nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
An innovative large scale integration of silicon nanowire-based field effect transistors
|
Legallais, M. |
|
2018 |
143 |
C |
p. 97-102 |
artikel |
2 |
A review of the Z2-FET 1T-DRAM memory: Operation mechanisms and key parameters
|
Cristoloveanu, S. |
|
2018 |
143 |
C |
p. 10-19 |
artikel |
3 |
Detailed characterisation of Si Gate-All-Around Nanowire MOSFETs at cryogenic temperatures
|
Boudier, D. |
|
2018 |
143 |
C |
p. 27-32 |
artikel |
4 |
Editorial Board
|
|
|
2018 |
143 |
C |
p. ii |
artikel |
5 |
Electrical characteristics of silicon percolating nanonet-based field effect transistors in the presence of dispersion
|
Cazimajou, T. |
|
2018 |
143 |
C |
p. 83-89 |
artikel |
6 |
Indium-oxide nanoparticles for RRAM devices compatible with CMOS back-end-off-line
|
León Pérez, Edgar A.A. |
|
2018 |
143 |
C |
p. 20-26 |
artikel |
7 |
Insight into carrier lifetime impact on band-modulation devices
|
Parihar, Mukta Singh |
|
2018 |
143 |
C |
p. 41-48 |
artikel |
8 |
Kink effect in ultrathin FDSOI MOSFETs
|
Park, H.J. |
|
2018 |
143 |
C |
p. 33-40 |
artikel |
9 |
Multi-Subband Ensemble Monte Carlo simulations of scaled GAA MOSFETs
|
Donetti, L. |
|
2018 |
143 |
C |
p. 49-55 |
artikel |
10 |
Out-of-equilibrium body potential measurements in pseudo-MOSFET for sensing applications
|
Benea, Licinius |
|
2018 |
143 |
C |
p. 69-76 |
artikel |
11 |
Preface to the special issue of Solid State Electronics EUROSOI/ULIS 2017
|
Nassiopoulou, Androula G. |
|
2018 |
143 |
C |
p. 1 |
artikel |
12 |
Second Harmonic Generation characterization of SOI wafers: Impact of layer thickness and interface electric field
|
Damianos, D. |
|
2018 |
143 |
C |
p. 90-96 |
artikel |
13 |
Silicon tunnel FET with average subthreshold slope of 55 mV/dec at low drain currents
|
Narimani, K. |
|
2018 |
143 |
C |
p. 62-68 |
artikel |
14 |
Static and low frequency noise characterization of ultra-thin body InAs MOSFETs
|
Karatsori, T.A. |
|
2018 |
143 |
C |
p. 56-61 |
artikel |
15 |
The prospects of transition metal dichalcogenides for ultimately scaled CMOS
|
Thiele, S. |
|
2018 |
143 |
C |
p. 2-9 |
artikel |
16 |
Three-dimensional vertical Si nanowire MOS capacitor model structure for the study of electrical versus geometrical Si nanowire characteristics
|
Hourdakis, E. |
|
2018 |
143 |
C |
p. 77-82 |
artikel |