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Journal description
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Details for article 41 of 95 found articles
| Title: |
In-situ electrical characterization of Si during nanoindentation |
| Author: |
Bradby, J. E. Williams, J. S. Swain, M. V. |
| Appeared in: |
MRS proceedings |
| Paging: | Volume 750 () nr. 1 pages xx |
| Year: |
2003-06-01 |
| Contents: | |
| Publisher: |
Springer International Publishing, Cham |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 41 of 95 found articles
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