nr |
titel |
auteur |
tijdschrift |
jaar |
jaarg. |
afl. |
pagina('s) |
type |
1 |
Advanced error-prediction LDPC with temperature compensation for highly reliable SSDs
|
Tokutomi, Tsukasa |
|
2015 |
111 |
C |
p. 129-140 12 p. |
artikel |
2 |
All regimes mobility extraction using split C–V technique enhanced with charge-sheet model
|
Hubert, Q. |
|
2015 |
111 |
C |
p. 52-57 6 p. |
artikel |
3 |
A modern perspective on the history of semiconductor nitride blue light sources
|
Maruska, Herbert Paul |
|
2015 |
111 |
C |
p. 32-41 10 p. |
artikel |
4 |
Analytical model of drain current of cylindrical surrounding gate p-n-i-n TFET
|
Xu, Wanjie |
|
2015 |
111 |
C |
p. 171-179 9 p. |
artikel |
5 |
A new explicit and analytical model for square Gate-All-Around MOSFETs with rounded corners
|
Moreno, E. |
|
2015 |
111 |
C |
p. 180-187 8 p. |
artikel |
6 |
An in-depth study of thermal effects in reset transitions in HfO2 based RRAMs
|
Villena, M.A. |
|
2015 |
111 |
C |
p. 47-51 5 p. |
artikel |
7 |
Commercially applicable, solution-processed organic TFT and its backplane application in electrophoretic displays
|
Park, Chang Bum |
|
2015 |
111 |
C |
p. 227-233 7 p. |
artikel |
8 |
Compact model for short-channel symmetric double-gate junctionless transistors
|
Ávila-Herrera, F. |
|
2015 |
111 |
C |
p. 196-203 8 p. |
artikel |
9 |
Compact modeling of subthreshold swing in double gate and nanowire MOSFETs, for Si and GaAs channel materials
|
Hiblot, G. |
|
2015 |
111 |
C |
p. 188-195 8 p. |
artikel |
10 |
Conductive filament structure in HfO2 resistive switching memory devices
|
Privitera, S. |
|
2015 |
111 |
C |
p. 161-165 5 p. |
artikel |
11 |
Detailed 8-transistor SRAM cell analysis for improved alpha particle radiation hardening in nanometer technologies
|
Bota, Sebastià A. |
|
2015 |
111 |
C |
p. 104-110 7 p. |
artikel |
12 |
Determination of active oxide trap density and 1/f noise mechanism in RESURF LDMOS transistors
|
Çelik-Butler, Z. |
|
2015 |
111 |
C |
p. 141-146 6 p. |
artikel |
13 |
Dual bipolar resistive switching in the sub-forming regime of HfO2 resistive switching devices
|
Recher, Shani |
|
2015 |
111 |
C |
p. 238-242 5 p. |
artikel |
14 |
Dynamic variability in 14nm FD-SOI MOSFETs and transient simulation methodology
|
Theodorou, Christoforos G. |
|
2015 |
111 |
C |
p. 100-103 4 p. |
artikel |
15 |
Editorial Board
|
|
|
2015 |
111 |
C |
p. IFC- 1 p. |
artikel |
16 |
Effect of annealing temperature on the electrical properties of In–Zn–Li–O thin film transistors
|
Li, Bin |
|
2015 |
111 |
C |
p. 18-21 4 p. |
artikel |
17 |
Effect of uncertainty principle on the Wigner function-based simulation of quantum transport
|
Kim, Kyoung-Youm |
|
2015 |
111 |
C |
p. 22-26 5 p. |
artikel |
18 |
Effects of the optical absorption of a LED chip on the LED package
|
Kim, Ki Hyun |
|
2015 |
111 |
C |
p. 166-170 5 p. |
artikel |
19 |
Effects of thickness and geometric variations in the oxide gate stack on the nonvolatile memory behaviors of charge-trap memory thin-film transistors
|
Bak, Jun Yong |
|
2015 |
111 |
C |
p. 153-160 8 p. |
artikel |
20 |
Efficiency analysis of betavoltaic elements
|
Sachenko, A.V. |
|
2015 |
111 |
C |
p. 147-152 6 p. |
artikel |
21 |
Engineering of chalcogenide materials for embedded applications of Phase Change Memory
|
Zuliani, Paola |
|
2015 |
111 |
C |
p. 27-31 5 p. |
artikel |
22 |
Extraction and modeling of layout-dependent MOSFET gate-to-source/drain fringing capacitance in 40nm technology
|
Sun, Lijie |
|
2015 |
111 |
C |
p. 118-122 5 p. |
artikel |
23 |
Fabrication and characterization of sub-micron In0.53Ga0.47As p-i-n diodes
|
Gaur, Abhinav |
|
2015 |
111 |
C |
p. 234-237 4 p. |
artikel |
24 |
Full gate voltage range Lambert-function based methodology for FDSOI MOSFET parameter extraction
|
Karatsori, T.A. |
|
2015 |
111 |
C |
p. 123-128 6 p. |
artikel |
25 |
High-power UV-LED degradation: Continuous and cycled working condition influence
|
Arques-Orobon, F.J. |
|
2015 |
111 |
C |
p. 111-117 7 p. |
artikel |
26 |
Impact of fin length on threshold voltage modulation by back bias for Independent double-gate tunnel fin field-effect transistors
|
Mizubayashi, W. |
|
2015 |
111 |
C |
p. 62-66 5 p. |
artikel |
27 |
Integration of GMR-based spin torque oscillators and CMOS circuitry
|
Chen, Tingsu |
|
2015 |
111 |
C |
p. 91-99 9 p. |
artikel |
28 |
Investigation of the width-dependent static characteristics of graphene nanoribbon field effect transistors using non-parabolic quantum-based model
|
Banadaki, Yaser M. |
|
2015 |
111 |
C |
p. 80-90 11 p. |
artikel |
29 |
Loss mechanisms influence on Cu2ZnSnS4/CdS-based thin film solar cell performance
|
Courel, Maykel |
|
2015 |
111 |
C |
p. 243-250 8 p. |
artikel |
30 |
Low power low temperature poly-Si thin-film transistor shift register with DC-type output driver
|
Song, Seok-Jeong |
|
2015 |
111 |
C |
p. 204-209 6 p. |
artikel |
31 |
Low temperature fabrication of high performance ZnO thin film transistors with high-k dielectrics
|
Walker, Brandon |
|
2015 |
111 |
C |
p. 58-61 4 p. |
artikel |
32 |
Multilevel metal/Pb(Zr0.52Ti0.48)O3/TiO x N y /Si for next generation FeRAM technology node
|
Sharma, Deepak K. |
|
2015 |
111 |
C |
p. 42-46 5 p. |
artikel |
33 |
On the extraction of the external drain and source resistors and effective channel length in Si-MOSFET
|
Joodaki, M. |
|
2015 |
111 |
C |
p. 1-6 6 p. |
artikel |
34 |
Response of plasmonic terahertz detectors to amplitude modulated signals
|
Rupper, Greg |
|
2015 |
111 |
C |
p. 76-79 4 p. |
artikel |
35 |
Scaling and carrier transport behavior of buried-channel In0.7Ga0.3As MOSFETs with Al2O3 insulator
|
Kim, Taewoo |
|
2015 |
111 |
C |
p. 218-222 5 p. |
artikel |
36 |
Self-aligned two-layer metallization with low series resistance for litho-less contacting of large-area photodiodes
|
Mok, K.R.C. |
|
2015 |
111 |
C |
p. 210-217 8 p. |
artikel |
37 |
Short channel amorphous In–Ga–Zn–O thin-film transistor arrays for ultra-high definition active matrix liquid crystal displays: Electrical properties and stability
|
Kim, Soo Chang |
|
2015 |
111 |
C |
p. 67-75 9 p. |
artikel |
38 |
Surface treatment to improve responsivity of MgZnO UV detectors
|
Zhao, Yajun |
|
2015 |
111 |
C |
p. 223-226 4 p. |
artikel |
39 |
Temperature-dependent electrical characterization of high-voltage AlGaN/GaN-on-Si HEMTs with Schottky and ohmic drain contacts
|
Taube, Andrzej |
|
2015 |
111 |
C |
p. 12-17 6 p. |
artikel |
40 |
Using dual plasma treatment to improve electrical characteristics and reduce flicker noise of high-κ HfO2 LTPS-TFTs
|
Chang, Kow-Ming |
|
2015 |
111 |
C |
p. 7-11 5 p. |
artikel |