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                                       Details for article 36 of 49 found articles
 
 
  Optimization of Test Scheduling and Test Access for ITC-02 SOC Benchmark Circuits
 
 
Title: Optimization of Test Scheduling and Test Access for ITC-02 SOC Benchmark Circuits
Author: P. Sakthivel
R. Delhi Babu
P. Narayanasamy
Appeared in: Journal of computer science
Paging: Volume 5 (2009) nr. 4 pages 290-296
Year: 2009
Contents: Problem statement: This study presented the optimized test scheduling and test access for ITC-02 SOC benchmark circuits using genetic algorithm. In the scheduling procedure of SOC, scheduling problem was formulated as a sequence of two problems and solved. Approach: Test access mechanism width was partitioned into two and three partitions and the applications of test vectors and test vector assignments for different partitions were scheduled using different operators of genetic algorithm. Results: The test application time was calculated in terms of CPU time cycles for two and three partitions of twelve ITC-02 SOC benchmark circuits and the results were compared with theinteger linear programming approach. Conclusion: The results showed that the genetic algorithm based approach gives better results.
Publisher: Science Publications (provided by DOAJ)
Source file: Elektronische Wetenschappelijke Tijdschriften
 
 

                             Details for article 36 of 49 found articles
 
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