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                             107 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 Acceleration factors for environmental testing of integrated circuits 1971
10 6 p. 412-
1 p.
artikel
2 Active filters: new tools for separating frequencies 1971
10 6 p. 417-
1 p.
artikel
3 A hybrid thin-film radiosonde transmitter 1971
10 6 p. 419-
1 p.
artikel
4 A mechanism of evaluation in MAOS systems 1971
10 6 p. 421-
1 p.
artikel
5 A miniature FM telemetry device using thick-film circuitry 1971
10 6 p. 420-
1 p.
artikel
6 An algorithm for the reliability evaluation of redundant networks 1971
10 6 p. 415-
1 p.
artikel
7 An application of the STD process to hybrid microelectronics 1971
10 6 p. 417-
1 p.
artikel
8 An investigation into flip chip bonding Johnson, K.I.
1971
10 6 p. 451-452
2 p.
artikel
9 Anticipatory test monitors IC suppliers process control 1971
10 6 p. 412-413
2 p.
artikel
10 Application of photoresists in semiconductor manufacturing 1971
10 6 p. 418-419
2 p.
artikel
11 A shorter truncated sequential test 1971
10 6 p. 414-
1 p.
artikel
12 A statistical prediction interval for availability 1971
10 6 p. 414-
1 p.
artikel
13 A Vamfo-Caris method for determining thicknesses of transparent films with small number of interference extrema 1971
10 6 p. 423-
1 p.
artikel
14 Bonded crossovers for thin film circuits 1971
10 6 p. 423-
1 p.
artikel
15 Calendar of International Conferences, Symposia, Lectures and Meetings of Interest 1971
10 6 p. 401-402
2 p.
artikel
16 Call for papers 1971
10 6 p. 403-406
4 p.
artikel
17 Capacitors in microwave integrated circuits 1971
10 6 p. 419-
1 p.
artikel
18 Cavity perturbation method for measurement of permittivity and conductivity of medium lossy semiconductors and dielectrics 1971
10 6 p. 421-
1 p.
artikel
19 Charge neutrality in semiconductors with implanted impurity profiles 1971
10 6 p. 424-
1 p.
artikel
20 Charge storage in MNOS transistors at electric fields near gate insulator breakdown 1971
10 6 p. 420-
1 p.
artikel
21 Comparison of variants of integrated digital circuits 1971
10 6 p. 417-
1 p.
artikel
22 Component reliability Rackstraw, R.R.
1971
10 6 p. 425-426
2 p.
artikel
23 Computer controlled batch process manufacture of thin film resistor networks on ceramic substrates 1971
10 6 p. 424-
1 p.
artikel
24 Confidence limits 1971
10 6 p. 411-
1 p.
artikel
25 Cooling of microelectronics 1971
10 6 p. 417-
1 p.
artikel
26 Corrosion resistance of several integrated-circuit metallization systems 1971
10 6 p. 412-
1 p.
artikel
27 Deposited oxide contours in multi-layer metal circuitry 1971
10 6 p. 416-
1 p.
artikel
28 Deposited oxide contours in multi-layer metal circuitry 1971
10 6 p. 416-417
2 p.
artikel
29 Design limits when using Gold-Al bonds 1971
10 6 p. 412-
1 p.
artikel
30 Design of complex microstrip circuits by measurement and computer modelling 1971
10 6 p. 415-
1 p.
artikel
31 Design of customised microelectronics masks using off-line and on-line computer aids 1971
10 6 p. 418-
1 p.
artikel
32 Detection-Correction decoding for system reliability 1971
10 6 p. 414-
1 p.
artikel
33 Determination of optimum burn-in time: A composite criterion 1971
10 6 p. 411-
1 p.
artikel
34 Differential pressure test: A quantitative stress test method for bonded beam-leaded devices 1971
10 6 p. 412-
1 p.
artikel
35 Diffusion data Vol. 5, No. 1. (1971) Rule, A.F.E.
1971
10 6 p. 426-
1 p.
artikel
36 Direct liquid cooling of microelectronics 1971
10 6 p. 416-
1 p.
artikel
37 Durability and stability of various insulating films against the high temperature water in an autoclave 1971
10 6 p. 421-
1 p.
artikel
38 Effect of geometry on double injection in semiconductors 1971
10 6 p. 421-
1 p.
artikel
39 Ein schnelles Verfahren zur Berechnung der Auswirkungen von Bauelementetoleranzen bei einer Klasse von Zweitorschaltungen 1971
10 6 p. 415-
1 p.
artikel
40 Electrical breakdown and selfhealing in solid tantalum capacitors 1971
10 6 p. 413-
1 p.
artikel
41 Electron beams shine on IC layouts 1971
10 6 p. 424-
1 p.
artikel
42 Field reliability of plastic encapsulated transistors and integrated circuits Reich, B.
1971
10 6 p. 461-462
2 p.
artikel
43 Guest editorial Jowett, C.E.
1971
10 6 p. 399-
1 p.
artikel
44 High-speed trimming of tantalum resistors 1971
10 6 p. 422-
1 p.
artikel
45 Hybrid large-scale integration 1971
10 6 p. 416-
1 p.
artikel
46 Hybrid microelectronics S-band receiver 1971
10 6 p. 420-
1 p.
artikel
47 Inference on Weibull percentiles from sudden death tests using maximum likelihood 1971
10 6 p. 412-
1 p.
artikel
48 Insertion techniques for dual in-line package integrated circuits 1971
10 6 p. 416-
1 p.
artikel
49 Isolation method shrinks bipolar cells for fast, dense memories 1971
10 6 p. 420-
1 p.
artikel
50 Japan-France Symposium 1971
10 6 p. 407-
1 p.
artikel
51 Laser resistance trimming from the measurement point of view 1971
10 6 p. 424-
1 p.
artikel
52 Letter to the editor Reiche, H.
1971
10 6 p. 400-
1 p.
artikel
53 LOCOS: A new I.C. technology 1971
10 6 p. 471-472
2 p.
artikel
54 Markov approach to finding failure times of repairable systems 1971
10 6 p. 415-
1 p.
artikel
55 Measurement of resistivity of silicon by the spreading resistance method 1971
10 6 p. 420-421
2 p.
artikel
56 Metallization systems for integrated circuits 1971
10 6 p. 419-
1 p.
artikel
57 Microelectronics G.W.A.D.,
1971
10 6 p. 425-
1 p.
artikel
58 Microprogramming made easy—with a 4,096-bit bipolar ROM 1971
10 6 p. 419-
1 p.
artikel
59 Minimization of misclassification of component failures in a two-component system 1971
10 6 p. 412-
1 p.
artikel
60 MOSFETS rejuvenate old design for CATV broadband amplifiers 1971
10 6 p. 419-
1 p.
artikel
61 Network approaches to finding the reliability of repairable systems 1971
10 6 p. 413-414
2 p.
artikel
62 Ni-Cr Resistor contact reliability 1971
10 6 p. 413-
1 p.
artikel
63 Noise of hot holes in space-charge-limited germanium diodes 1971
10 6 p. 421-
1 p.
artikel
64 On determining the reliability of protective relay systems 1971
10 6 p. 414-
1 p.
artikel
65 “On the chip” multilevel interconnection 1971
10 6 p. 418-
1 p.
artikel
66 On the usefulness of the maximum entropy principle in the Bayesian estimation of reliability 1971
10 6 p. 411-412
2 p.
artikel
67 Optimal Reliability of a complex system 1971
10 6 p. 414-
1 p.
artikel
68 Papers to be published in future issues 1971
10 6 p. 427-
1 p.
artikel
69 Plasma-grown Al2O3 for COS/MOS integrated circuits 1971
10 6 p. 418-
1 p.
artikel
70 Practical consideration affecting thick-film conductor adherence of solder systems 1971
10 6 p. 422-
1 p.
artikel
71 Precision adjusted, beam-leaded, thin film resistors 1971
10 6 p. 423-
1 p.
artikel
72 Precision measurement of resistor networks 1971
10 6 p. 422-
1 p.
artikel
73 Radiation-induced perturbations in metal-insulator-semiconductor structures 1971
10 6 p. 421-
1 p.
artikel
74 Random failure 1971
10 6 p. 412-
1 p.
artikel
75 Recent United Kingdom patents in microelectronics 1971
10 6 p. 409-410
2 p.
artikel
76 Reduction of electromigration—induced failure in aluminum metallization through anodization 1971
10 6 p. 413-
1 p.
artikel
77 Reliability analysis of large nonrepairable systems 1971
10 6 p. 414-415
2 p.
artikel
78 Reliability of MgAl Semiconductor Interconnects 1971
10 6 p. 416-
1 p.
artikel
79 Reliability of switching networks for impediment of trunk lines 1971
10 6 p. 414-
1 p.
artikel
80 Reliability of thermoelectric couple networks based upon couple catastrophic failures 1971
10 6 p. 413-
1 p.
artikel
81 Renewal theoretic aspects of two-unit redundant systems 1971
10 6 p. 415-
1 p.
artikel
82 Scanning electron microscopy studies on switching lateral transistors in integrated circuits 1971
10 6 p. 424-
1 p.
artikel
83 Schottky barriers on p-type silicon 1971
10 6 p. 421-
1 p.
artikel
84 Some bounds for the reliability of a system with specified failure rate characteristics 1971
10 6 p. 413-
1 p.
artikel
85 Some observations on the controlled oxidation of silicon Joyce, B.A.
1971
10 6 p. 473-
1 p.
artikel
86 Squeegee pressure and thick-film resistor fabrication 1971
10 6 p. 423-
1 p.
artikel
87 Survey of semiconductor joining techniques 1971
10 6 p. 418-
1 p.
artikel
88 Techniques for optimum spares allocation: A tutorial review 1971
10 6 p. 414-
1 p.
artikel
89 Temperature coefficient of tantalum nitride film resistor 1971
10 6 p. 422-
1 p.
artikel
90 Testing for adhesion of hybrid films 1971
10 6 p. 423-
1 p.
artikel
91 Testing integrated circuits with a laser beam 1971
10 6 p. 424-
1 p.
artikel
92 Test of McWhorter's model of low-frequency noise in Si MOSTs Berz, F.
1971
10 6 p. 429-433
5 p.
artikel
93 The effects of in-process heating on K1200 monolithic multilayer capacitors 1971
10 6 p. 419-
1 p.
artikel
94 The influence of stacking faults on leakage currents of FET devices Schwuttke, G.H.
1971
10 6 p. 467-470
4 p.
artikel
95 The influence of the reaction kinetics of O2 and source flow rates on the uniformity of boron and arsenic diffusions 1971
10 6 p. 422-
1 p.
artikel
96 The measurement of linear circuits with a computer-operated system 1971
10 6 p. 419-420
2 p.
artikel
97 Thermal behavior and aging of tantalum nitride thin film resistors under pulsed operation 1971
10 6 p. 422-423
2 p.
artikel
98 Thermal emission and capture of electrons at sulfur centers in silicon 1971
10 6 p. 420-
1 p.
artikel
99 The TBA631-IF/FM limiter-amplifier; FM detector; Low frequency power amplifier Bertotti, F.
1971
10 6 p. 435-449
15 p.
artikel
100 The Teaching of integrated circuits: Analysis, design and fabrication 1971
10 6 p. 415-416
2 p.
artikel
101 The use of passive chip components in hybrid integrated circuits 1971
10 6 p. 419-
1 p.
artikel
102 Thick film substrates for beam lead and flip chip attachments 1971
10 6 p. 422-
1 p.
artikel
103 Thin film circuit resistor adjustment and conductor verification employing a programmable facility 1971
10 6 p. 423-
1 p.
artikel
104 Thin film laser machining 1971
10 6 p. 424-
1 p.
artikel
105 Turn around time for custom LSI reduced using reprocessed multilayers 1971
10 6 p. 418-
1 p.
artikel
106 Unique Bi-fold microcircuit packaging design 1971
10 6 p. 417-
1 p.
artikel
107 Warranty periods based on three ordered sample observations from Weibull population 1971
10 6 p. 415-
1 p.
artikel
                             107 gevonden resultaten
 
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