| nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
| 1 |
Change in trap characteristics during fatigue of Au/BiFeO3/SrRuO3
|
Jin, Lei
|
|
|
108 |
C |
p.
|
artikel
|
| 2 |
Editorial Board
|
|
|
|
108 |
C |
p.
|
artikel
|
| 3 |
Effect of micromorphology on corrosion and mechanical properties of SAC305 lead-free solders
|
Chen, G.
|
|
|
108 |
C |
p.
|
artikel
|
| 4 |
Electrostatic discharge robustness of amorphous indium-gallium-zinc-oxide thin-film transistors
|
Simicic, Marko
|
|
|
108 |
C |
p.
|
artikel
|
| 5 |
Enhancing die level static fault isolation on power gated devices
|
Nagalingam, D.
|
|
|
108 |
C |
p.
|
artikel
|
| 6 |
Evaluation of thermal conductivity for sintered silver considering aging effect with microstructure based model
|
Qin, Fei
|
|
|
108 |
C |
p.
|
artikel
|
| 7 |
In situ investigation of atmospheric corrosion behavior of copper under thin electrolyte layer and static magnetic field
|
Yu, Xueyong
|
|
|
108 |
C |
p.
|
artikel
|
| 8 |
Investigation of radiation-induced degradations in four-junction solar cell by experiment and simulation
|
Peng, Chao
|
|
|
108 |
C |
p.
|
artikel
|
| 9 |
Over-stress and under-stress effects in CDM testing
|
O'Sullivan, Greg
|
|
|
108 |
C |
p.
|
artikel
|
| 10 |
Radiation induced soft errors in 16 nm floating gate SLC NAND flash memory
|
Chandrashekhar, Sandhya
|
|
|
108 |
C |
p.
|
artikel
|
| 11 |
Three-dimensional structure recognition of circuit patterns on semiconductor devices using multiple SEM images detected in different electron scattering angles
|
Yasui, Kenji
|
|
|
108 |
C |
p.
|
artikel
|
| 12 |
Two phase cooling with nano-fluid for highly dense electronic systems-on-chip – A pilot study
|
Bapu, B.R. Ramesh
|
|
|
108 |
C |
p.
|
artikel
|
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