| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Achieving consistent results with thick-film
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 2 |
A complementary MOS 1.2 V watch circuit using ion implantation
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 3 |
A computerized algorithm for determining the reliability of redundant configurations
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 4 |
A cost-based availability allocation algorithm
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 5 |
Active distributed RC low-pass filters
|
Dutta Roy, S.C.
|
|
1972
|
11 |
3 |
p. 293-295
3 p.
|
artikel
|
| 6 |
A method for the measurement of the turn-on condition in MOS transistors
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 7 |
A multichannel high-speed data acquisition and processing system
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 8 |
Analysis of maintenance man loading via simulation
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 9 |
Analysis of silicon nitride layers deposited from SiH4 and N2 on silicon
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 10 |
A pattern recognition technique for system error analysis
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 11 |
Applications of interested circuit technology to microwave frequencies
|
|
|
1972
|
11 |
3 |
p. 241-242
2 p.
|
artikel
|
| 12 |
Applications of the scanning low energy electron (SLEEP) for MOS device evaluation
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 13 |
A practical approach to reliability
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 254-
1 p.
|
artikel
|
| 14 |
A review of the electrical and optical properties of III–V compound semiconductor films
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 15 |
Automatic wire bonder for external connectors for thin film circuits
|
|
|
1972
|
11 |
3 |
p. 245-246
2 p.
|
artikel
|
| 16 |
A versatile packaging system for hybrids
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 17 |
Beam-lead devices for hybrid integrated circuits
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 18 |
Beam lead technology
|
|
|
1972
|
11 |
3 |
p. 240-241
2 p.
|
artikel
|
| 19 |
Build gated video amplifiers
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 20 |
Bus-connectable TTL adds a new state to binary logic
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 21 |
Calendar of international conferences, symposia, lectures and meetings of interest
|
|
|
1972
|
11 |
3 |
p. 229-230
2 p.
|
artikel
|
| 22 |
Call for papers
|
|
|
1972
|
11 |
3 |
p. 233-
1 p.
|
artikel
|
| 23 |
Capacitives methods of determination of the energy distribution of electron traps in semiconductors
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 24 |
CHAMP: The Cranfield Hybrid Automatic Maintenance Program
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 25 |
Characteristics of the junction-gate field effect transistor with short channel length
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 26 |
Clip-and-read comparator finds IC failures
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 27 |
C/MOS watch kit aims at potential $50 million market
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 28 |
Component value spread and network function tolerances: an optimal design procedure
|
|
|
1972
|
11 |
3 |
p. 237-
1 p.
|
artikel
|
| 29 |
Computerized Testing of thin-film circuit conductors
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 30 |
Conference report 18th Annual Reliability Symposium, U.S.A.
|
Jacobs, Richard M.
|
|
1972
|
11 |
3 |
p. 257-261
5 p.
|
artikel
|
| 31 |
Correlation between the presence of dislocations and vacancies in N-Type gallium arsenide
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 32 |
Courses in microelectronics and reliability
|
|
|
1972
|
11 |
3 |
p. 231-232
2 p.
|
artikel
|
| 33 |
Defects in medical electronics draw heavy fire from hospitals
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 34 |
Design curves for flat square spiral inductors
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 35 |
Determining subminiature lamp life
|
|
|
1972
|
11 |
3 |
p. 235-236
2 p.
|
artikel
|
| 36 |
Development of screenable high dielectric constant ceramic-glass dielectrics
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 37 |
Dynamic bulk negative differential conductivity in semiconductors
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 38 |
Dynamic MOS shift registers can also simulate stack and silo memories
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 39 |
Editorial
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 223-
1 p.
|
artikel
|
| 40 |
Effective surface mobility theory
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 41 |
Effects of deep-level impurities on popcorn-noise in bipolar junction transistors
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 42 |
Effects of the substrate on surface state noise in silicon MOS FET's
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 43 |
Einfluss des abstandes emitter-basiskontakt auf die stromverstärkung bipolarer transistoren
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 44 |
Ellipsometry as applied to the measurement of the thicknesses and indices of oxide films on silicon
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 45 |
Ensuring carrier system reliability
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 46 |
Equivalent circuit for conductivity-temperature characteristics of the PdO/Ag-Pd glaze resistors
|
|
|
1972
|
11 |
3 |
p. 246-247
2 p.
|
artikel
|
| 47 |
Errata
|
|
|
1972
|
11 |
3 |
p. 301-303
3 p.
|
artikel
|
| 48 |
Evaluation of epoxy encapsulants and their levels of contamination
|
|
|
1972
|
11 |
3 |
p. 235-
1 p.
|
artikel
|
| 49 |
Focus on linear ICs
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 50 |
Formation of NiSi and current transport across the NiSi-Si interface
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 51 |
10 GHZ Si Schottky-barrier impatt diode with hyperabrupt impurity distribution produced by ion implantation
|
|
|
1972
|
11 |
3 |
p. 248-249
2 p.
|
artikel
|
| 52 |
How to avoid custom hybrid circuit pitfalls
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 53 |
IC phase meter beats high costs
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 54 |
ICs simplify v.-f. and v.-t. conversions
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 55 |
Influence of excess current carriers drift upon a current-voltage characteristic of the germanium p-n junction diode
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 56 |
Inhomogeneous distribution of free chargecarriers in the space charge region of semiconductors due to the insulating layer
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 57 |
Integrated circuit industry
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 58 |
Interdependence of the electrical properties and the defect structure in heteropitaxial germanium and silicon
|
|
|
1972
|
11 |
3 |
p. 236-237
2 p.
|
artikel
|
| 59 |
Investigation of processes of manufacture and application of dielectric films on the basis of aluminium nitride in MIS transistors
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 60 |
Items of interest
|
|
|
1972
|
11 |
3 |
p. 225-228
4 p.
|
artikel
|
| 61 |
Latent image can provide chips with built-in control memories
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 62 |
Locating and repairing faults in multilayer motherboards
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 63 |
Magnetic sensitivity of a MAGFET of uniform channel current density
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 64 |
Maintenance documentation: a necessary good or a necessary evil?
|
|
|
1972
|
11 |
3 |
p. 238-
1 p.
|
artikel
|
| 65 |
Measurement of electrical properties of sputtered tantalum films at low temperatures
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 66 |
Methods for visual characterization of trimmed thick-film resistors
|
|
|
1972
|
11 |
3 |
p. 247-248
2 p.
|
artikel
|
| 67 |
Models for contacts to planar devices
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 68 |
Modular structured circuits and their fault diagnosis
|
|
|
1972
|
11 |
3 |
p. 237-
1 p.
|
artikel
|
| 69 |
MOS two-dimensional study
|
|
|
1972
|
11 |
3 |
p. 244-245
2 p.
|
artikel
|
| 70 |
Multiplying made easy for digital assemblies
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 71 |
Noise and y-parameters in MOS FET's
|
|
|
1972
|
11 |
3 |
p. 244-
1 p.
|
artikel
|
| 72 |
Non-repairable items
|
Mayhew, A.J.
|
|
1972
|
11 |
3 |
p. 283-284
2 p.
|
artikel
|
| 73 |
On-line system availability and service simulation (OLSASS)
|
|
|
1972
|
11 |
3 |
p. 237-
1 p.
|
artikel
|
| 74 |
On the study of irradiated MOS structures at very low frequency
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 75 |
Optimal redundancy and availability allocation in multistage systems
|
|
|
1972
|
11 |
3 |
p. 237-
1 p.
|
artikel
|
| 76 |
Order statistics and reliability
|
Singh, N.
|
|
1972
|
11 |
3 |
p. 297-299
3 p.
|
artikel
|
| 77 |
Papers to be published in future issues
|
|
|
1972
|
11 |
3 |
p. 255-
1 p.
|
artikel
|
| 78 |
PCM plus C/MOS spells reliable, low-dissipation data acquisition
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 79 |
Phase-lock loop comes to fm stereo wrapped in an IC package
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 80 |
Phonon effects in energy loss spectra of fast electrons in metal films
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 81 |
Physical characterization of electronic materials devices and thin films (1.12.69–1.12.70)
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 82 |
Physical origins of burst noise in transistors
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 83 |
Planox process smoothes path to greater MOS density
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 84 |
Plastic encapsulated transistors
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 85 |
Plastic packaging of hybrid circuits—a review
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 86 |
Power Schottky diode design and comparison with the junction diode
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 87 |
Preparation of silicon n-type films by sublimation in vacuum
|
|
|
1972
|
11 |
3 |
p. 242-
1 p.
|
artikel
|
| 88 |
Proceedings of the International Conference on the Physics and Chemistry of Semiconductor Heterojunctions and Layer Structures
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 253-
1 p.
|
artikel
|
| 89 |
Protect your transitors against turn-on or testing transient damage
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 90 |
Pyrohydrolytic Al2O3 for MOS applications
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 91 |
Relcomp: a computer program for calculating system reliability and MTBF
|
|
|
1972
|
11 |
3 |
p. 237-
1 p.
|
artikel
|
| 92 |
Reliability and maintainability parameters evaluated with simulation
|
|
|
1972
|
11 |
3 |
p. 237-238
2 p.
|
artikel
|
| 93 |
Reliability comparisons
|
Kitson, B.R.
|
|
1972
|
11 |
3 |
p. 287-292
6 p.
|
artikel
|
| 94 |
Reliability prediction of a two-unit standby redundant system with standby failure
|
Garg, R.C.
|
|
1972
|
11 |
3 |
p. 263-267
5 p.
|
artikel
|
| 95 |
Report on investigations of radiation resistance of the FBH 162 RTL integrated circuit
|
|
|
1972
|
11 |
3 |
p. 239-240
2 p.
|
artikel
|
| 96 |
Scientific sabotage of switching systems
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 97 |
Selective placing of solders and brazes in the assembly of hybrid microelectronic circuits
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 98 |
Semiconductors
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 251-
1 p.
|
artikel
|
| 99 |
Solder joint design in hybrid circuits
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 100 |
Some economic problems related to burn-in programs
|
|
|
1972
|
11 |
3 |
p. 238-239
2 p.
|
artikel
|
| 101 |
Statistical fatigue models: a survey
|
|
|
1972
|
11 |
3 |
p. 235-
1 p.
|
artikel
|
| 102 |
Surface breakdown in silicon planar diodes equipped with field plate
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 103 |
Surface self-diffusion of metals
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 252-
1 p.
|
artikel
|
| 104 |
Survey of second breakdown phenomena mechanisms and damage in semiconductor junction devices
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 105 |
Testing techniques that assure reliable semiconductor devices
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 106 |
The design and performance of an r.f. sputtering machine with continuous production capability
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 107 |
The development of polyimide multiplayer boards containing flexible circuitry
|
|
|
1972
|
11 |
3 |
p. 240-
1 p.
|
artikel
|
| 108 |
The direct emulsion screen as tool for high resolution thick film printing
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 109 |
The effect of static electricity on thick-film resistors
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 110 |
The effect of temperature cycling on aluminum-film interconnections
|
|
|
1972
|
11 |
3 |
p. 241-
1 p.
|
artikel
|
| 111 |
The mobility of positrons in semiconductors
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 112 |
Theory of metallic contacts on high resistivity solids (II) deep traps
|
|
|
1972
|
11 |
3 |
p. 242-243
2 p.
|
artikel
|
| 113 |
The rheology and viscometers of microelectronics
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 114 |
The unserviceable probability of a class of telecommunications networks
|
|
|
1972
|
11 |
3 |
p. 239-
1 p.
|
artikel
|
| 115 |
The use of lasers for resistor trimming
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 116 |
Thick-film hybrids meet satellite requirements—part 1
|
|
|
1972
|
11 |
3 |
p. 247-
1 p.
|
artikel
|
| 117 |
Thick-film hybrids meet satellite requirements—part 2
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 118 |
Thick-film microelectronics, fabrication, design and applications
|
G.W.A.D.,
|
|
1972
|
11 |
3 |
p. 251-252
2 p.
|
artikel
|
| 119 |
Thin-film microcircuit technology—v.h.f. to microwave
|
|
|
1972
|
11 |
3 |
p. 248-
1 p.
|
artikel
|
| 120 |
Transport of the short life-time carriers in homogeneous semiconductors
|
|
|
1972
|
11 |
3 |
p. 243-
1 p.
|
artikel
|
| 121 |
Transport properties of europium oxide thin films
|
|
|
1972
|
11 |
3 |
p. 246-
1 p.
|
artikel
|
| 122 |
TSEE spectra of differently produced SiO2 films
|
|
|
1972
|
11 |
3 |
p. 245-
1 p.
|
artikel
|
| 123 |
Use of a reaction rate method to predict failure times of adhesive bonds at constant stress
|
|
|
1972
|
11 |
3 |
p. 236-
1 p.
|
artikel
|
| 124 |
Variation analysis and design of experiments as an aid to design quality assurance
|
Talbot, J.P.P.
|
|
1972
|
11 |
3 |
p. 269-281
13 p.
|
artikel
|
| 125 |
Who's responsible for product safety?
|
|
|
1972
|
11 |
3 |
p. 235-
1 p.
|
artikel
|
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