nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
A simple method of modelling the C-tV profiles of high-low junctions and heterojunctions
|
Missous, M. |
|
1985 |
28 |
3 |
p. 233-237 5 p. |
artikel |
2 |
Attojoule MOSFET logic devices using low voltage swings and low temperature
|
Tewksbury, S.K. |
|
1985 |
28 |
3 |
p. 255-276 22 p. |
artikel |
3 |
Characterization of interface states at Ni/nCdF2 Schottky barrier type diodes and the effect of CdF2 surface preparation
|
Singh, A. |
|
1985 |
28 |
3 |
p. 223-232 10 p. |
artikel |
4 |
Comments on the Huang and Taylor model of ion-implanted silicon-gate depletion-mode IGFET
|
Marciniak, W. |
|
1985 |
28 |
3 |
p. 313-315 3 p. |
artikel |
5 |
Editorial-software survey section
|
|
|
1985 |
28 |
3 |
p. I-III nvt p. |
artikel |
6 |
Excess gate current in the static induction transistor
|
Płotka, Piotr |
|
1985 |
28 |
3 |
p. 217-221 5 p. |
artikel |
7 |
Influence of the dopant density profile on minority-carrier current in shallow, heavily doped emitters of silicon bipolar devices
|
Cuevas, Andrés |
|
1985 |
28 |
3 |
p. 247-254 8 p. |
artikel |
8 |
Mobility fluctuation1/f noise in silicon p +-n-p transistors
|
Kilmer, J. |
|
1985 |
28 |
3 |
p. 287-288 2 p. |
artikel |
9 |
One-dimensional three-terminal thyristor modelling at high current densities and stable common gate configuration
|
Fulop, W. |
|
1985 |
28 |
3 |
p. 239-245 7 p. |
artikel |
10 |
Schottky barriers on atomically clean cleaved GaAs
|
Newman, N. |
|
1985 |
28 |
3 |
p. 307-312 6 p. |
artikel |
11 |
Temperature behavior of insulated gate transistor characteristics
|
Baliga, B.Jayant |
|
1985 |
28 |
3 |
p. 289-297 9 p. |
artikel |
12 |
Theoretical calculations of Debye length, built-in potential and depletion layer width versus dopant density in a heavily doped p-n junction diode
|
Teng, K.W. |
|
1985 |
28 |
3 |
p. 277-285 9 p. |
artikel |
13 |
Transferred-electron effect in InGaAsP alloys lattice-matched to InP
|
Kowalsky, W. |
|
1985 |
28 |
3 |
p. 299-305 7 p. |
artikel |