no |
title |
author |
magazine |
year |
volume |
issue |
page(s) |
type |
1 |
An improved In-based ohmic contact to n-GaSb
|
Robinson, J.A |
|
2004 |
48 |
9 |
p. 1667-1672 6 p. |
article |
2 |
A unified analytical model for charge transport in Heterojunction Bipolar Transistors
|
Venkateswara Reddy, K |
|
2004 |
48 |
9 |
p. 1613-1622 10 p. |
article |
3 |
Characteristics of bonds produced by full ceramic and composite ultrasonic transducers
|
Xu, C.H |
|
2004 |
48 |
9 |
p. 1531-1537 7 p. |
article |
4 |
Characteristics of low-energy nitrogen ion-implanted oxide and NO-annealed gate dielectrics
|
Lee, Shih-Chung |
|
2004 |
48 |
9 |
p. 1687-1690 4 p. |
article |
5 |
Characterization of symmetrical spiral inductor in 0.35 μm CMOS technology for RF application
|
Teo, T.Hui |
|
2004 |
48 |
9 |
p. 1643-1650 8 p. |
article |
6 |
Characterization of the spatial charge distribution in local charge-trapping memory devices using the charge-pumping technique
|
Rosmeulen, Maarten |
|
2004 |
48 |
9 |
p. 1525-1530 6 p. |
article |
7 |
Comparison of raised source/drain versus raised extension in ultra-thin body, fully-depleted-SOI, including effects of BEOL via capacitances
|
(Skip) Egley, J.L |
|
2004 |
48 |
9 |
p. 1607-1612 6 p. |
article |
8 |
Current gain increase by SiN x passivation in self-aligned InGaAs/InP heterostructure bipolar transistor with compositionally graded base
|
Jin, Z |
|
2004 |
48 |
9 |
p. 1637-1641 5 p. |
article |
9 |
Derivation of Shockley-Read-Hall recombination rates in bulk and PD-SOI MOSFET's channels valid in all modes of operation
|
Sallese, Jean-Michel |
|
2004 |
48 |
9 |
p. 1539-1548 10 p. |
article |
10 |
Determination of optimal insulator thickness for MISiC hydrogen sensors
|
Xu, J.P. |
|
2004 |
48 |
9 |
p. 1673-1677 5 p. |
article |
11 |
Development of silicon nitride dots for nanocrystal memory cells
|
Wan, Y.M |
|
2004 |
48 |
9 |
p. 1519-1524 6 p. |
article |
12 |
Effects of a trench under the gate in high voltage RESURF LDMOSFET for SOI power integrated circuits
|
Son, Won-So |
|
2004 |
48 |
9 |
p. 1629-1635 7 p. |
article |
13 |
Electrical properties of thermally stable Pt/Re/Au ohmic contacts to p-type GaN
|
Rajagopal Reddy, V |
|
2004 |
48 |
9 |
p. 1563-1568 6 p. |
article |
14 |
Engineering on tunnel barrier and dot surface in Si nanocrystal memories
|
Baik, Seung Jae |
|
2004 |
48 |
9 |
p. 1475-1481 7 p. |
article |
15 |
Fabrication of GaAs Schottky diode by liquid phase chemical enhanced oxidation
|
Wang, Chih-Cheng |
|
2004 |
48 |
9 |
p. 1683-1686 4 p. |
article |
16 |
GaN-based light-emitting diodes with Ni–Mg solid solution/Au p-type ohmic contact
|
Song, June-O |
|
2004 |
48 |
9 |
p. 1597-1600 4 p. |
article |
17 |
Growth and characterization of LPCVD Si quantum dots on insulators
|
Baron, T |
|
2004 |
48 |
9 |
p. 1503-1509 7 p. |
article |
18 |
High-voltage planar Si detectors for high-energy physics experiments: comparison between metal-overhang and field-limiting ring techniques
|
Ranjan, Kirti |
|
2004 |
48 |
9 |
p. 1587-1595 9 p. |
article |
19 |
Investigation of defect properties in Cu(In,Ga)Se2 solar cells by deep-level transient spectroscopy
|
Kerr, L.L. |
|
2004 |
48 |
9 |
p. 1579-1586 8 p. |
article |
20 |
1.3 μm compressive-strain GaInAsP/GaInAsP multiple-quantum-well laser diodes with a tensile-strain GaInP electron stopper layer
|
Wu, Ming-Yuan |
|
2004 |
48 |
9 |
p. 1651-1654 4 p. |
article |
21 |
Nanocrystal memories for FLASH device applications
|
Ammendola, Giuseppe |
|
2004 |
48 |
9 |
p. 1483-1488 6 p. |
article |
22 |
Non volatile memories with discrete storage nodes
|
De Salvo, Barbara |
|
2004 |
48 |
9 |
p. 1461- 1 p. |
article |
23 |
Photoelectromagnetic detector on the basis of Cd x Hg1− x Te
|
Gaziyev, F.N |
|
2004 |
48 |
9 |
p. 1679-1681 3 p. |
article |
24 |
Prediction study of elastic properties under pressure effect for zincblende BN, AlN, GaN and InN
|
Kanoun, M.B |
|
2004 |
48 |
9 |
p. 1601-1606 6 p. |
article |
25 |
Quantum mechanical effect in temperature dependence of threshold voltage of extremely thin SOI MOSFETs
|
Omura, Yasuhisa |
|
2004 |
48 |
9 |
p. 1661-1666 6 p. |
article |
26 |
Realizing high breakdown voltages (>600 V) in partial SOI technology
|
Tadikonda, Ramakrishna |
|
2004 |
48 |
9 |
p. 1655-1660 6 p. |
article |
27 |
Silicon carbide TUNNETT diodes
|
Buniatyan, V.V |
|
2004 |
48 |
9 |
p. 1569-1577 9 p. |
article |
28 |
Silicon nanocrystal based memory devices for NVM and DRAM applications
|
Rao, R.A |
|
2004 |
48 |
9 |
p. 1463-1473 11 p. |
article |
29 |
Silicon nanocrystal memory devices obtained by ultra-low-energy ion-beam synthesis
|
Dimitrakis, P |
|
2004 |
48 |
9 |
p. 1511-1517 7 p. |
article |
30 |
Spatial characterization of localized charge trapping and charge redistribution in the NROM device
|
Shappir, Assaf |
|
2004 |
48 |
9 |
p. 1489-1495 7 p. |
article |
31 |
Study of nanocrystal memory reliability by CAST structures
|
Monzio Compagnoni, Christian |
|
2004 |
48 |
9 |
p. 1497-1502 6 p. |
article |
32 |
Surface treatment for enhancing current gain of AlGaAs/GaAs heterojunction bipolar transistor
|
Oh, T.K |
|
2004 |
48 |
9 |
p. 1549-1553 5 p. |
article |
33 |
Theoretical limit estimation of lateral wide band-gap semiconductor power-switching device
|
Saito, Wataru |
|
2004 |
48 |
9 |
p. 1555-1562 8 p. |
article |
34 |
The role of surface adsorbates on electrical properties of MOVPE grown HgCdTe onto (001) GaAs substrates
|
Kim, Jin-Sang |
|
2004 |
48 |
9 |
p. 1623-1627 5 p. |
article |