no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
A detailed analysis of three-level electron transfer
|
|
|
1971 |
10 |
3 |
p. 149- 1 p. |
article |
2 |
Advanced technologies extend LSI capability
|
|
|
1971 |
10 |
3 |
p. 145-146 2 p. |
article |
3 |
Advantages of IGFETS in integrated circuits
|
|
|
1971 |
10 |
3 |
p. 146- 1 p. |
article |
4 |
A laser maching system for making integrated circuit masks
|
|
|
1971 |
10 |
3 |
p. 152-153 2 p. |
article |
5 |
An electrometer MOST
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
6 |
Anodic transformation of silicon nitride obtained by reactive cathode sputtering
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
7 |
Applying integrated circuits to transmission systems
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
8 |
A review of present practice in reliability engineering
|
Butler, B.E. |
|
1971 |
10 |
3 |
p. 195-208 14 p. |
article |
9 |
A single substrate thin-film active telephone network using TMM capacitors and tantalum nitride resistors
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
10 |
Build a sawtooth generator with three ICs
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
11 |
Carrier accumulation and space-charge-limited current flow in fleld-effect transistors
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
12 |
Characteristics of parallel-plate transmission lines on silicon-siliconoxide system
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
13 |
Characterization of thick-film resistives for maximum production yields
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
14 |
Choice of a process inspection scheme for attribute data
|
|
|
1971 |
10 |
3 |
p. 143- 1 p. |
article |
15 |
Chromium/cobalt—an extremely versatile thin-film technology
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
16 |
Compare reliability at a glance
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
17 |
Computer aided design of IC and LSI devices
|
|
|
1971 |
10 |
3 |
p. 146- 1 p. |
article |
18 |
Computerized mask-making for complex memory chips
|
|
|
1971 |
10 |
3 |
p. 146-147 2 p. |
article |
19 |
Conference report
|
Jacobs, Richard M. |
|
1971 |
10 |
3 |
p. 137-140 4 p. |
article |
20 |
Covalent bonds in semiconductors
|
|
|
1971 |
10 |
3 |
p. 150-151 2 p. |
article |
21 |
Design and development for reliability
|
Melvin, J.G. |
|
1971 |
10 |
3 |
p. 209-215 7 p. |
article |
22 |
Designing for automatic testing: the concept and general approach
|
|
|
1971 |
10 |
3 |
p. 143- 1 p. |
article |
23 |
Diffusion in semiconductors
|
G.W.A.D., |
|
1971 |
10 |
3 |
p. 156- 1 p. |
article |
24 |
Digital circuits invadec GHz range
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
25 |
Double injection in semiconductors heavily doped with deep two-level traps
|
|
|
1971 |
10 |
3 |
p. 150- 1 p. |
article |
26 |
Effect of stress on the carrier generation rate in gold-doped silicon
|
|
|
1971 |
10 |
3 |
p. 149- 1 p. |
article |
27 |
Electrical conduction in cermet films
|
|
|
1971 |
10 |
3 |
p. 151- 1 p. |
article |
28 |
Electronic integrated circuits and systems
|
G.W.A.D., |
|
1971 |
10 |
3 |
p. 155- 1 p. |
article |
29 |
Elimination of reflections in high-speed integrated digital gates at low power consumption
|
Abdel-Latif, M. |
|
1971 |
10 |
3 |
p. 225- 1 p. |
article |
30 |
Experiments concerning the life testing of transistors—I
|
Kemény, A.P. |
|
1971 |
10 |
3 |
p. 169-194 26 p. |
article |
31 |
Explore IC performance
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
32 |
Field effect electronics
|
G.W.A.D., |
|
1971 |
10 |
3 |
p. 155- 1 p. |
article |
33 |
Grüneisen constant of some semiconductors
|
|
|
1971 |
10 |
3 |
p. 150- 1 p. |
article |
34 |
Homogeneous thin-film attenuators
|
|
|
1971 |
10 |
3 |
p. 151- 1 p. |
article |
35 |
Hybrid audio power amplifier. SEI-ICHI-DENDA
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
36 |
Hybrid resistor trimming: an industry report
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
37 |
Integrated-circuit digital logic families. II: TTL devices
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
38 |
Integrated-circuit digital logic families; I: Requirements and features of a logic family; RTL, DTL and HTL devices
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
39 |
Integrated logic circuits
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
40 |
Interface states in metal-oxide-semiconductor field-effect transistors
|
|
|
1971 |
10 |
3 |
p. 149-150 2 p. |
article |
41 |
Low-cost video distribution amplifier gives increased reliability
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
42 |
Low-temperature passivation of semiconductor devices and their reliability
|
|
|
1971 |
10 |
3 |
p. 143-144 2 p. |
article |
43 |
LSI testers: still a hardsell?
|
|
|
1971 |
10 |
3 |
p. 146- 1 p. |
article |
44 |
Materials: potting and encapsulating: silicones for microcircuits
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
45 |
Microcircuits for the microwave sweeper
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
46 |
Microelectronics—Trends and problems
|
Dietrich, Paul |
|
1971 |
10 |
3 |
p. 133-134 2 p. |
article |
47 |
Microjoining techniques
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
48 |
Microwave integrated circuit fabrication
|
|
|
1971 |
10 |
3 |
p. 146- 1 p. |
article |
49 |
Minimum facilities for production of thin-film hybrid circuitry
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
50 |
Modulator as a customer designed silicon integrated circuit
|
|
|
1971 |
10 |
3 |
p. 147- 1 p. |
article |
51 |
MOS course, part 6. Testing MOS
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
52 |
Negative differential conductivity in semiconductors
|
|
|
1971 |
10 |
3 |
p. 150- 1 p. |
article |
53 |
Notice
|
|
|
1971 |
10 |
3 |
p. 135-136 2 p. |
article |
54 |
Papers to be published in future issues
|
|
|
1971 |
10 |
3 |
p. 157- 1 p. |
article |
55 |
Parallel multiplier gets boost from IC iterative logic
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
56 |
Photomodulation of the photoemissive yield near threshold in silicon
|
|
|
1971 |
10 |
3 |
p. 149- 1 p. |
article |
57 |
Plastic ICs entice military
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
58 |
Possible new multi-layer interconnection methods for integrated circuits
|
|
|
1971 |
10 |
3 |
p. 146- 1 p. |
article |
59 |
Power system reliability evaluation
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
60 |
Quality, product description and conformance
|
|
|
1971 |
10 |
3 |
p. 143- 1 p. |
article |
61 |
Recent United Kingdom patents in microelectronics
|
|
|
1971 |
10 |
3 |
p. 141-142 2 p. |
article |
62 |
Reliability in the design specification
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
63 |
Reliability of electronic construction units increased by means of dynamic optimization
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
64 |
Reliability of hybrid microcircuits in use today
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
65 |
Reliability of switching networks for impediment of trunk lines
|
|
|
1971 |
10 |
3 |
p. 144-145 2 p. |
article |
66 |
Reliability testing
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
67 |
Selection of thermocouples for temperature profiling of semiconductor diffusion furnaces
|
|
|
1971 |
10 |
3 |
p. 149- 1 p. |
article |
68 |
Solid-state switching for aircraft electric systems
|
|
|
1971 |
10 |
3 |
p. 147-148 2 p. |
article |
69 |
Some important process and performance characteristics of “Birox” thick-film resistor compositions
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
70 |
Special aspects of reliability and maintainability in nuclear stations
|
Wolfe, W.A. |
|
1971 |
10 |
3 |
p. 217-223 7 p. |
article |
71 |
Stochastic behaviour of an intermittently working system with stand-by redundancy
|
Srivastava, S.S. |
|
1971 |
10 |
3 |
p. 159-167 9 p. |
article |
72 |
Swing to passive DIPs looks like a stampede
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
73 |
Testing integrated circuits
|
|
|
1971 |
10 |
3 |
p. 145- 1 p. |
article |
74 |
The characteristics of thermal grown silicon oxide film
|
|
|
1971 |
10 |
3 |
p. 150- 1 p. |
article |
75 |
The effects of particle size control in the metal powder systems on the characteristics of palladium silver thick-film resistors
|
|
|
1971 |
10 |
3 |
p. 151- 1 p. |
article |
76 |
The influence of non-uniformly doped substrates on MOS C-V curves
|
|
|
1971 |
10 |
3 |
p. 151- 1 p. |
article |
77 |
The theory of surface states on semiconductors
|
|
|
1971 |
10 |
3 |
p. 148-149 2 p. |
article |
78 |
The why's and how's of semiconductor chips
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |
79 |
Thin-film lumped-element microwave integrated circuits
|
|
|
1971 |
10 |
3 |
p. 151-152 2 p. |
article |
80 |
Thin-film microelectronics: a review
|
|
|
1971 |
10 |
3 |
p. 152- 1 p. |
article |
81 |
Transient annealing of defects in irradiated silicon devices
|
|
|
1971 |
10 |
3 |
p. 144- 1 p. |
article |
82 |
Transistor gyrator using thin-film circuits
|
|
|
1971 |
10 |
3 |
p. 151- 1 p. |
article |
83 |
Untersuchung gesputterter SiO2-schichten auf Sieinkristallen
|
|
|
1971 |
10 |
3 |
p. 149- 1 p. |
article |
84 |
Uses and advantages of chip resistors
|
|
|
1971 |
10 |
3 |
p. 148- 1 p. |
article |