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                             26 gevonden resultaten
nr titel auteur tijdschrift jaar jaarg. afl. pagina('s) type
1 An experimental study of the indium antimonide thin film transistor Van Calster, A.
1979
22 1 p. 77-80
4 p.
artikel
2 Capacitance and doping profiles of ion-implanted, buried-channel MOSFETs Lubberts, G.
1979
22 1 p. 47-54
8 p.
artikel
3 Collector thickness evaluation in high voltage multilayer transistors by f t measurements Chiavarotti, G.P.
1979
22 1 p. 112-113
2 p.
artikel
4 Comments on “current-voltage relation in silicon p-n junctions” Buckingham, M.J.
1979
22 1 p. 116-117
2 p.
artikel
5 Computer analysis of punch-through in MOSFETs Kotani, N.
1979
22 1 p. 63-70
8 p.
artikel
6 D.C. characteristics of silicon p-n junctions at avalanche breakdown including selfheating Stepowicz, Witold J.
1979
22 1 p. 7-13
7 p.
artikel
7 Determination of surface state distribution from pulsed MOS capacitor transients Manchanda, Lalita
1979
22 1 p. 29-32
4 p.
artikel
8 Drain noise in MOSFETs at zero drain bias as a function of temperature Takagi, K.
1979
22 1 p. 87-88
2 p.
artikel
9 Editorial Board 1979
22 1 p. IFC-
1 p.
artikel
10 Effective exciton-exciton interaction in polar semiconductors Adamowski, Janusz
1979
22 1 p. 33-35
3 p.
artikel
11 Effects of dislocations in silicon transistors with implanted emitters Bull, C.
1979
22 1 p. 95-104
10 p.
artikel
12 Electrical transport properties of PbTe films Dawar, A.L.
1979
22 1 p. 117-119
3 p.
artikel
13 Flicker noise in MOSFETs made by the DMOS process Takagi, K.
1979
22 1 p. 1-2
2 p.
artikel
14 High-efficiency GaAsGa1−x Al xAs single-heterostructure light emitting diodes Lastras-Martínez, A.
1979
22 1 p. 115-116
2 p.
artikel
15 Influence of the depth of interface states into the insulator on the noise properties of MOS transistors Viktorovitch, P.
1979
22 1 p. 21-23
3 p.
artikel
16 Native levels and degradation in GaAs0.6P0.4 LEDs López, C.
1979
22 1 p. 81-85
5 p.
artikel
17 Observations of dislocations and junction irregularities in bipolar transistors using the E.B.I.C. mode of the scanning electron microscope Ashburn, P.
1979
22 1 p. 105-110
6 p.
artikel
18 On the determination of diffusion lengths by means of angle-lapped P-N junctions von Roos, Oldwig
1979
22 1 p. 113-114
2 p.
artikel
19 Optimum bandgap of several III–V heterojunction solar cells Sutherland, J.E.
1979
22 1 p. 3-5
3 p.
artikel
20 Photoconductivity study of semiconductors using the surface acoustic wave convolver Gilboa, H.
1979
22 1 p. 55-62
8 p.
artikel
21 Power gain and noise of InP and GaAs insulated gate microwave FETs Messick, L.
1979
22 1 p. 71-76
6 p.
artikel
22 Recombination beneath ohmic contacts and adjacent oxide covered regions Heasell, E.L.
1979
22 1 p. 89-93
5 p.
artikel
23 Switching properties of highly doped Gunn devices in resistive circuits Reinecker, E.
1979
22 1 p. 25-27
3 p.
artikel
24 Temperature dependence of photovoltaic solar energy conversion for GaAs homojunction solar cell Mathur, P.C.
1979
22 1 p. 111-112
2 p.
artikel
25 Theory of nonequilibrium properties of MIS capacitors including charge exchange of interface states with both bands Kelberlau, U.
1979
22 1 p. 37-45
9 p.
artikel
26 Unified approach to breakdown phenomena in silicon p-n junction Stepowicz, Witold J.
1979
22 1 p. 15-19
5 p.
artikel
                             26 gevonden resultaten
 
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