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Journal description
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Details for article 11 of 83 found articles
| Title: |
Defect characterization of polycrystalline silicon layers obtained by aluminum-induced crystallization and epitaxy |
| Author: |
Van Gestel, Dries Gordon, Ivan Carnel, Lodewijk Beaucarne, Guy Poortmans, Jef |
| Appeared in: |
MRS proceedings |
| Paging: | Volume 989 () nr. 1 pages xx |
| Year: |
2007-05-14 |
| Contents: | |
| Publisher: |
Springer International Publishing, Cham |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 11 of 83 found articles
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