nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A circuit for high-speed carry propagation in I.S.I.-F.E.T. technology
|
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|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
2 |
A comparative evaluation of IC packages in commercial real-time computer terminals
|
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|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
3 |
A data base management (DBMP) program for integrated logistics support (ILS)
|
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|
1976 |
15 |
6 |
p. 524- 1 p. |
artikel |
4 |
Allocation of man-machine reliability
|
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1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
5 |
A microprocessor-controlled mask inspection and repair system
|
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|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
6 |
A modification to fault tree “AND” gate
|
Dhillon, Balbir S. |
|
1976 |
15 |
6 |
p. 625-626 2 p. |
artikel |
7 |
An acceptance-rectification sampling plan for maximising expected monetary return
|
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1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
8 |
Analytical approximations for diffused junctions under high-level conditions
|
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1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
9 |
Analytical solutions for the breakdown voltage of abrupt cylindrical and spherical junctions
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
10 |
A new assurance technology for computer software
|
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1976 |
15 |
6 |
p. 524- 1 p. |
artikel |
11 |
An observation by photoconductivity of strain splitting of shallow bulk donors located near to the surface in silicon MOS devices
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
12 |
A peripheral-oriented microcomputer system
|
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1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
13 |
Application of the direct observation of nuclear reaction to the study of ion implantation
|
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|
1976 |
15 |
6 |
p. 532- 1 p. |
artikel |
14 |
Approximation method for estimating meaningful parameters for a soft-controlled electro-mechanical system
|
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|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
15 |
A projection system for inspecting wafers, integrated circuits and photomasks
|
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|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
16 |
Architecture and applications of a 12-bit CMOS microprocessor
|
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|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
17 |
A simplified cost-oriented control chart for attributes
|
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|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
18 |
A study of the gold acceptor in a silicon p + n junction and an n-type MOS capacitor by thermally stimulated current and capacitance measurements
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
19 |
Automated test methods to check fast analogue-to-digital converters
|
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|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
20 |
Automatic detection of semiconductor mask defects
|
Marcin Wójcik, Zbigniew |
|
1976 |
15 |
6 |
p. 585-593 9 p. |
artikel |
21 |
Availability analysis of a repairable system with non-repairable stand-by units
|
Dhillon, Balbir S. |
|
1976 |
15 |
6 |
p. 561-562 2 p. |
artikel |
22 |
Availability—concepts and definitions
|
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|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
23 |
Aviation supply office FFW/RIW case history, 2. Abex Pump
|
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1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
24 |
Batch bonded crossovers for thin film circuits
|
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1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
25 |
Bayesian limits for the reliability of pass/fail parallel units
|
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1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
26 |
Bayesian reliability assessment from test data
|
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1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
27 |
Bibliography of inductance simulation by active RC methods
|
Dutta Roy, Suhash C. |
|
1976 |
15 |
6 |
p. 637-639 3 p. |
artikel |
28 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
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1976 |
15 |
6 |
p. 503-504 2 p. |
artikel |
29 |
Check list for 4,096—bit RAMs flags potential problems in memory design
|
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1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
30 |
Clinch-river breeder-reactor plant system reliability
|
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|
1976 |
15 |
6 |
p. 521-522 2 p. |
artikel |
31 |
Comments on the hole mass in silicon inversion layers
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
32 |
Common-cause failure considerations in predicting HTGR cooling system reliability
|
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|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
33 |
Computerized system uses laser for functional trimming
|
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|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
34 |
Condemnation rates from failure data
|
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|
1976 |
15 |
6 |
p. 525-526 2 p. |
artikel |
35 |
Conference
|
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|
1976 |
15 |
6 |
p. 515-518 4 p. |
artikel |
36 |
Consideration for effective warranty application
|
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|
1976 |
15 |
6 |
p. 519- 1 p. |
artikel |
37 |
Courses
|
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1976 |
15 |
6 |
p. 505-507 3 p. |
artikel |
38 |
Critical concentration for metallization of doped germanium and silicon
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
39 |
Current gain degradation induced by emitter-base avalanche breakdown in silicon planar transistors
|
Melia, A.J. |
|
1976 |
15 |
6 |
p. 619-623 5 p. |
artikel |
40 |
DIFAR Reliability experience: 781 and Field
|
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|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
41 |
Direct observation of the ground state splitting of the indirect free exciton in silicon
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
42 |
Dynamic I2L random-access memory competes with MOS designs
|
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|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
43 |
Effective reliability planning and implementation
|
|
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1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
44 |
Effects on LCC of test equipment standardization
|
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|
1976 |
15 |
6 |
p. 524- 1 p. |
artikel |
45 |
Estimating the reliability of complex systems
|
|
|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
46 |
Factors contributing to the corrosion of the aluminum metal on semiconductor devices packaged in plastics
|
Olberg, R.C. |
|
1976 |
15 |
6 |
p. 601-611 11 p. |
artikel |
47 |
Far-infrared absorption of large electron-hole drops in stressed Ge
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
48 |
Field-laboratory reliability relationship
|
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|
1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
49 |
Flat TV panels with polycrystalline layers
|
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|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
50 |
Functional modelling of non-volatile MOS memory devices
|
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|
1976 |
15 |
6 |
p. 527-528 2 p. |
artikel |
51 |
Gang lead bonding integrated circuits
|
|
|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
52 |
GIDEP data aids technical problem solving
|
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|
1976 |
15 |
6 |
p. 519- 1 p. |
artikel |
53 |
Government-Industry Data Exchange Program (GIDEP). A source of quality and reliability data
|
|
|
1976 |
15 |
6 |
p. 519- 1 p. |
artikel |
54 |
High-performance microprocessor architectures
|
|
|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
55 |
High reliability parametric amplifier varactor diodes for satellite applications
|
Thomson, I. |
|
1976 |
15 |
6 |
p. 563-574 12 p. |
artikel |
56 |
Hot electron microwave conductivity of wide bandgap semiconductors
|
|
|
1976 |
15 |
6 |
p. 530-531 2 p. |
artikel |
57 |
IC screening. Reliability or ripoff
|
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|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
58 |
ICs replace memory scope for pulse measurements
|
|
|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
59 |
IEEE Project 500—reliability data manual for nuclear power generating stations
|
|
|
1976 |
15 |
6 |
p. 524-525 2 p. |
artikel |
60 |
Important event-tree and fault-tree considerations in the reactor safety study
|
|
|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
61 |
Improved reliability through formal field tests
|
|
|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
62 |
Improved techniques for proximity mask alignment
|
|
|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
63 |
Ion implantation in the field of bipolar integrated circuits and components
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
64 |
Ion implanted MOST technology
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
65 |
Is Ruby ready
|
|
|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
66 |
Legal developments in the field of product safety
|
|
|
1976 |
15 |
6 |
p. 519- 1 p. |
artikel |
67 |
Long term dormant storage testing, initial results
|
|
|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
68 |
Maintainability analysis versus maintenance analysis—interface and discrimination
|
|
|
1976 |
15 |
6 |
p. 524- 1 p. |
artikel |
69 |
Management of electronics equipment reliability
|
|
|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
70 |
Markov renewal processes with some non-regeneration points and their applications to reliability theory
|
Nakagawa, Toshio |
|
1976 |
15 |
6 |
p. 633-636 4 p. |
artikel |
71 |
Maximum free charge in two-phase surface charge-coupled devices
|
|
|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
72 |
Maximum reliability route subject to K-improvements in a non-directed network
|
Bansal, S.P. |
|
1976 |
15 |
6 |
p. 629-632 4 p. |
artikel |
73 |
Measure of the ion-implantation doping uniformity
|
|
|
1976 |
15 |
6 |
p. 531-532 2 p. |
artikel |
74 |
Metal bumps aid semiconductors and hybrid circuit producers
|
|
|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
75 |
Microelectronic balanced modulator
|
Bozic, S.M. |
|
1976 |
15 |
6 |
p. 581-583 3 p. |
artikel |
76 |
NBS program in photomask linewidth measurements
|
|
|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
77 |
Nuclear industry—approach to performance assurance
|
|
|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
78 |
Objectives of nuclear system reliability and safety studies
|
|
|
1976 |
15 |
6 |
p. 520-521 2 p. |
artikel |
79 |
On a cumulative damage model with N different components
|
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|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
80 |
On the new procedure for the determination of surface conditions in thin films with internal layer inhomogeneity
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
81 |
Optimal redundancy allocation for non series-parallel networks
|
|
|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
82 |
Part reliability information management
|
|
|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
83 |
Phosphorus diffusion in gallium arsenide
|
|
|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
84 |
Pitfalls in reliability programme management
|
|
|
1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
85 |
Polarizability of shallow donors in silicon—a reply
|
|
|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
86 |
Polycrystalline silicon solar cells on metallurgical silicon substrates
|
|
|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
87 |
Polyimide supported micro-ramps for high density circuit interconnection
|
|
|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
88 |
Present developments in digital logic design
|
|
|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
89 |
Problems relevant to quality conformance inspection of semiconductor electronic parts
|
|
|
1976 |
15 |
6 |
p. 519-520 2 p. |
artikel |
90 |
Publication, notice, calls for paper, etc.
|
|
|
1976 |
15 |
6 |
p. 509-513 5 p. |
artikel |
91 |
Purity requirements for chemicals in semiconductor processing
|
|
|
1976 |
15 |
6 |
p. 526-527 2 p. |
artikel |
92 |
Qualitative analysis in reliability and safety studies
|
|
|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
93 |
Quantitative evaluation of nuclear system reliability and safety characteristics
|
|
|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
94 |
Rapid activation energy determination for a reversible failure mechanism in an integrated operational amplifier
|
Proctor, G. |
|
1976 |
15 |
6 |
p. 575-579 5 p. |
artikel |
95 |
Reactive sputtering of resistive films
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
96 |
Reliability analysis for simple systems
|
Ferris-Prabhu, A.V. |
|
1976 |
15 |
6 |
p. 555-560 6 p. |
artikel |
97 |
Reliability analysis management
|
|
|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
98 |
Reliability and safety analysis methodology in the nuclear programs of ERDA
|
|
|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
99 |
Reliability contracting for reduced support costs
|
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|
1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
100 |
Reliability demonstration of aerospace devices
|
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|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
101 |
Reliability in the electronics manufacturing phase
|
Jowett, Charles |
|
1976 |
15 |
6 |
p. 595-600 6 p. |
artikel |
102 |
Reliability of a 2-unit priority-standby redundant system with finite repair capability
|
|
|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
103 |
Reliability of a 2-unit standby redundant system with constrained repair time
|
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|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
104 |
Reliability of intermittently used systems
|
|
|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
105 |
Reliability of probabilistic logic circuits with random inputs
|
Aggarwal, K.K. |
|
1976 |
15 |
6 |
p. 627-628 2 p. |
artikel |
106 |
Reliability technology and nuclear power
|
|
|
1976 |
15 |
6 |
p. 521- 1 p. |
artikel |
107 |
Report on reliability design and acquisition management
|
|
|
1976 |
15 |
6 |
p. 525- 1 p. |
artikel |
108 |
Resonant scattering induced transport anomalies in zero-gap semiconductors
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
109 |
Selective optical valley pumping in silicon and germanium
|
|
|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
110 |
Some current academic research in system reliability theory
|
|
|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
111 |
Source evaporant systems for thermal evaporation
|
|
|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
112 |
Spares and systems availability
|
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|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
113 |
Special army requirements for tactical data systems
|
|
|
1976 |
15 |
6 |
p. 523-524 2 p. |
artikel |
114 |
Stochastic behavior of two-unit redundant systems which operate at discrete times
|
Mine, H. |
|
1976 |
15 |
6 |
p. 551-554 4 p. |
artikel |
115 |
Structure of amorphous Ge alloy films
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
116 |
Studies of n-Type GaAs material properties by anodic current behavior
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |
117 |
Synthesis and analysis of a cost-effective, ultrareliable, high speed, semiconductor memory system
|
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|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
118 |
System burn-in for reliability enhancement
|
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|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
119 |
System failure diagnostics using pattern recognition techniques
|
G.W.A.D, |
|
1976 |
15 |
6 |
p. 533- 1 p. |
artikel |
120 |
System reliability estimation from several data sets
|
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|
1976 |
15 |
6 |
p. 526- 1 p. |
artikel |
121 |
Temperature characteristics of MNOS transistors
|
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|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
122 |
The alignment of graphic images in solid-state technology
|
Wójcik, Zbigniew Marcin |
|
1976 |
15 |
6 |
p. 613-618 6 p. |
artikel |
123 |
The assessment of reliability and maintainability from field data—the British Army's methods and experience
|
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|
1976 |
15 |
6 |
p. 523- 1 p. |
artikel |
124 |
The economic implications of unreliability
|
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|
1976 |
15 |
6 |
p. 519- 1 p. |
artikel |
125 |
The field and carrier waves in a semi-infinite semiconductor
|
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|
1976 |
15 |
6 |
p. 528-529 2 p. |
artikel |
126 |
The fT of bipolar transistors with thin lightly doped bases
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
127 |
The interaction of the two-dimensional plasmon with the surface plasmons in an MOS structure
|
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|
1976 |
15 |
6 |
p. 529-530 2 p. |
artikel |
128 |
Theory of iron-group impurities in II–VI compounds
|
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|
1976 |
15 |
6 |
p. 529- 1 p. |
artikel |
129 |
The pay-off of R & M trade-off
|
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|
1976 |
15 |
6 |
p. 522- 1 p. |
artikel |
130 |
The reliability of two-terminal parallel-series networks subject to two kinds of failure
|
Phillips, M.J. |
|
1976 |
15 |
6 |
p. 535-549 15 p. |
artikel |
131 |
The structure of cleaned and polished (100) GaAs surfaces
|
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|
1976 |
15 |
6 |
p. 527- 1 p. |
artikel |
132 |
The use of the scanning electron microscope in the failure analysis of a typical semiconductor device
|
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|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
133 |
Thin-film networks take on discretes
|
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|
1976 |
15 |
6 |
p. 531- 1 p. |
artikel |
134 |
Toshiba markets Japan's first 8-bit microprocessor chip
|
|
|
1976 |
15 |
6 |
p. 528- 1 p. |
artikel |
135 |
Trade-off of thermal cycling vs life cycle costs
|
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|
1976 |
15 |
6 |
p. 524- 1 p. |
artikel |
136 |
Trends in failure survival techniques for avionic systems
|
|
|
1976 |
15 |
6 |
p. 520- 1 p. |
artikel |
137 |
Valley degeneracy of electrons in accumulation and inversion layers on Si(111) surface
|
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|
1976 |
15 |
6 |
p. 530- 1 p. |
artikel |