of two-unit redundant systems which operate at discrete times
|
|
|
1977
|
16 |
3 |
p. 211-
1 p.
|
artikel
|
| 108 |
System characterisation of planar source diffusion
|
|
|
1977
|
16 |
3 |
p. 213-
1 p.
|
artikel
|
| 109 |
Tantalum thin-film RC circuit technology for a universal active filter
|
|
|
1977
|
16 |
3 |
p. 220-
1 p.
|
artikel
|
| 110 |
Tellurium implantation in GaAs
|
|
|
1977
|
16 |
3 |
p. 220-221
2 p.
|
artikel
|
| 111 |
The alignment of graphic images in solid-state technology
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 112 |
The case for multichip LSI packaging of high-reliability military electronics
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 113 |
The design and development of a ring cathode electron gun as an evaporation source
|
|
|
1977
|
16 |
3 |
p. 220-
1 p.
|
artikel
|
| 114 |
The effect of current suppression in the pn− n+ diode of integrated injection logic
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 115 |
The effect of gold and nickel plating thicknesses on the strength and reliability of thermocompression-bonded external leads
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 116 |
The effects of limited spares and scheduled downtime upon the dependability of a simple system
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 117 |
The electrical conductivity of silicon between 500°C and 1200°C
|
|
|
1977
|
16 |
3 |
p. 215-216
2 p.
|
artikel
|
| 118 |
The hybrid integration of a multistage active bandpass filter/amplifier
|
|
|
1977
|
16 |
3 |
p. 218-
1 p.
|
artikel
|
| 119 |
The influence of the charge of dopant atoms on the lattice parameter of GaAs
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 120 |
The oxidation of the GaAs (110) surface
|
|
|
1977
|
16 |
3 |
p. 217-
1 p.
|
artikel
|
| 121 |
The reliability of two-terminal parallel-series networks subject to two kinds of failure
|
|
|
1977
|
16 |
3 |
p. 210-
1 p.
|
artikel
|
| 122 |
Thermal comparison of flip-chip relative to chip-and-wire semiconductor attachment in hybrid circuits: an experimental approach
|
|
|
1977
|
16 |
3 |
p. 220-
1 p.
|
artikel
|
| 123 |
The S-Gun: a direct replacement for the electron beam evaporator
|
|
|
1977
|
16 |
3 |
p. 220-
1 p.
|
artikel
|
| 124 |
The TDA 1050 IC in car radio a.m. receivers
|
|
|
1977
|
16 |
3 |
p. 214-
1 p.
|
artikel
|
| 125 |
Thick film resistor reliability
|
|
|
1977
|
16 |
3 |
p. 209-
1 p.
|
artikel
|
| 126 |
Thin-film microwave integrated circuits
|
|
|
1977
|
16 |
3 |
p. 219-220
2 p.
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artikel
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| 127 |
Thin-film multilayer capacitors using pyrolytically deposited silicon dioxide
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1977
|
16 |
3 |
p. 219-
1 p.
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artikel
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| 128 |
Tracing current by inductive pickup tracks logic faults precisely
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1977
|
16 |
3 |
p. 211-
1 p.
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artikel
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| 129 |
Transition density of states for Si(100) from L1L23V and L23VV Auger spectra
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1977
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16 |
3 |
p. 217-
1 p.
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artikel
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| 130 |
Two dimensional plotting of semiconductor resistivity by scanning electron microscope
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1977
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16 |
3 |
p. 215-
1 p.
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artikel
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| 131 |
TXE4 Maintenance features and philosophy
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1977
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16 |
3 |
p. 211-
1 p.
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artikel
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| 132 |
Useful list of abbreviations commonly used in reliability
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1977
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16 |
3 |
p. 197-206
10 p.
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artikel
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| 133 |
Vacuum evaporation from finite surfaces
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1977
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16 |
3 |
p. 218-
1 p.
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artikel
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