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                             31 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Accelerated aging and thermal cycling of low melting temperature alloys as wet thermal interface materials Roy, Chandan K.
2015
100-101 12PB p. 2698-2704
7 p.
artikel
2 Adding a self-reset feature to the Bulk-BICS with dynamic storage cell Simionovski, Alexandre
2015
100-101 12PB p. 2748-2753
6 p.
artikel
3 AlN capping layer inserted between Cu and SiCN dielectric barrier layer for enhancing reliability of 28nm technological node and beyond Zhou, Ming
2015
100-101 12PB p. 2705-2711
7 p.
artikel
4 A novel photodiode based on Ruthenium(II) complex containing polydentate pyridine as photocatalyst Soylu, M.
2015
100-101 12PB p. 2685-2688
4 p.
artikel
5 Breakdown data generation and in-die deconvolution methodology to address BEOL and MOL dielectric breakdown challenges Chen, F.
2015
100-101 12PB p. 2727-2747
21 p.
artikel
6 Comparative evaluation of the short-circuit withstand capability of 1.2kV silicon carbide (SiC) power transistors in real life applications Kampitsis, Georgios
2015
100-101 12PB p. 2640-2646
7 p.
artikel
7 Development of C-Line plot technique for the characterization of edge effects in acoustic imaging: A case study using flip chip package geometry Lee, Chean Shen
2015
100-101 12PB p. 2762-2768
7 p.
artikel
8 Dynamic compact thermal model of high power light emitting diode Lai, Wei
2015
100-101 12PB p. 2663-2670
8 p.
artikel
9 Editorial Board 2015
100-101 12PB p. IFC-
1 p.
artikel
10 Effect of NBTI/PBTI aging and process variations on write failures in MOSFET and FinFET flip-flops Khalid, Usman
2015
100-101 12PB p. 2614-2626
13 p.
artikel
11 Exploring design diversity redundancy to improve resilience in mixed-signal systems Chenet, Cristiano P.
2015
100-101 12PB p. 2833-2844
12 p.
artikel
12 Failure-mechanism analysis for vertical high-power LEDs under external pressure Chen, Guanggao
2015
100-101 12PB p. 2671-2677
7 p.
artikel
13 Fault-tolerant carry look-ahead adder architectures robust to multiple simultaneous errors Valinataj, Mojtaba
2015
100-101 12PB p. 2845-2857
13 p.
artikel
14 Heavy-ion irradiation study in SOI-based and bulk-based junctionless FinFETs using 3D-TCAD simulation Vinodhkumar, N.
2015
100-101 12PB p. 2647-2653
7 p.
artikel
15 Hot carrier effect on a single SiGe HBT's EMI response Xiong, Cen
2015
100-101 12PB p. 2627-2633
7 p.
artikel
16 Inverse Gaussian distribution based timing analysis of Sub-threshold CMOS circuits Chen, Jiaoyan
2015
100-101 12PB p. 2754-2761
8 p.
artikel
17 Liquid Crystal Polymer for QFN packaging: Predicted thermo-mechanical fatigue and Design for Reliability Chenniki, Walide
2015
100-101 12PB p. 2793-2798
6 p.
artikel
18 Microscale temperature sensing using novel reliable silicon vertical microprobe array: Computation and experiment Matin, M.A.
2015
100-101 12PB p. 2689-2697
9 p.
artikel
19 Numerical simulation and fatigue life estimation of BGA packages under random vibration loading Liu, Fang
2015
100-101 12PB p. 2777-2785
9 p.
artikel
20 Optical degradation mechanisms of mid-power white-light LEDs in LM-80-08 tests Huang, Jianlin
2015
100-101 12PB p. 2654-2662
9 p.
artikel
21 Quantification of silicone degradation for LED packages using finite element analysis Zhang, Sung-Uk
2015
100-101 12PB p. 2678-2684
7 p.
artikel
22 Simulation study on the lifetime of electrochemical capacitors using the accelerated degradation test under temperature and voltage stresses Kim, Yu Tack
2015
100-101 12PB p. 2712-2720
9 p.
artikel
23 Study on reliability of PQFP assembly with lead free solder joints under random vibration test Che, F.X.
2015
100-101 12PB p. 2769-2776
8 p.
artikel
24 System efficient ESD design Gossner, H.
2015
100-101 12PB p. 2607-2613
7 p.
artikel
25 Temperature dependence of self-healing characteristics of metallized polypropylene film Li, Haoyuan
2015
100-101 12PB p. 2721-2726
6 p.
artikel
26 The surface energies of β-Sn — A new concept for corrosion and whisker mitigation Eckold, P.
2015
100-101 12PB p. 2799-2807
9 p.
artikel
27 The tensile impact properties of aged Sn–3Ag–0.5Cu/Cu solder joints Nguyen, Van Luong
2015
100-101 12PB p. 2808-2816
9 p.
artikel
28 Transient stress characterization of AlGaN/GaN HEMTs due to electrical and thermal effects Jones, Jason P.
2015
100-101 12PB p. 2634-2639
6 p.
artikel
29 Using RBF networks for detection and prediction of flip chip with missing bumps Liao, Guanglan
2015
100-101 12PB p. 2817-2825
9 p.
artikel
30 Using SOM neural network for X-ray inspection of missing-bump defects in three-dimensional integration Liao, Guanglan
2015
100-101 12PB p. 2826-2832
7 p.
artikel
31 Verification of empirical warp-based design criteria of space electronic boards Ben Fekih, Lassaad
2015
100-101 12PB p. 2786-2792
7 p.
artikel
                             31 gevonden resultaten
 
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