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                                       Details for article 14 of 15 found articles
 
 
  Use of atomic force microscopy for examining wet clay
 
 
Title: Use of atomic force microscopy for examining wet clay
Author: Selvam, Arunkumar
See, Chun Hwa
Barkdoll, Brian
Prasad, Shyam
O’Haver, John
Appeared in: Clays and clay minerals
Paging: Volume 54 (2006) nr. 1 pages 25-28
Year: 2006
Contents:
Publisher: Springer International Publishing, Cham
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 14 of 15 found articles
 
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