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Details for article 5 of 83 found articles
| Title: |
A New Kind of Atomic Force Microscopy Scan Control Enabled by Artificial Intelligence: Concept for Achieving Tip and Sample Safety Through Asymmetric Control |
| Author: |
Degenhardt, Johannes Bounaim, Mohammed Wassim Deng, Nan Tutsch, Rainer Dai, Gaoliang |
| Appeared in: |
Nanomanufacturing and metrology |
| Paging: | Volume 7 () nr. 1 pages xx |
| Year: |
2024-04-16 |
| Contents: | |
| Publisher: |
Springer Nature Singapore, Singapore |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 5 of 83 found articles
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