Digitale Bibliotheek
Sluiten Bladeren door artikelen uit een tijdschrift
 
Zoeken naar met titel:
ABCDEFGHIJKLMNOPQRSTUVWXYZ

     Tijdschrift beschrijving
       Alle jaargangen van het bijbehorende tijdschrift
         Alle afleveringen van het bijbehorende jaargang
                                       Alle artikelen van de bijbehorende aflevering
 
                             253 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 A CAD coupled laser beam test system for digital circuit failure analysis 1992
 1-2 p. 300-301
2 p.
 artikel
2 A case study of ethernet anomalies in a distributed computing environment 1992
 1-2 p. 289-
1 p.
 artikel
3 A census of tandem system availability between 1985 and 1990 1992
 1-2 p. 283-
1 p.
 artikel
4 A class of shrinkage estimators for the scale parameter of the exponential distribution 1992
 1-2 p. 290-
1 p.
 artikel
5 A compact high power semiconductor laser array Douglas, P.E.
 1978
 1-2 p. 163-174
12 p.
 artikel
6 A comparison study of the reliability of the two majority-vote instrumentation systems Nieuwhof, G.W.E
 1980
 1-2 p. 13-24
12 p.
 artikel
7 A confidence interval for the availability ratio for systems with weibull operating time and lognormal repair time Masters, B.N.
 1992
 1-2 p. 89-99
11 p.
 artikel
8 A- consecutive-k-out-of-n: G system: the mirror image of a consecutive-k-out-of-n: F system 1992
 1-2 p. 292-
1 p.
 artikel
9 Ada's fundamental language structures build reliable systems 1992
 1-2 p. 283-
1 p.
 artikel
10 Addendum Nieuwhof, G.W.E.
 1979
 1-2 p. 161-168
8 p.
 artikel
11 A design review approach toward dynamic RAM reliability Roberts, J.A.
 1979
 1-2 p. 97-105
9 p.
 artikel
12 Ag-Pd thick film conductor for AIN ceramics 1992
 1-2 p. 298-
1 p.
 artikel
13 A look at optoelectronic integrated circuits 1992
 1-2 p. 292-
1 p.
 artikel
14 A low cost reliability test specification de Corlieu, Jacques
 1979
 1-2 p. 11-14
4 p.
 artikel
15 A microcomputer for control applications Walsh, M.J.
 1978
 1-2 p. 5-8
4 p.
 artikel
16 A model for moisture induced corrosion failures in microelectronic packages 1992
 1-2 p. 284-
1 p.
 artikel
17 A model of charge transport in thermal SiO2 implanted with Si 1992
 1-2 p. 301-
1 p.
 artikel
18 A model of 1/f noise in polysilicon resistors 1992
 1-2 p. 299-
1 p.
 artikel
19 Analyzing the mechanical strength of SMT attached solder joints 1992
 1-2 p. 285-
1 p.
 artikel
20 An approximation analysis for the availability of a parallel redundant system with general distributions Yanagi, Shigeru
 1992
 1-2 p. 143-157
15 p.
 artikel
21 An efficient algorithm to solve inter-programming problems arising in system-reliability design 1992
 1-2 p. 292-
1 p.
 artikel
22 A new approach toward evaluation of reliability of electronic equipment during maintenance and designing Lerner, Moisey M
 1980
 1-2 p. 147-151
5 p.
 artikel
23 A new ERA in reliability Balke, Nicholas
 1979
 1-2 p. iii-
1 p.
 artikel
24 A new intelligent one-chip microcomputer: the application-specific microcomputer 1992
 1-2 p. 295-296
2 p.
 artikel
25 A new recursive algorithm for the reliability evaluation of a distributed program Chen, Den-Jyi
 1992
 1-2 p. 25-33
9 p.
 artikel
26 An introduction to assemblers and loaders for microprocessor systems Spratt, E.B.
 1978
 1-2 p. 133-142
10 p.
 artikel
27 An investigation of pnp polysilicon emitter transistors 1992
 1-2 p. 297-
1 p.
 artikel
28 A note on recursive estimator of the density function which is not necessarily continuous El-Fahham, M.M.
 1992
 1-2 p. 79-87
9 p.
 artikel
29 A novel Lossy and dispersive interconnect model for integrated circuit simulation 1992
 1-2 p. 296-
1 p.
 artikel
30 A PABX model using the 6800 MPU Marclay, Bernard
 1978
 1-2 p. 15-33
19 p.
 artikel
31 Application of DIN ISO 9000 through 9004 to the practice of nondestructive testing 1992
 1-2 p. 283-
1 p.
 artikel
32 A proportional hazards approach to correlate SiO2—breakdown voltage and time distributions 1992
 1-2 p. 288-
1 p.
 artikel
33 A review of the properties of aluminium alloy films used during silicon device fabrication 1992
 1-2 p. 300-
1 p.
 artikel
34 A self optimising central heating control system Leiper, Dave
 1978
 1-2 p. 101-109
9 p.
 artikel
35 A simple expression for band gap narrowing (BGN) in heavily doped Si, Ge, GaAs and GexSi1−x strained layers 1992
 1-2 p. 297-
1 p.
 artikel
36 A simple model for life cycle cost vs maintainability function Govil, K.K.
 1992
 1-2 p. 269-270
2 p.
 artikel
37 A submicron electron-beam tester for VLSI circuits beyond the 4-Mb DRAM 1992
 1-2 p. 301-
1 p.
 artikel
38 A system safety approach to the design of an Intermediate Capacity Transit System Rumsey, A.F
 1980
 1-2 p. 123-129
7 p.
 artikel
39 A unified performance reliability analysis of a system with a cumulative down time constraint Nicola, Victor
 1992
 1-2 p. 49-65
17 p.
 artikel
40 Automated analysis of phased-mission reliability 1992
 1-2 p. 291-
1 p.
 artikel
41 Automated apparatus for long-term testing of electrical brushes 1992
 1-2 p. 285-286
2 p.
 artikel
42 Automatic soldering technology accommodates computer needs 1992
 1-2 p. 295-
1 p.
 artikel
43 Availability of k-out-of-m:G repairable system with non-identical elements Gadani, J.P.
 1979
 1-2 p. 65-71
7 p.
 artikel
44 A VLSI design for an efficient multiprocessor cache memory 1992
 1-2 p. 296-
1 p.
 artikel
45 A Weibull model to characterize lifetimes of aluminum alloy electrical wire connections 1992
 1-2 p. 290-
1 p.
 artikel
46 Bayes credibility estimation of an exponential parameter for random censoring and incomplete information 1992
 1-2 p. 286-287
2 p.
 artikel
47 Bayes estimates under asymmetric loss 1992
 1-2 p. 290-
1 p.
 artikel
48 Bayes predictive analysis of a fundamental software-reliability model 1992
 1-2 p. 289-
1 p.
 artikel
49 Behavioral prediction of materials degradation in load-bearing structures Hay, D.Robert
 1979
 1-2 p. 127-132
6 p.
 artikel
50 Benzocyclobutene interlayer dielectrics for thin film multichip modules 1992
 1-2 p. 298-299
2 p.
 artikel
51 Biographies 1979
 1-2 p. 151-160
10 p.
 artikel
52 Biographies 1980
 1-2 p. 163-167
5 p.
 artikel
53 Calculation of the Binomial survivor function 1992
 1-2 p. 287-
1 p.
 artikel
54 Calculation of the Poisson cumulative distribution function 1992
 1-2 p. 289-
1 p.
 artikel
55 Calendar of international conferences, symposia, lectures and meetings of interest 1992
 1-2 p. 277-280
4 p.
 artikel
56 Can a noninvasive reliability prediction of electronic boards be accurate? Rawicz, Andrew H.
 1992
 1-2 p. 223-232
10 p.
 artikel
57 Chairman's message Lewis, Neville
 1980
 1-2 p. iii-
1 p.
 artikel
58 Characterization of the Pearson family of distributions 1992
 1-2 p. 291-
1 p.
 artikel
59 Chip tantalum capacitors take center stage among SMDs 1992
 1-2 p. 296-
1 p.
 artikel
60 Chip technology now available for aluminum electro-lytic capacitors 1992
 1-2 p. 286-
1 p.
 artikel
61 Clustered defects in IC fabrication: impact on process control charts 1992
 1-2 p. 293-294
2 p.
 artikel
62 Combining analog simulation techniques optimizes designs 1992
 1-2 p. 293-
1 p.
 artikel
63 Comment on: an efficient non-recursive algorithm for computing the reliability of k-out-of-n systems 1992
 1-2 p. 291-
1 p.
 artikel
64 Communication and transportation network reliability using routing models 1992
 1-2 p. 288-
1 p.
 artikel
65 Comparison of Bayesian nonparametric estimates of the reliability with rival estimates Papadopoulos, Alex S.
 1992
 1-2 p. 233-240
8 p.
 artikel
66 Comparison of phosphorus, arsenic and boron implants into bulk silicon and SOS 1992
 1-2 p. 301-
1 p.
 artikel
67 Component replacement and the use of Relcode Hastings, N.A.J.
 1979
 1-2 p. 49-56
8 p.
 artikel
68 Computer operations — An introduction Woollons, D.J.
 1978
 1-2 p. 153-162
10 p.
 artikel
69 Cost-benefit analysis of a 2-unit priority-standby system with patience-time for repair 1992
 1-2 p. 290-
1 p.
 artikel
70 Cost-benefit analysis of single server n-unit imperfect switch system with delayed repair Gopalan, M.N.
 1992
 1-2 p. 5-9
5 p.
 artikel
71 CP-140 aircraft reliability program — A “tailored” management approach Steiner, R.F.
 1979
 1-2 p. 133-139
7 p.
 artikel
72 Data acquisition — Acquiring a little of the data Brown, Dave
 1978
 1-2 p. 87-91
5 p.
 artikel
73 Design a digital synchronizer with a low metastable-failure rate 1992
 1-2 p. 296-
1 p.
 artikel
74 Design guidelines for polymer thick-film technology 1992
 1-2 p. 300-
1 p.
 artikel
75 Designs meet needs of high-speed, high-density systems 1992
 1-2 p. 293-
1 p.
 artikel
76 Detection of multiple input bridging and stuck-on faults in CMOS logic circuits using current monitoring 1992
 1-2 p. 287-
1 p.
 artikel
77 Development of a maintenance plan for the intermediate capacity transit system Keith, Brian
 1980
 1-2 p. 25-31
7 p.
 artikel
78 Development of the DHC-7 aircraft maintenance program Oates, D.L
 1980
 1-2 p. 11-
1 p.
 artikel
79 Diffusion of ion implanted phosphorus in silicon in inert ambient 1992
 1-2 p. 300-
1 p.
 artikel
80 Drain engineering of hot-carrier-resistant MOSFETs using concave silicon surfaces for deep submicron VLSI technology 1992
 1-2 p. 298-
1 p.
 artikel
81 Dynamic behaviour of SMT chip capacitors during solder reflow 1992
 1-2 p. 286-
1 p.
 artikel
82 Editorial Board 1978
 1-2 p. IFC-
1 p.
 artikel
83 Editorial Board 1992
 1-2 p. IFC-
1 p.
 artikel
84 Editorial Board 1979
 1-2 p. IFC-
1 p.
 artikel
85 Effect of system peak load forecast uncertainty on annualized reliability indices of composite generation and transmission systems Billinton, R
 1980
 1-2 p. 91-100
10 p.
 artikel
86 Efficient modeling parameter extraction for dual Pearson approach to simulation of implanted impurity profiles in silicon 1992
 1-2 p. 297-298
2 p.
 artikel
87 Electrical inhomogeneity in alloyed AuGe-Ni contact formed on GaAs 1992
 1-2 p. 298-
1 p.
 artikel
88 Electronic system packaging: the search for manufacturing the optimum in a sea of constraints 1992
 1-2 p. 292-
1 p.
 artikel
89 Electro-optic sampling of high-speed devices and integrated circuits 1992
 1-2 p. 286-
1 p.
 artikel
90 Empirically based analysis of failures in software systems 1992
 1-2 p. 288-
1 p.
 artikel
91 Empirical studies of software validation Howden, William E.
 1979
 1-2 p. 39-47
9 p.
 artikel
92 Enhancement of flip-chip fatigue life by encapsulation 1992
 1-2 p. 284-
1 p.
 artikel
93 Error log analysis: statistical modeling and heuristic trend analysis 1992
 1-2 p. 287-
1 p.
 artikel
94 Establishing and confirming R and M requirements for DND vehicles Harris, A.P
 1980
 1-2 p. 55-73
19 p.
 artikel
95 Evaluating fault trees (AND and OR gates only) with repeated events 1992
 1-2 p. 289-
1 p.
 artikel
96 Evaluation and design of an ultra-reliable distributed architecture for fault tolerance 1992
 1-2 p. 289-
1 p.
 artikel
97 Evaluation of fuzzy reliability of a non-series parallel network Chowdhury, Sumandra Ghosh
 1992
 1-2 p. 1-4
4 p.
 artikel
98 Event-tree analysis by fuzzy probability 1992
 1-2 p. 291-
1 p.
 artikel
99 Experimental evaluation of the fault tolerance of an atomic multicast system 1992
 1-2 p. 291-
1 p.
 artikel
100 Extended behavioral decomposition for estimating ultrahigh reliability 1992
 1-2 p. 283-
1 p.
 artikel
101 Extrapolation of high-voltage stress measurements to lowvoltage operation for thin silicon-oxide films 1992
 1-2 p. 299-
1 p.
 artikel
102 Fabrication of high density multichip modules 1992
 1-2 p. 293-
1 p.
 artikel
103 Fault-tolerant programs and their reliability 1992
 1-2 p. 288-289
2 p.
 artikel
104 Fault-trees for a voting circuit; synthesis and joint analysis Schneeweiss, Winfrid G.
 1992
 1-2 p. 35-47
13 p.
 artikel
105 Fibre optics in data transmission Yarker, Colin A.
 1978
 1-2 p. 179-189
11 p.
 artikel
106 Fitting maintenance cost vs maintainability data to a standard curve Govil, K.K.
 1992
 1-2 p. 267-268
2 p.
 artikel
107 Flexible picosecond probing of integrated circuits with chopped electron beams 1992
 1-2 p. 294-
1 p.
 artikel
108 1/f noise in ceramic superconductors and granular resistors 1992
 1-2 p. 299-
1 p.
 artikel
109 Focused ion beam technology 1992
 1-2 p. 300-
1 p.
 artikel
110 Formation of voids in silicone RTV dispersion under beam-leaded silicon integrated circuits 1992
 1-2 p. 284-285
2 p.
 artikel
111 Fundamentals of manipulator calibration G.W.A.D.,
 1992
 1-2 p. 275-276
2 p.
 artikel
112 Gidep assists in solving reliability/quality problems Richards, Edwin T
 1980
 1-2 p. 83-90
8 p.
 artikel
113 Hardware and software reliability and confidence limits for computer-controlled systems Haynes, Robert D
 1980
 1-2 p. 109-122
14 p.
 artikel
114 Hierarchical Bayesian approach to reliability estimation under competing risk Badarinathi, Ravija
 1992
 1-2 p. 249-258
10 p.
 artikel
115 Hierarchical Bayesian reliability analysis using Erlang families of priors and hyperpriors Bhattacharya, Samir K.
 1992
 1-2 p. 241-247
7 p.
 artikel
116 Highly integrated microcomputers Kornstein, Howard
 1978
 1-2 p. 3-4
2 p.
 artikel
117 High-speed GaAs/AIGaAs optoelectronic devices for computer applications 1992
 1-2 p. 296-
1 p.
 artikel
118 High temperature millisecond annealing of arsenic implanted silicon 1992
 1-2 p. 301-302
2 p.
 artikel
119 High thermal conductivity aluminum nitride ceramic substrates and packages 1992
 1-2 p. 294-
1 p.
 artikel
120 Hi-Q chip model ceramic capacitors handle high frequencies 1992
 1-2 p. 286-
1 p.
 artikel
121 Hybrid ICs find market, adopt new technology 1992
 1-2 p. 300-
1 p.
 artikel
122 IC tester industry gears up for large-memory DRAMs 1992
 1-2 p. 292-
1 p.
 artikel
123 Impact ionization in silicon: a review and update 1992
 1-2 p. 301-
1 p.
 artikel
124 Impact of network failures on the performance degradation of a class of cluster-based multiprocessors 1992
 1-2 p. 285-
1 p.
 artikel
125 Implementing fault-tolerance via modular redundancy with comparison 1992
 1-2 p. 287-288
2 p.
 artikel
126 In-line statistical process control and feedback for VLSI integrated circuit manufacturing 1992
 1-2 p. 294-295
2 p.
 artikel
127 Integrated circuits in radio transceivers Bryant, James M.
 1978
 1-2 p. 77-85
9 p.
 artikel
128 Integrated circuits take the cams out of cameras Anderson, David
 1978
 1-2 p. 35-47
13 p.
 artikel
129 Integrated components for fiber optic data links in industrial applications Hanson, Del
 1978
 1-2 p. 175-178
4 p.
 artikel
130 Intermetallic formation on the fracture of Sn/Pb solder and Pd/Ag conductor interfaces 1992
 1-2 p. 284-
1 p.
 artikel
131 Introduction and certification of a quality assurance system 1992
 1-2 p. 291-
1 p.
 artikel
132 Introduction to programming Monk, J.
 1978
 1-2 p. 143-152
10 p.
 artikel
133 Investigation of arsenic-implanted silicon by optical reflectometry 1992
 1-2 p. 301-
1 p.
 artikel
134 Laptop PCs propel progress in half-pitch connectors 1992
 1-2 p. 285-
1 p.
 artikel
135 Large-scale GaAs ICs challenge bipolar ICs in speed, power, cost 1992
 1-2 p. 296-
1 p.
 artikel
136 Laser trimming of thick film metal resistors on aluminum nitride substrates 1992
 1-2 p. 299-
1 p.
 artikel
137 LED array modules by new technology microbump bonding method 1992
 1-2 p. 294-
1 p.
 artikel
138 Light simulation of molecular beam epitaxy 1992
 1-2 p. 301-
1 p.
 artikel
139 Makers expect ASICs to reverse computer slump 1992
 1-2 p. 292-
1 p.
 artikel
140 Management of satellite systems reliability program Behmann, François
 1979
 1-2 p. 15-21
7 p.
 artikel
141 Management of total reliability Puri, S.C.
 1979
 1-2 p. 7-10
4 p.
 artikel
142 Manual backup operations: Some behavioral aspects of human reliability Abo El-Ela, Maged A.
 1979
 1-2 p. 141-149
9 p.
 artikel
143 Mass production back-grinding/wafer-thinning technology for GaAs devices 1992
 1-2 p. 295-
1 p.
 artikel
144 Measurement of the standoff height between a flip-mounted IC chip and its substrate 1992
 1-2 p. 293-
1 p.
 artikel
145 Mechanical component reliability under environmental stress Dhillon, Balbir S
 1980
 1-2 p. 153-160
8 p.
 artikel
146 Microprocessors for high accuracy component measurement Bond, D.F.
 1978
 1-2 p. 53-63
11 p.
 artikel
147 Modelling of epitaxial growth rate of silicon by vapour phase epitaxy 1992
 1-2 p. 298-
1 p.
 artikel
148 Monte Carlo analysis of semiconductor devices: the DAMOCLES program 1992
 1-2 p. 284-
1 p.
 artikel
149 MOS semiconductor random access memory failure rate Arsenault, J.E.
 1979
 1-2 p. 81-88
8 p.
 artikel
150 Multichip modules for advanced applications 1992
 1-2 p. 294-
1 p.
 artikel
151 Multilayer ceramic packaging alternatives 1992
 1-2 p. 295-
1 p.
 artikel
152 New development of thin plastic package with high terminal counts 1992
 1-2 p. 295-
1 p.
 artikel
153 New developments in high voltage planar thyristors for use in automobile Ethenoz, Pierre
 1978
 1-2 p. 193-203
11 p.
 artikel
154 Nonparametric confidence bounds, using censored data on the mean residual life 1992
 1-2 p. 287-
1 p.
 artikel
155 Ohmic contact electromigration Scorzoni, Andrea
 1992
 1-2 p. 167-174
8 p.
 artikel
156 On comparison of estimators in a generalized life model Dey, Dipak K.
 1992
 1-2 p. 207-221
15 p.
 artikel
157 On fault trees and other reliability evaluation methods Dhillon, Balbir S.
 1979
 1-2 p. 57-63
7 p.
 artikel
158 On optimizing yield reliability and area overhead in large memory arrays Noore, A.
 1992
 1-2 p. 67-77
11 p.
 artikel
159 On the analysis of accelerated life-testing experiments 1992
 1-2 p. 291-
1 p.
 artikel
160 On the possibility of internal gettering in commercially available silicon wafers 1992
 1-2 p. 295-
1 p.
 artikel
161 On the robustness of LDD and nMOS transistors subjected to measurement of drain breakdown voltage 1992
 1-2 p. 286-
1 p.
 artikel
162 Optically controlled current-voltage characteristics of ion-implanted MESFETs 1992
 1-2 p. 301-
1 p.
 artikel
163 Optimal allocation and control problems for software-testing resources 1992
 1-2 p. 288-
1 p.
 artikel
164 Optimal design of k-out-of-n redundant systems Pham, Hoang
 1992
 1-2 p. 119-126
8 p.
 artikel
165 Optimal maintainability allocation using the geometric programming method Govil, K.K.
 1992
 1-2 p. 265-266
2 p.
 artikel
166 Optimum reliability investment in the electronics industry Sultan, Torky I.
 1992
 1-2 p. 159-166
8 p.
 artikel
167 Optimum software release policy with random life-cycle 1992
 1-2 p. 289-
1 p.
 artikel
168 Optimum test design strategies Kapur, Kailash C
 1980
 1-2 p. 75-81
7 p.
 artikel
169 Origin of gas impurities in sputtering plasmas during thin film deposition 1992
 1-2 p. 299-
1 p.
 artikel
170 Parallel Petri net path searching on a local area network—Object oriented Pascal implementation Anneberg, L.
 1992
 1-2 p. 199-206
8 p.
 artikel
171 Passive chip components follow high-density trends 1992
 1-2 p. 293-
1 p.
 artikel
172 Picosecond noninvasive optical detection of internal electrical signals in flip-chip-mounted silicon integrated circuits 1992
 1-2 p. 296-
1 p.
 artikel
173 Picosecond photoemission probing of integrated circuits: capabilities, limitations, and applications 1992
 1-2 p. 284-
1 p.
 artikel
174 Point defect generation and arsenic diffusion in silicon in inert ambient 1992
 1-2 p. 297-
1 p.
 artikel
175 Point defect populations in amorphous and crystalline silicon 1992
 1-2 p. 298-
1 p.
 artikel
176 Potential and problems of high-temperature electronics and CMOS integrated circuits (25–250°C)—an overview 1992
 1-2 p. 292-
1 p.
 artikel
177 Practical experimental designs applied to haloing (Measling) on Teflon circuit boards 1992
 1-2 p. 284-
1 p.
 artikel
178 Predicting and eliminating built-in test false alarms 1992
 1-2 p. 288-
1 p.
 artikel
179 Prediction of the reliability of mechanical components subjected to combined alternating and mean stresses with non-constant stress ratio Kececioglu, D
 1980
 1-2 p. 45-54
10 p.
 artikel
180 Principles of wet chemical processing in ULSI microfabrication 1992
 1-2 p. 293-
1 p.
 artikel
181 Printed wiring board inner layer contamination study 1992
 1-2 p. 285-
1 p.
 artikel
182 Product audit: quality assurance of quality assurance 1992
 1-2 p. 283-
1 p.
 artikel
183 Publications, notices, calls for papers, Etc. 1992
 1-2 p. 281-
1 p.
 artikel
184 Quality assurance and the consumer Heslop, Louise A
 1980
 1-2 p. 1-9
9 p.
 artikel
185 “Real world” interfacing to microprocessors Rabin, Neville
 1978
 1-2 p. 111-117
7 p.
 artikel
186 Redundancy optimization of k-out-of-n systems with common-cause failures 1992
 1-2 p. 290-
1 p.
 artikel
187 Redundant-system demonstrated-reliability approximation using piece-part failure rates 1992
 1-2 p. 285-
1 p.
 artikel
188 Reliability analysis of a human operator under different levels of stress Chung, Who Kee
 1992
 1-2 p. 127-131
5 p.
 artikel
189 Reliability analysis of two-unit warm standby system with partial failure mode and inspection time Pandey, D.K.
 1992
 1-2 p. 17-19
3 p.
 artikel
190 Reliability and maintainability growth of a modern, high performance aircraft, the F-14A Bigel, Gary
 1979
 1-2 p. 31-38
8 p.
 artikel
191 Reliability assessment of small signal GaAs FETs Behmann, François
 1979
 1-2 p. 107-115
9 p.
 artikel
192 Reliability based quality (RBQ) technique for evaluating the degradation of reliability during manufacturing Neri, Lewis
 1979
 1-2 p. 117-126
10 p.
 artikel
193 Reliability demonstration testing for software 1992
 1-2 p. 290-
1 p.
 artikel
194 Reliability in the dormant condition Harris, A.P
 1980
 1-2 p. 33-44
12 p.
 artikel
195 Reliability learning model: Application to color TV Imai, J.
 1979
 1-2 p. 73-80
8 p.
 artikel
196 Reliability of modified designs: a Bayes analysis of an accelerated test of electronic assemblies 1992
 1-2 p. 287-
1 p.
 artikel
197 Reliability optimization in generalized stochastic-flow networks 1992
 1-2 p. 287-
1 p.
 artikel
198 Reliability pays off Kindig, William G
 1980
 1-2 p. 101-108
8 p.
 artikel
199 Remote data conversion Watson, David
 1978
 1-2 p. 119-125
7 p.
 artikel
200 Resistor networks increasing overall mounting density 1992
 1-2 p. 299-
1 p.
 artikel
201 Rules and criteria for when to stop testing a piece of software Petrova, E.
 1992
 1-2 p. 101-117
17 p.
 artikel
202 SCRUMPI 3—A microprocessor with low cost I/O Miller-Kirkpatrick, John H.
 1978
 1-2 p. 65-76
12 p.
 artikel
203 Selecting, under type-II censoring, Weibull populations that are more reliable 1992
 1-2 p. 287-
1 p.
 artikel
204 Self-annealing in ion-implanted Si and GaAs 1992
 1-2 p. 301-
1 p.
 artikel
205 Selling reliability engineering to the company Darch, M.B.
 1979
 1-2 p. 1-5
5 p.
 artikel
206 Silicon micromechanics: sensors and actuators on a chip 1992
 1-2 p. 292-
1 p.
 artikel
207 Simulated fault injection: a methodology to evaluate fault tolerant microprocessor architectures 1992
 1-2 p. 290-
1 p.
 artikel
208 Simulation and design of Lossy transmission lines in a thin-film multichip package 1992
 1-2 p. 300-
1 p.
 artikel
209 Simulation of electromigration behaviour in Al metallization of integrated circuits Scherge, M.
 1992
 1-2 p. 21-24
4 p.
 artikel
210 Solder joint reliability of fine pitch surface mount technology assemblies 1992
 1-2 p. 285-
1 p.
 artikel
211 Special seminex 1978 edition semiconductors and microprocessors Dummer, G.W.A.
 1978
 1-2 p. 1-
1 p.
 artikel
212 Stochastic modelling of a two-stage transfer-line production system with end buffer and random demand Gopalan, M.N.
 1992
 1-2 p. 11-15
5 p.
 artikel
213 Strategies of file redundancy in information systems Turksen, I.B
 1980
 1-2 p. 131-144
14 p.
 artikel
214 Submicron-gate-length GaAs MESFETs 1992
 1-2 p. 296-
1 p.
 artikel
215 Supply formats change with chip use trends 1992
 1-2 p. 292-293
2 p.
 artikel
216 Synchronization techniques for distributed systems: An overview Jeffrey Mee, W.
 1992
 1-2 p. 175-197
23 p.
 artikel
217 System availability monitoring 1992
 1-2 p. 288-
1 p.
 artikel
218 Technical trends in optical connector development 1992
 1-2 p. 296-
1 p.
 artikel
219 Technology prevents reflow soldering defects linked to miniaturization 1992
 1-2 p. 295-
1 p.
 artikel
220 Temperature cycling effects between Sn/Pb solder and thick film Pd/Ag conductor metallization 1992
 1-2 p. 299-
1 p.
 artikel
221 Test generation for VLSI chips with embedded memories 1992
 1-2 p. 294-
1 p.
 artikel
222 Testing printed board assemblies in SMD technology 1992
 1-2 p. 284-
1 p.
 artikel
223 Testing whether one distribution is more IFR than another Wei, Xianhua
 1992
 1-2 p. 271-273
3 p.
 artikel
224 Test planning as a basis for process control 1992
 1-2 p. 290-
1 p.
 artikel
225 The accession of the monolithic analogue to digital converter Jenkins, Andrew
 1978
 1-2 p. 93-99
7 p.
 artikel
226 The anisotropic model for simulation of a multilayer structure dry etching 1992
 1-2 p. 293-
1 p.
 artikel
227 The 1978 Canadian SRE Reliability Symposium Committee 1979
 1-2 p. v-
1 p.
 artikel
228 The case for full convection reflow 1992
 1-2 p. 294-
1 p.
 artikel
229 The combined effects of strain and heavy doping on the indirect band gap of Si and GexSi1−x alloys 1992
 1-2 p. 297-
1 p.
 artikel
230 The computer in the street Curry, Chris
 1978
 1-2 p. 9-13
5 p.
 artikel
231 The design of microcomputer systems Cooke, P.
 1978
 1-2 p. 127-131
5 p.
 artikel
232 The development of ultra-high-frequency VLSI device test systems 1992
 1-2 p. 293-
1 p.
 artikel
233 The effectiveness of adding standby redundancy at system and component levels 1992
 1-2 p. 288-
1 p.
 artikel
234 The effect of statically and dynamically replicated components on system reliability 1992
 1-2 p. 291-292
2 p.
 artikel
235 The effects of localized hot-carrier-induced charge in VLSI switching circuits 1992
 1-2 p. 297-
1 p.
 artikel
236 The effects of variables sampling on component reliability 1992
 1-2 p. 290-
1 p.
 artikel
237 The human element in reliable systems Cross, P
 1980
 1-2 p. 145-
1 p.
 artikel
238 The logistics of life cycle cost Peronnet, John R.
 1979
 1-2 p. 23-30
8 p.
 artikel
239 The mean time-to-failure of some special series-parallel arrays 1992
 1-2 p. 292-
1 p.
 artikel
240 The modeling of multi-layer structures and the impact of emitter-base coupling on the determination of base recombination parameters 1992
 1-2 p. 298-
1 p.
 artikel
241 The need for feedback of field RAM data Gillis, A.R.
 1979
 1-2 p. 89-95
7 p.
 artikel
242 Thermal breakdown in GaAs MES diodes 1992
 1-2 p. 286-
1 p.
 artikel
243 Thermal fatigue life of Pb-Sn alloy interconnections 1992
 1-2 p. 285-
1 p.
 artikel
244 The single-board computer approach to business machine control Bennison, Roger
 1978
 1-2 p. 49-52
4 p.
 artikel
245 The 1980 SRE Canadian Reliability Symposium Committee 1980
 1-2 p. iv-
1 p.
 artikel
246 The status of magnetic bubble memories Parratt, Dave
 1978
 1-2 p. 191-192
2 p.
 artikel
247 The zero-truncated negative binomial distribution as a failure model from the Bayesian approach Kyriakoussis, A.
 1992
 1-2 p. 259-264
6 p.
 artikel
248 Thick film resistors for AIN ceramics 1992
 1-2 p. 300-
1 p.
 artikel
249 Ultra high reliable spacecraft computer system design considerations Rayapati, Venkatapathi Naidu
 1992
 1-2 p. 133-142
10 p.
 artikel
250 Ultra-thin dielectrics for semiconductor applications—growth and characteristics 1992
 1-2 p. 298-
1 p.
 artikel
251 Vacuum mechatronics and self-contained manufacturing for microelectronics processing 1992
 1-2 p. 294-
1 p.
 artikel
252 Volume contents 1980
 1-2 p. I-
1 p.
 artikel
253 VXI packaging and power issues heat up 1992
 1-2 p. 294-
1 p.
 artikel
                             253 gevonden resultaten
 
 Koninklijke Bibliotheek - Nationale Bibliotheek van Nederland