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Journal description
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Details for article 210 of 219 found articles
| Title: |
Thickness dependent study of RF sputtered ZnO thin films for optoelectronic device applications |
| Author: |
Sharma, Shashikant Periasamy, C. Chakrabarti, P. |
| Appeared in: |
Electronic materials letters |
| Paging: | Volume 11 (2015) nr. 6 pages 1093-1101 |
| Year: |
2015 |
| Contents: | |
| Publisher: |
The Korean Institute of Metals and Materials, Seoul |
| Source file: |
Elektronische Wetenschappelijke Tijdschriften |
Details for article 210 of 219 found articles
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