nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An analytic model to estimate the avalanche breakdown voltage improvement for LDD devices
|
Lai, F.S. |
|
1985 |
28 |
10 |
p. 959-965 7 p. |
artikel |
2 |
An experimental study of backgating effects in GaAs MESFETs
|
Sriram, Saptharishi |
|
1985 |
28 |
10 |
p. 979-989 11 p. |
artikel |
3 |
A simple method of calculating the minority-carrier current in heavily doped silicon
|
Kleefstra, M. |
|
1985 |
28 |
10 |
p. 991-995 5 p. |
artikel |
4 |
Correlation between most 1/f noise and CCD transfer inefficiency
|
Vandamme, L.K.J. |
|
1985 |
28 |
10 |
p. 1049-1056 8 p. |
artikel |
5 |
Deep centers in neutron-transmutation-doped gallium arsenide
|
Garrido, J. |
|
1985 |
28 |
10 |
p. 1039-1043 5 p. |
artikel |
6 |
Deep depleted SOI MOSFETs with back potential control: A numerical simulation
|
Balestra, F. |
|
1985 |
28 |
10 |
p. 1031-1037 7 p. |
artikel |
7 |
Design calculations for submicron gate-length AlGaAs/GaAs modulation-doped FET structures using carrier saturation velocity/charge-control model
|
Das, Mukunda B. |
|
1985 |
28 |
10 |
p. 997-1005 9 p. |
artikel |
8 |
Editorial—Software survey section
|
|
|
1985 |
28 |
10 |
p. I-III nvt p. |
artikel |
9 |
Experimental determination of short-channel MOSFET parameters
|
Chu Hao, |
|
1985 |
28 |
10 |
p. 1025-1030 6 p. |
artikel |
10 |
High-speed integrated circuits based on InP-MISFETs with plasma SiO2 gate insulator
|
Pande, K.P. |
|
1985 |
28 |
10 |
p. 1045-1048 4 p. |
artikel |
11 |
Temperature dependence of intergrain barriers in polycrystalline In-doped CdS films
|
Garcia-Cuenca, M.V. |
|
1985 |
28 |
10 |
p. 1019-1023 5 p. |
artikel |
12 |
The Bethe condition for thermionic emission near an absorbing boundary
|
Berz, F. |
|
1985 |
28 |
10 |
p. 1007-1013 7 p. |
artikel |
13 |
The role of nonuniform dielectric permittivity in the determination of heterojunction band offsets by C–V profiling through isotype heterojunctions
|
Babic, Dubravko I. |
|
1985 |
28 |
10 |
p. 1015-1017 3 p. |
artikel |
14 |
Visible light emission from silicon MOSFETS
|
Das, N.C. |
|
1985 |
28 |
10 |
p. 967-977 11 p. |
artikel |