nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A Bayesian time-to-failure distribution
|
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|
1971 |
10 |
5 |
p. 301- 1 p. |
artikel |
2 |
A critique of MOS/LSI testing
|
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|
1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
3 |
A design procedure for discard VS repair decisions
|
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1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
4 |
A facelifting for NASA's reliability requirements
|
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1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
5 |
A hybrid repeater using integrated circuits
|
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1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
6 |
Aluminum-aluminum oxide metallurgy for enhanced electromigration resistance in monolithic circuits
|
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1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
7 |
An integrated predictor of system reliability
|
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1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
8 |
An investigation of microplasma noise in zener diodes with the SEM
|
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1971 |
10 |
5 |
p. 313- 1 p. |
artikel |
9 |
An MOS-LSI memory reliability program for a commercial computer application
|
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1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
10 |
Application of sputtering in the fabrication of semiconductor devices
|
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1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
11 |
Applications determine the design, materials, processes and package
|
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1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
12 |
A study of an ordinary and empirical Bayes approach to reliability estimation in the gamma life testing model
|
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1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
13 |
Avalanche currents in planar structures
|
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1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
14 |
Behaviour of a complex system with stand-by redundancy under different repair echelons
|
Srivastava, S.S. |
|
1971 |
10 |
5 |
p. 375-380 6 p. |
artikel |
15 |
Boundary conditions at p-n junctions
|
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1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
16 |
Call for papers
|
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1971 |
10 |
5 |
p. 297- 1 p. |
artikel |
17 |
Capacitance voltage measurements on N-type InAs MOS diodes
|
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|
1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
18 |
Charge transfer devices
|
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|
1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
19 |
Chip handling equipment for hybrid microcircuits
|
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|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
20 |
Computer aided reliability assurance system for ICs
|
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1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
21 |
Conductor film metallizations for use in tantalum film integrated circuits
|
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1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
22 |
Courses in microelectronics and reliability
|
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|
1971 |
10 |
5 |
p. 293-295 3 p. |
artikel |
23 |
Current density distribution across the pn junction of a partially contacted diode at high forward bias
|
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|
1971 |
10 |
5 |
p. 310-311 2 p. |
artikel |
24 |
Deferred state sampling procedures
|
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1971 |
10 |
5 |
p. 301- 1 p. |
artikel |
25 |
Degradation and passivation of light emitting diodes
|
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1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
26 |
Design evaluation of distributed saturation characteristics in integrated devices
|
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1971 |
10 |
5 |
p. 310- 1 p. |
artikel |
27 |
Detection of loose particles within electronic component cavities
|
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1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
28 |
Development of a model for distributed saturation characteristics in integrated devices
|
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1971 |
10 |
5 |
p. 310- 1 p. |
artikel |
29 |
Diaphragm connection—a new package for complex ICs
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1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
30 |
Double-diffused MOS transistor achieves microwave gain
|
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1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
31 |
EBS amplifiers debut
|
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1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
32 |
Economic formulation of reliability objectives
|
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1971 |
10 |
5 |
p. 301-302 2 p. |
artikel |
33 |
Electrical junction delineation by scanning electron beam technique
|
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|
1971 |
10 |
5 |
p. 313- 1 p. |
artikel |
34 |
Engineering application of failure data
|
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1971 |
10 |
5 |
p. 301- 1 p. |
artikel |
35 |
Enter the ion-implantation age, where “impossibles” are possible
|
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|
1971 |
10 |
5 |
p. 312-313 2 p. |
artikel |
36 |
Equivalent circuit concepts for electronic failure analysis
|
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|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
37 |
Etude de la fiabilite des varactors pour hyperfrequences de structure “MESA”
|
Dorkel, J. |
|
1971 |
10 |
5 |
p. 347-354 8 p. |
artikel |
38 |
Evaluation of the mechanical integrity of beam lead devices and bonds using thermomechanical stress waves
|
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1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
39 |
Factors involved in the scanning electron microscope analysis of glass passivated devices
|
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1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
40 |
Failure prediction from interval data
|
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1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
41 |
FET cascode technique optimizes differential amplifier performance
|
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1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
42 |
FET input reduces IC op amp's bias and offset
|
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1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
43 |
Gate noise in MOS FET's at moderately high frequencies
|
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1971 |
10 |
5 |
p. 309-310 2 p. |
artikel |
44 |
Hybrid ICs a major factor in microwave component development
|
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1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
45 |
ICs on film strip lend themselves to automatic handling by manufacturer and user too
|
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|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
46 |
Integrated high frequency gyrator circuits
|
Wade, J.G. |
|
1971 |
10 |
5 |
p. 387-389 3 p. |
artikel |
47 |
Integrierte mikrowellenschaltungen stand und tendenzen der entwicklung
|
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|
1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
48 |
Invited talk
|
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|
1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
49 |
Items of interest
|
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|
1971 |
10 |
5 |
p. 292- 1 p. |
artikel |
50 |
Large-scale integration in microelectronics
|
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1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
51 |
LSI tester does all things to all arrays
|
|
|
1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
52 |
Mechanisms and modes of failure in silicon planar semiconductor devices
|
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|
1971 |
10 |
5 |
p. 304-305 2 p. |
artikel |
53 |
Methods of measurement for semiconductor materials process control and devices
|
|
|
1971 |
10 |
5 |
p. 310- 1 p. |
artikel |
54 |
MIL-STD-781 sequential tests: time to completion
|
|
|
1971 |
10 |
5 |
p. 306-307 2 p. |
artikel |
55 |
Model semiconductor dielectric function
|
|
|
1971 |
10 |
5 |
p. 310- 1 p. |
artikel |
56 |
Modes of failure of MOS devices
|
Eccleston, W. |
|
1971 |
10 |
5 |
p. 325-336 12 p. |
artikel |
57 |
Monolithic main memory—new reliability and serviceability environment
|
|
|
1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
58 |
Monte Carlo analysis of system outage
|
Malec, H.A. |
|
1971 |
10 |
5 |
p. 339-345 7 p. |
artikel |
59 |
MOST digital logic circuits in silicon films deposited on sapphire substrates
|
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|
1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
60 |
New LSI packaging opens the way for the micromini era
|
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|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
61 |
Non-destructive semiconductor testing using scanned laser techniques
|
|
|
1971 |
10 |
5 |
p. 313- 1 p. |
artikel |
62 |
On simplifying mission reliability calculations
|
|
|
1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
63 |
Operational testing of L.S.I. arrays by stroboscopic scanning electron microscopy
|
Plows, G.S. |
|
1971 |
10 |
5 |
p. 317-318 2 p. |
artikel |
64 |
Optimization of Aegis availability
|
|
|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
65 |
Papers to be published in future issues
|
|
|
1971 |
10 |
5 |
p. 315- 1 p. |
artikel |
66 |
Parametric dependencies in thick-film screening
|
|
|
1971 |
10 |
5 |
p. 311-312 2 p. |
artikel |
67 |
Part Two: system designers eye multichip LSI packages
|
|
|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
68 |
Prediction intervals for life testing
|
|
|
1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
69 |
Rate control for vacuum co-deposition of thin-film cermets
|
|
|
1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
70 |
Recent United Kingdom patents in microelectronics
|
|
|
1971 |
10 |
5 |
p. 299-300 2 p. |
artikel |
71 |
Reduction of the base/collector capacitance in high speed logic IC transistors by collector-profiling
|
Downey, A. |
|
1971 |
10 |
5 |
p. 381-385 5 p. |
artikel |
72 |
Redundancy configurations and their effect on system reliability
|
Evans, R.A. |
|
1971 |
10 |
5 |
p. 355-357 3 p. |
artikel |
73 |
Relation of the particle size of RuO2 in cermet resistor inks to the electrical properties of fired resistors
|
|
|
1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
74 |
Reliability and stability of carbon film resistors
|
Stanley, K.W. |
|
1971 |
10 |
5 |
p. 359-374 16 p. |
artikel |
75 |
Reliability approach to ship systems
|
|
|
1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
76 |
Reliability considerations in STD development
|
|
|
1971 |
10 |
5 |
p. 306- 1 p. |
artikel |
77 |
Reliability data for improving ship systems
|
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|
1971 |
10 |
5 |
p. 305-306 2 p. |
artikel |
78 |
Reliability of real-time telemetry stations for the AZUR satellite
|
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|
1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
79 |
Reliability studies of MOS Si-gate arrays
|
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|
1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
80 |
Reliable systems operation of amorphous semi-conductor memories
|
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|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
81 |
Reliable testing of electronic equipment
|
Hemingway, T.K. |
|
1971 |
10 |
5 |
p. 391-396 6 p. |
artikel |
82 |
Responsive reliability proposals in a tight market
|
|
|
1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
83 |
Silicon wafer technology—state of the art
|
|
|
1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
84 |
Spinel may make MOS faster than T2L
|
|
|
1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
85 |
Stripline Gunn oscillators are compatible with microwave ICs
|
|
|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
86 |
Studies of bonding mechanisms and failure modes in thermocompression bonds of gold-plated leads to Ti-Au metallized substrates
|
|
|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
87 |
Study of failure modes of multilevel large-scale integrated circuits
|
|
|
1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
88 |
Subnanosecond delays in circuit complexes measures by slice probing
|
|
|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
89 |
Substratmaterialien für integrierte Mikrowellen-schaltungen
|
|
|
1971 |
10 |
5 |
p. 307- 1 p. |
artikel |
90 |
Successful matchmakers: miniconnectors for digital ICs
|
|
|
1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
91 |
System design in MOS/LSI
|
|
|
1971 |
10 |
5 |
p. 309- 1 p. |
artikel |
92 |
System evaluation and feedback data
|
|
|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
93 |
The case for emitter-coupled logic
|
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|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
94 |
The determination of oxygen and carbon in semiconductors
|
Clegg, J.B. |
|
1971 |
10 |
5 |
p. 397- 1 p. |
artikel |
95 |
The influence of stationary dislocations and stacking faults on some transistor parameters
|
|
|
1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
96 |
The monolithic phase-locked-loop—a versatile building block
|
|
|
1971 |
10 |
5 |
p. 310- 1 p. |
artikel |
97 |
The response of the threshold voltages of the transistors in simple MOS circuits to tests at elevated temperatures
|
|
|
1971 |
10 |
5 |
p. 305- 1 p. |
artikel |
98 |
Thermal control for high density packaging
|
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|
1971 |
10 |
5 |
p. 308- 1 p. |
artikel |
99 |
Thermal excursion can cause bond problems
|
|
|
1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
100 |
The SEM as a defect analysis tool for semiconductor memories
|
|
|
1971 |
10 |
5 |
p. 313- 1 p. |
artikel |
101 |
The 9th annual reliability engineering and management Institute the University of Arizona, division of continuing education
|
|
|
1971 |
10 |
5 |
p. 295-296 2 p. |
artikel |
102 |
Thick-film filter designed for television signals
|
|
|
1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
103 |
Thin-film technologies—a summary of their place in microelectronics
|
|
|
1971 |
10 |
5 |
p. 312- 1 p. |
artikel |
104 |
Three new technologies converge in high-performance instruments
|
|
|
1971 |
10 |
5 |
p. 307-308 2 p. |
artikel |
105 |
Total confidence limits on observed reliability
|
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1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
106 |
Total reliability requirement procedure for large-scale integrated circuit array devices
|
|
|
1971 |
10 |
5 |
p. 303- 1 p. |
artikel |
107 |
Type-all system for determining semiconductor conductivity type
|
|
|
1971 |
10 |
5 |
p. 311- 1 p. |
artikel |
108 |
Variables affecting thermally induced surface reconstruction in Al-metal
|
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|
1971 |
10 |
5 |
p. 304- 1 p. |
artikel |
109 |
“Weibull” decreasing hazard rate—help or hoax?
|
|
|
1971 |
10 |
5 |
p. 302- 1 p. |
artikel |
110 |
Whither microelectronics?
|
Foley, F.M. |
|
1971 |
10 |
5 |
p. 291- 1 p. |
artikel |