nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Acceptor states at the SiSiO2 int0erface generated by UV and their effect on electron mobility
|
Kassabov, J. |
|
1988 |
31 |
1 |
p. 49-51 3 p. |
artikel |
2 |
Analysis of high efficiency back point contact silicon solar cells
|
Luque, Antonio |
|
1988 |
31 |
1 |
p. 65-79 15 p. |
artikel |
3 |
An efficient smoothing algorithm for spreading resistance calculations
|
Clarysse, T. |
|
1988 |
31 |
1 |
p. 53-63 11 p. |
artikel |
4 |
A new experimental determination of the relationship between the Hall mobility and the hole concentration in heavily doped p-type silicon
|
Sasaki, Y. |
|
1988 |
31 |
1 |
p. 5-12 8 p. |
artikel |
5 |
A new infrared avalanche photodiode for long distance fiber optic communication
|
Chakrabarti, P. |
|
1988 |
31 |
1 |
p. 1-3 3 p. |
artikel |
6 |
A simple high-frequency characterization of a three-phase CCD by controlled free-charge transfer
|
Narayanan, L.Shankar |
|
1988 |
31 |
1 |
p. 121-123 3 p. |
artikel |
7 |
Bulk levels and interface calculations for narrow band-gap semiconductors
|
Bloom, I. |
|
1988 |
31 |
1 |
p. 17-25 9 p. |
artikel |
8 |
Editorial Board
|
|
|
1988 |
31 |
1 |
p. IFC- 1 p. |
artikel |
9 |
Effect of MS contact on the electrical behaviour of solar cells
|
Zekry, Z. |
|
1988 |
31 |
1 |
p. 91-97 7 p. |
artikel |
10 |
Electrical properties of Fe-doped semi-insulating InP after proton bombardment and annealing
|
Woodhouse, J.D. |
|
1988 |
31 |
1 |
p. 13-16 4 p. |
artikel |
11 |
High-field drift velocity of electrons in silicon inversion layers
|
Modelli, A. |
|
1988 |
31 |
1 |
p. 99-104 6 p. |
artikel |
12 |
Incompatibility of requirements for optimizing short channel behaviour and long term stability in MOSFETs
|
Bauer, F. |
|
1988 |
31 |
1 |
p. 27-33 7 p. |
artikel |
13 |
Influence of the interface and of the channel volume on 1/ƒ noise of MOS transistors biased in the linear region at strong inversion
|
Grabowski, Franciszek |
|
1988 |
31 |
1 |
p. 115-120 6 p. |
artikel |
14 |
Lateral n-p-n bipolar transistors by ion implantation into semi-insulating GaAs
|
Canfield, P. |
|
1988 |
31 |
1 |
p. 123-125 3 p. |
artikel |
15 |
Modelling of ohmic MOSFET operation at very low temperature
|
Ghibaudo, G. |
|
1988 |
31 |
1 |
p. 105-108 4 p. |
artikel |
16 |
Non-quasi-static capacitance of p/n junction space-charge regions
|
Liou, J.J. |
|
1988 |
31 |
1 |
p. 81-86 6 p. |
artikel |
17 |
Schottky diodes with high series resistance: A simple method of determining the barrier heights
|
Brutscher, N. |
|
1988 |
31 |
1 |
p. 87-89 3 p. |
artikel |
18 |
Software survey section
|
|
|
1988 |
31 |
1 |
p. I-III nvt p. |
artikel |
19 |
The effects of thermal silicidation of the current transport characteristics of Ti/〉111〈Si Schottky-barrier contacts
|
Tseng, Hsun-Hua |
|
1988 |
31 |
1 |
p. 35-44 10 p. |
artikel |
20 |
The ESFET—An evaporated chemical-sensing field-effect transistor
|
Alvi, Nadeem S. |
|
1988 |
31 |
1 |
p. 45-48 4 p. |
artikel |
21 |
The PdZn system for ohmic contacts to p-type GaP
|
Tan Fu Lei, |
|
1988 |
31 |
1 |
p. 109-113 5 p. |
artikel |