nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A radiation-hardened Sense-Switch pFLASH cell for FPGA
|
Liu, Guozhu |
|
|
103 |
C |
p. |
artikel |
2 |
Comparative evaluations on scallop-induced electric-thermo-mechanical reliability of through-silicon-vias
|
Cheng, Zhiqiang |
|
|
103 |
C |
p. |
artikel |
3 |
Comparison of holes trapping and protons transport induced by low dose rate gamma radiation in oxide on different SiGe processes
|
Li, Pei |
|
|
103 |
C |
p. |
artikel |
4 |
Controllable micrometer positioning design of piezoelectric actuators using a robust fuzzy eliminator
|
Chen, Yung-Yue |
|
|
103 |
C |
p. |
artikel |
5 |
Determination of current transport and trap states density in AlInGaN/GaN heterostructures
|
Arslan, Engin |
|
|
103 |
C |
p. |
artikel |
6 |
Disclosing AlN ceramic substrate process failure mode and effect analysis
|
Hung, Shiu-Wan |
|
|
103 |
C |
p. |
artikel |
7 |
Editorial Board
|
|
|
|
103 |
C |
p. |
artikel |
8 |
Heat spreading path optimization of IGBT thermal network model
|
Cui, Haoyang |
|
|
103 |
C |
p. |
artikel |
9 |
Publisher Note
|
|
|
|
103 |
C |
p. |
artikel |
10 |
Real-time soft error testing system for large-area QDR II+ SRAM array on the Tibetan Plateau
|
Tong, Teng |
|
|
103 |
C |
p. |
artikel |
11 |
Stability of pentacene-based top gate thin film transistor with thick parylene as dielectric under humid environment
|
Diallo, Abdou Karim |
|
|
103 |
C |
p. |
artikel |
12 |
Study of electrical fatigue test in gold-coated siliver-4 wt.% palladium bonding wire
|
Ho, Chen-Chin |
|
|
103 |
C |
p. |
artikel |
13 |
The analysis of the anomalous hot-carrier effect in partially depleted SOI pMOSFETs fabricated on modified wafer
|
Zhu, Huilong |
|
|
103 |
C |
p. |
artikel |