Mathematical Modeling of the IC Final Testing Order Selection Problem
Titel:
Mathematical Modeling of the IC Final Testing Order Selection Problem
Auteur:
C.Y. Huang
Verschenen in:
Information technology journal
Paginering:
Jaargang 7 (2008) nr. 6 pagina's 918-923
Jaar:
2008
Inhoud:
After the depression of the semiconductor industry in 2000 to 2003, IC packaging and IC final testing companies, the back end of the supply chain in semiconductor manufacturing, have changed their capacity expansion strategy from follower strategy to lag strategy, in compared with wafer fabrication. As a result, when the market is in the upturn, the IC final testing practitioner may have insufficient capacity and a selection of candidate orders is necessary. This study thus proposes a Mixed Integer Linear Programming (MILP) model to solve the IC Final Test Order Selection Problem (ICFTOSP). With the objective of maximizing a firm`s profit, the model takes into account the characteristics of limited capacity of testers, different profit for different orders and sequence dependent setup time. To increase the applicability of this MILP, a best estimate search strategy incorporating a branch based on pseudo reduced costs rule was adopted to increase the solution efficiency and the numerical result showed that an acceptable solution can be obtained in a reasonable computational time.
Uitgever:
Asian Network for Scientific Information, Pakistan (provided by DOAJ)
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